98 results about "Catoptrics" patented technology

The invention relates to a three-waveband off-axis reflective optical system with view field switching and focusing functions. Belongs to the photoelectric technical field. Multi-band common-caliber imaging is realized by adopting an off-axis two-reflection-path form, imaging information can be continuously obtained day and night all day, laser emitting and receiving capabilities are considered, and the device has functions of positioning aiming, laser guiding and the like. Large and small field-of-view switching imaging is realized through switching-in and switching-out of the secondary mirror, and the system has the capability of carrying out rapid search in a large field-of-view range and carrying out accurate identification and tracking in a small field-of-view range; the auto-collimation focusing of the optical system is realized by switching the position of the focusing mirror and arranging the focusing system, the system is ensured to be clear in imaging under the use conditions of different atmospheric pressures, temperature changes and photographing distances, and the system is suitable for accurate aiming and detection of a target under various complex and severe working conditions. The total reflection optical system is free of chromatic aberration, free of blocking, compact in structure and high in system integration degree, and the requirement for functional diversification of a photoelectric system is met.

The invention relates to a system (100) for measuring at least one chemical composition of a flowing fluid of an electrochemical generator system, the measuring system comprising: a light source (111) generating a light beam; a two-pass measurement unit (120) comprising an inlet opening (121) configured to let the fluid into, an outlet opening configured to let the fluid out, and two windows placed on the fluid path, the windows positioned to face each other transverse to a primary optical axis of the fluid flow and configured to transmit the light beam; a reflective optical device (130) positioned to reflect the light beam in a direction in which the fluid flows through the window; and a Raman spectrometer (112) configured to receive the light beam to detect a Raman signal emitted by the flowing fluid and to derive therefrom a measurement of at least one chemical component of the flowing fluid.

The invention relates to a reflection optical unit (1) for focusing electromagnetic radiation (300) onto a focal plane (100), comprising at least the following components: - a central stop (12) which is arranged on an optical axis (200) of the reflection optical unit (1) and is designed to prevent electromagnetic beams (300) that are radiated into the reflection optical unit (1) along the optical axis (200) from propagating parallel to the optical axis (200), - an X-ray lens (11) having a tube (11-1) which extends at least between the central stop (12) and the focal plane (100) along the optical axis (200) of the reflection optical unit (1) and delimits a first volume (V1) radially around the optical axis (200), such that electrons (e-) generated by electromagnetic radiation in the first volume (V1) are shielded, wherein the tube (11-2) together with the central stop (12) forms a ring-shaped aperture (18), and - a solid window (13) which delimits the first volume (V1) toward the focal plane (100) and which peripherally terminates flush with the tube (11-2), wherein the solid window (13) is configured such that electrons generated by electromagnetic radiation in the first volume (V1) are shielded from the focal plane (100) by the solid window (13).

The invention relates to a method for treating a reflective optical element (1) for the VUV wavelength range having an aluminum surface (3). The treatment of the reflective optical element (1) comprises irradiating the reflective optical element (1) with a hydrogen plasma jet (10) to remove the aluminum oxide layer (4) formed on the aluminum surface (3). The invention also relates to a reflective optical element (1) for use in the VUV wavelength range treated by such a method, and to an optical arrangement comprising at least one such optical element (1).

A reflective optical element (101) for grazing incidence of radiation with a working wavelength from the EUV wavelength range is proposed, comprising a reflective layer (107) on a substrate (103), wherein a filter layer (105) is arranged between the reflective layer (107) and the substrate (103), the filter layer (105) having a larger real part of the refractive index in the DUV wavelength range than the reflective layer (107).

To provide a compact, high-performance catadioptric optical system. [Solution] The optical system comprises, in order of light passage from the object side, a primary mirror section consisting of an aspherical concave mirror with its concave surface facing the object side, a secondary mirror section arranged on the object side of the primary mirror section and consisting of an aspherical convex mirror with its convex surface facing the image side, and a refractive system arranged on the image side of the secondary mirror section, the refractive system comprising a front group with positive refractive power and a rear group with negative refractive power separated by a maximum air gap, the refractive system comprising at least five lenses, where PG is the Petzval sum of the refractive system obtained by normalizing the focal length of each surface by the focal length of the entire system, and PM is the Petzval sum of the reflective system obtained by normalizing the focal length of each surface by the focal length of the entire system, 0.6<|PG / PM|<1.2…(1) If the refractive power of the refractive system is φG and the refractive power of the entire system is φ0, then 0.05<|φG / φ0|<1.5…(2) 7 <PM<20…(3) It is characterized by satisfying the conditions (1), (2), and (3).

