Method for preparing silicon thin film heterojunction solar cell
A solar cell and heterojunction technology, which is applied in circuits, photovoltaic power generation, electrical components, etc., can solve problems such as low silane utilization rate, unstable plasma, and slow deposition speed
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Embodiment 1
[0019] Example 1 and Example 2 are p + -a-Si / i-a-Si / n-c-Si structure solar cell, the third embodiment and the fourth embodiment are n + -a-Si / i-a-Si / p-c-Si structure solar cell:
[0020] Example one
[0021] Use step one above for chemical pretreatment.
[0022] Step 2 is used to prepare the intrinsic amorphous silicon layer. First, a thin intrinsic amorphous silicon layer ia-Si is deposited on the nc-Si crystalline silicon. The thickness of the ia-Si layer is 20nm. The specific process conditions are: the distance between the sample and the tungsten wire is 8cm, and the background vacuum of the deposition system is 5×10 -4 Pa. The reaction gas is a mixed gas of silane and hydrogen, the flow ratio of silane in the total gas is 100%, the temperature of the tungsten wire is 2100°C, the temperature of the substrate is 300°C, the deposition pressure is 0.1 Pa, and the deposition time is 2 minutes.
[0023] Use step 3 to prepare the doped emission layer, and the flow ratio of borane to...
Embodiment 2
[0028] Use the above-mentioned step one for the previous chemical pretreatment;
[0029] Step 2 is used to prepare the intrinsic amorphous silicon layer. First, a thin intrinsic amorphous silicon layer ia-Si, ia-Si layer is deposited on the nc-Si crystalline silicon with a thickness of 10nm. The specific process conditions are: sample and tungsten The distance between the wires is 8cm, and the background vacuum of the deposition system is 5×10 -4 Pa. The reaction gas is a mixed gas of silane and hydrogen, the flow ratio of silane in the total gas is 80%, the temperature of the tungsten wire is 1900°C, the substrate temperature is 250°C, the deposition pressure is 2 Pa, and the deposition time is 1 minute.
[0030] Use step 3 to prepare the doped emission layer, and the flow ratio of borane to silane is controlled at B 2 H 6 / SiH 4 =3%, another layer of p with a thickness of 30nm is deposited on the amorphous silicon layer + -a-Si emitting layer, the conductivity of the emitting la...
Embodiment 3
[0035] Use the above-mentioned step one for the previous chemical pretreatment;
[0036] Step 2 is used to prepare the intrinsic amorphous silicon layer. First, a thin intrinsic amorphous silicon layer ia-Si, ia-Si layer is deposited on the pc-Si crystalline silicon with a thickness of 20nm. The specific process conditions are: sample and tungsten The distance between the wires is 8cm, and the background vacuum of the deposition system is 5×10 -4 Pa. The reaction gas is a mixed gas of silane and hydrogen, the flow ratio of silane in the total gas is 50%, the temperature of the tungsten wire is 1800°C, the substrate temperature is 200°C, the deposition pressure is 6 Pa, and the deposition time is 2 minutes.
[0037] Step 3 is used to prepare the doped emission layer, and the flow ratio of phosphane to silane is controlled at PH 5 / SiH 4 =4%, another layer of 30nm thick n is deposited on the amorphous silicon layer + -a-Si emitting layer, the conductivity of the emitting layer is op...
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