4988 results about "Semiconductor technology" patented technology

A method to form interconnect structures including nano-scale, e.g., sub-lithographic, lines and vias for future generation of semiconductor technology using self-assembly block copolymers that can be placed at a specific location using a pre-fabricated hard mask pattern is provided. The inventive method provides an interconnect structure in which the line is self-aligned to the via.

Spacers are formed on sidewalls of striplike parts of a pattern layer of periodic structure. The pattern layer is removed, and the spacers are covered with a further spacer layer, which is then structured to second sidewall spacers. Gaps between the spacers are filled with a complementary layer. The upper surface is planarized to a lower surface level, leaving a periodic succession of the first spacers, the second spacers and the residual parts of the complementary layer. The lateral dimensions are adapted in such a manner that a removal of one or two of the remaining layers renders a periodic pattern of smaller pitch.

A semiconductor technology combines a normally off n-channel channel-junction insulated-gate field-effect transistor (“IGFET”) (104) and an n-channel surface-channel IGFET (100 or 160) to reduce low-frequency 1/f noise. The channel-junction IGFET is normally of materially greater gate dielectric thickness than the surface-channel IGFET so as to operate across a greater voltage range than the surface-channel IGFET. Alternatively or additionally, the channel-junction IGFET may conduct current through a field-induced surface channel. A p-channel surface-channel IGFET (102 or 162), which is typically of approximately the same gate-dielectric thickness as the n-channel surface-channel IGFET, is preferably combined with the two n-channel IGFETs to produce a complementary-IGFET structure. A further p-channel IGFET (106, 180, 184, or 192), which is typically of approximately the same gate dielectric thickness as the n-channel channel-junction IGFET, is also preferably included. The further p-channel IGFET can be a surface-channel or channel-junction device.

The present invention relates to semiconductor technologies, and more particularly to a bipolar junction transistor (BJT) in a CMOS base technology and methods of forming the same. The BJT includes a semiconductor substrate having an emitter region, a base having a first contact, and a collector having a second contact and a well plug; a first silicide film on the first contact; a second silicide film on the second contact; a first silicide blocking layer on or over the semiconductor substrate between the first and second silicide films, and a second silicide blocking layer on the semiconductor substrate between the first silicide film and the emitter region.

The invention discloses a mass transfer method of Micro LED (Light Emitting Diode) chips, and belongs to the technical field of a semiconductor. The mass transfer method comprises the steps of: producing a plurality of first Micro LED chips, wherein the same sides of P-type electrodes and N-type electrodes of the first Micro LED chips are contrary name magnetic poles; arranging P-type electrode fixing blocks and N-type electrode fixing blocks at positions on a driving circuit board, where the first Micro LED chips are mounted, wherein the opposite sides of the P-type electrode fixing blocks and the P-type electrodes are contrary name magnetic poles, and the opposite sides of the N-type electrode fixing blocks and the N-type electrodes are contrary name magnetic poles; placing the driving circuit board and a plurality of first Micro LED chips into the same solution, and fixedly mounting the first Micro LED chips on the driving circuit board under the action of a magnetic force. The mass transfer method disclosed by the invention can implement mass transfer of the Micro LED chips, and does not have the problem that when one chip has defects, all chips need to be replaced; production efficiency is improved; and production cost is reduced.

A prepn. method of silicon thin film heterojunction solar cell includes following steps: cleaning substrate, semiconductor cleaning technology is used to do primary cleaing to substrate surface, then do ultrasonic cleaning in deionized water several times; nitrogen blow drying; prepare nitrinsic amorphous silicon layer by heater chemical vapour phase depositing technology, tungsten filament temp. is measured by pyrometer, temp of heater and sample are determined separately by two electric thermo-couples, temp. is controlled by electric temp. controller; to react and grow thin film on substrate surface; to redeposit a transmitting layer on intrinsic amorphous silicon thin film; front and back electrodes forming, sputtering technology is used to form front and back electrodes; finally to proceed vacuum heat annealing process. The thin film produced by the invention has illumination stability, the photoconduction gain can reach to 10 to the power 6 on Am1.5 100mW/cm2 standard illumination.

Systems, methods and mediums are provided for automating experiments within an automated environment without the need to disassociate the test subject (e.g., the semiconductor chip or chips) from that environment. An “experiment” may be a pre-planned deviation of an established (e.g., pre-defined) process utilizing the automated environment.

A computer-implemented method, system and computer-readable medium for managing experiments, such as those relating to semiconductor technology. An experiment order includes some deviation from a base process capable of operating in an automated environment. An approval of the experiment order is obtained from a distribution list of users, while permitting the users to attach documents to the experiment order or perhaps modify the experiment. The experiment order is translated into processing data suitable for implementation by said automated environment, and stored. The experiment is caused to be executed in conjunction with at least some portion of said base process via the automated environment according to the processing data.