A method for manufacturing a reflective optical element for a working wavelength, particularly in the EUV wavelength range, is proposed, comprising the following steps: - Application of a multilayer system (125) consisting of alternating layers of materials with different refractive indices at the working wavelength onto a first substrate (121); - Removal of the first substrate (121) from the multilayer system (125); - Applying the multilayer system (125) to a second substrate (129) such that the layer applied first to the first substrate (121) is located furthest away from the second substrate (129). Alternatively, a second substrate can first be applied to the multilayer system, and then the first substrate can be removed. This allows a reflective optical element with increased real maximum reflectivity at the operating wavelength to be obtained.

This invention provides a reflective optical structure for LED backlighting, relating to the field of LED backlighting technology. It includes a backlight frame and a backplate disposed inside the bottom of the backlight frame. A reflective sheet is adhered and fixed to the outer wall of the top of the backplate, reflecting the light source acting on its upper surface upwards. This invention makes the backplate at the bottom of the backlight frame movable and adds a novel distance fine-tuning device, improving practicality and adaptability. Through the cooperation of a fine-tuning screw and an internal threaded sleeve, and guided by a movable stabilizing guide rod, it achieves precise adjustment of the spacing between core components, driving the backplate, reflective sheet, and light guide plate to move stably, optimizing light effects and improving luminous quality. A cross-shaped fixing bracket and an outer frame provide support, enhancing stability. An anti-detachment structure prevents components from falling off and being damaged by over-adjustment. The device improves adaptability and maintainability, adapting to different LCD panels, reducing maintenance costs, and also improving light utilization, brightness, and energy efficiency.

The invention discloses precise image measurement equipment and method based on laser measurement, and relates to the field of laser measurement, and the measurement equipment comprises a multi-axis motion platform, a measurement probe and a control system. The measuring probe is of a probe-shaped structure capable of penetrating into a measured inner cavity and is installed at the tail end of the Z axis of the multi-axis motion platform, and a confocal laser sensor and a lateral microscopic vision system are integrated in the measuring probe. The lateral microscopic vision system comprises a miniature image sensor, a miniature lens module and a lateral projection light source, and the optical axis of the lateral microscopic vision system is turned back through a reflection optical element, so that the effective sight direction of the lateral microscopic vision system is perpendicular to the axis direction of the measuring probe. According to the invention, through the design of the integrated miniature measuring probe, the shielding and depth-of-field limitation are overcome, and the synchronous and high-precision data acquisition of the inner side wall and the bottom of the deep hole with a high depth-diameter ratio and a step structure is realized, so that the complete three-dimensional shape of the inner cavity is reconstructed, the contour features are completely captured, and the precise measurement requirement is realized.

A laser system comprising reflective optical elements to reflect a laser beam, the reflective optical elements arranged to form a beam path for the laser beam. The laser system comprises a vacuum environment. At least one of the reflective optical elements is particularly arranged in the vacuum environment and mounted on a substrate of the laser system, The laser system comprises a first volume which is maintained under a pressure different from a surrounding atmospheric pressure and, in particular, is purged with a gas. The laser system further comprises pressure detection means arranged to detect a decrease and / or an increase in pressure in the first volume comprised in the substrate.

Retroreflective device (5) for a motor vehicle (1), characterized by: - a first reflector (10) comprising a colored first cover plate (11) which is provided with a specifically manufactured retroreflective optic (13) by means of which a first quantity of light (8) directed onto the retroreflective device (5) can be selectively reflected into a retroreflective area (14); and - a second reflector (15) formed separately from and arranged next to the first reflector (10), which comprises a second cover plate (16) having the same color as the first cover plate (11), formed separately from and directly adjacent to the first cover plate (11), which: o is equipped with a specifically manufactured retroreflective optic by means of which a second quantity of the light (8) emitted onto the retroreflective device (5), which is smaller than the first quantity, can be selectively reflected into the retroreflective area (14) or reflection of the light (8) emitted onto the retroreflective device (5) into the retroreflective area (14) is prevented; or ◯ free from a specifically manufactured retroreflective optic for the targeted reflection of light.

A total internal reflection (TIR) optic having a body, fins, and a resilient member. The body includes a truncated, conical first end having a first circumference and a truncated, conical second end have a second circumference. The first circumference is greater than the second circumference. The fins of the TIR optic extend radially from the first end of the body. The resilient member of the TIR optic extends circumferentially from a fin, the resilient member having a secured end at the fin and a free end opposite the secured end. The free end of the resilient member is configured to be moved between first and second positions that are different. When in the first position, the free end is offset from the first circumference of the first end. A luminaire having the TIR optic and methods of mounting the optic in a luminaire.