The present invention provides a versatile system for providing a current-mode switching controller—in low voltage commercial semiconductor technologies—that is compatible with applications having very high input voltage ranges. The system provides an output transistor and a sense element coupled to the output transistor. A waveform representative of current charging across the sense element is recognized. First and second charging elements are provided, and the second charging element is adapted to charge at a rate twice as fast as the first charging element. First and second switching elements, coupled to the first and second charging elements, respectively, are adapted to activate the first and second charging elements responsive to a rising edge of the waveform. An output charge element is provided, and a sample and hold construct is adapted to transfer a charge value—to the output charge element—that corresponds to an average of the charge values of the first and second charging elements upon a falling edge of the waveform.

An atomic layer deposition method is used to deposit a TiN or TiSiN film having a thickness of about 50 nm or less on a substrate. A titanium precursor which is tetrakis(dimethylamido)titanium (TDMAT), tetrakis(diethylamido)titanium (TDEAT), or Ti{OCH(CH₃)₂}₄ avoids halide contamination from a titanium halide precursor and is safer to handle than a titanium nitrate. After a monolayer of the titanium precursor is deposited on a substrate, a nitrogen containing reactant is introduced to form a TiN monolayer which is followed by a second purge. For TiSiN, a silicon source gas is fed into the process chamber after the TiN monolayer formation. The process is repeated several times to produce a composite layer comprised of a plurality of monolayers that fills a contact hole. The ALD method is cost effective and affords an interconnect with lower impurity levels and better step coverage than conventional PECVD or CVD processes.

Provided is a semiconductor sensor device which is manufactured by an MEMS technology wherein machining technology and/or material technology is combined with semiconductor technology for detecting and measuring various physical quantities. In the semiconductor sensor device, cracks which generate in a cap chip and a molding resin are eliminated and air-tightness between a semiconductor sensor chip and the cap chip is ensured. The cracks due to vibration applied when being cut can be eliminated by having the circumference side surface of the cap chip as a wet-etched surface. Furthermore, insulation is ensured by coating the cap chip side surface with an insulating protection film.

A method and system for digital cameras provides improved automatic exposure control, improved automatic white balance, improved color interpolation, improved automatic gamma correction, and improved progressive edge enhancement. These improvements are preferably implemented in CMOS semiconductor technology for faster speed.

A new pixel in semiconductor technology comprises a photo-sensitive detection region (1) for converting an electromagnetic wave field into an electric signal of flowing charges, a separated demodulation region (2) with at least two output nodes (D10, D20) and means (IG10, DG10, IG20, DG20) for sampling the charge-current signal at at least two different time intervals within a modulation period. A contact node (K2) links the detection region (1) to the demodulation region (2). A drift field accomplishes the transfer of the electric signal of flowing charges from the detection region to the contact node. The electric signal of flowing charges is then transferred from the contact node (K2) during each of the two time intervals to the two output nodes allocated to the respective time interval. The separation of the demodulation and the detection regions provides a pixel capable of demodulating electromagnetic wave field at high speed and with high sensitivity.

The invention discloses a light-emitting diode epitaxial wafer and a preparation method thereof, and belongs to the technical field of semiconductors. The light-emitting diode epitaxial wafer comprises a sapphire substrate, a low-temperature buffer layer, a high-temperature non-doped GaN layer, a first defect barrier layer, an N-type GaN layer, a stress release layer, a multi-quantum well layer, a P-type electron blocking layer, a P-type GaN layer and a P-type contact layer, wherein the low-temperature buffer layer, the high-temperature non-doped GaN layer, the first defect barrier layer, the N-type GaN layer, the stress release layer, the multi-quantum well layer, the P-type electron blocking layer, the P-type GaN layer and the P-type contact layer are sequentially laminated on the sapphire substrate; a second defect barrier layer is inserted into the N-type GaN layer; the first defect barrier layer comprises alternately laminated AlGaN layers and GaN layers; the second defect barrier layer comprises alternately laminated SiN films and N-type AlGaN layers; and the stress release layer comprises alternately laminated InGaN layers and GaN layers. According to the light-emitting diode epitaxial wafer, extension of defects formed by lattice mismatch into the multi-quantum well layer is effectively suppressed; stress release is enhanced; the crystal quality is improved; leakage passages are reduced; the anti-static electricity capacity of an LED chip is improved; and the product yield is improved.

A high-voltage MEMS system compatible with low-voltage semiconductor process technology is disclosed. The system comprises a MEMS device coupled to a high-voltage bias generator employing an extended-voltage isolation residing in a semiconductor technology substrate. The system avoids the use of high-voltage transistors so that special high-voltage processing steps are not required of the semiconductor technology, thereby reducing process cost and complexity. MEMS testing capability is addressed with a self-test circuit allowing modulation of the bias voltage and current so that a need for external high-voltage connections and associated electro-static discharge protection circuitry are also avoided.