An optical incoupling element (100) provided in the form of a discrete item attachable on a lightguide (20) is provided, comprising a substrate (100A) and at least one three-dimensionally formed optical surface (104). The optical surface (104) is configured to incouple light incident thereto and to adjust direction of the incoupled light transmitted through an optical contact surface (107) established at an interface between the element substrate (100A) and a lightguide medium (20) such, that the incoupled light acquires a propagation path through a lightguide medium (20) via a series of total internal reflections. The optical surface (104) may comprise at least on optical cavity pattern (101). The element (100) is configured to receive light onto said at least one three-dimensionally formed optical surface (104) from a direction essentially parallel to a longitudinal plane of the planar lightguide (20). A method for manufacturing the optical incoupling element (100), related arrangement, optical unit (250) and uses are further provided.

The inventive concept relates to a total station (10), a method (70) for calibrating a total station, and a method (60) for determining an internal calibration reference for a total station. The method (60) comprises: determining (S600) an alignment error of an optical axis (1030, 1032, 1034) of a reference measurement channel relative to an aiming axis (150) of the total station (10), wherein the reference measurement channel is a measurement channel (1022) comprising a light source or a measurement channel (1020, 1024) comprising an image sensor; rotating (S602) an aiming axis (150) of the total station (10) about a rotation point to a predetermined position in which a light beam emitted from the light source exits the central unit (100) via an objective lens (1000) of the central unit (100) and enters the central unit (100) via the objective lens (1000) after being reflected at a reflective optical element (112) fixedly coupled to the collimator (110) so as to propagate towards the image sensor; emitting (S604) a light beam from the light source; capturing (S606) an image with an image sensor; identifying (S608) a position of the light beam in the image; and determining (S610) an internal calibration reference for the total station (10) based on the determined alignment error of the optical axis (1030, 1032, 1034) of the reference measurement channel and the identified position of the light beam in the image.

The invention relates in particular to a reflective optical element (17) of an illumination optical unit of a projection exposure apparatus, which comprises a structured surface (25 a), which preferably forms a grating structure (29), and a reflective coating (36) applied to the structured surface (25 a). The reflective coating (36) discontinuously covers the structured surface (25 a), and the reflective optical element (17) comprises at least one protective layer (37) continuously covering the structured surface (25 a). The invention also relates to an illumination optical unit (4) of a projection exposure apparatus (1) comprising at least one reflective optical element (17) of the above type, a projection exposure apparatus comprising an illumination optical unit of this type, and a method for producing a protective layer (37) on a reflective optical element (17) of the above type.

The invention relates to a semiconductor technology system, in particular an EUV lithography system, comprising: a housing (25) in which a plurality of preferably reflective optical elements (M1, M2, ...) are arranged in a beam path (33) of the semiconductor technology system, and an inspection device, in particular a camera (30) which has an imaging optic (31) for imaging at least a partial area (T1, T2, ...) of an optical surface (M1', M2', ...) of at least one optical element (M1, M2, ...) to be inspected in the housing (25) onto a spatially resolving detector (32). The inspection device is designed to inspect at least the partial area (T2, T3, ...) of the optical surface (M2', M3', ...) of the optical element (M2, M3, ...) to be inspected via at least one optical surface (M1', M2', ...) of at least one in the beam path (33) between the optical element (M2, M3, ...) to be inspected.) and the optical element (M1, M2, ...) arranged in the housing (25) of the inspection device. The invention also relates to an associated method.

The present invention relates to a virtual image display device and an optical unit, the virtual image display device comprising: a display that emits circularly polarized image light; and an optical member that forms a virtual image by reflecting the image light twice, the optical member having: a lens member; the transmission type reflective optical element is arranged opposite to a first optical surface, close to the display, of the lens component; a reflective polarizing optical element which is provided so as to face a second optical surface of the lens member, said second optical surface being away from the display, and which reflects image light that is linearly polarized light in the first polarization direction; and a wavelength plate element that is provided between the reflective optical element and the polarizing optical element, converts the image light that has passed through the reflective optical element into linearly polarized light in a first polarization direction, and converts the image light that has been reflected back and forth by the reflective optical element into linearly polarized light in a second polarization direction. The gradient normal angle of the wavelength plate element with respect to the optical surface on which the wavelength plate element is provided has an orientation of d + / -5 DEG or less.

Tunable optical metasurfaces can include an optically reflective surface to reflect optical radiation, such as infrared laser light. An array of optical resonant antennas can extend from or otherwise be positioned on the reflective surface, for example, at sub-wavelength spacing, e.g., less than half a wavelength. Voltage-controlled liquid crystals can be positioned in the optical field region of each optical resonant antenna. A controller can apply a voltage differential bias pattern to the liquid crystals of the optical resonant antennas, which can be arranged in a tiled, staggered, or randomly arranged subset of optical resonant antennas to obtain one-dimensional beam control, two-dimensional beam control, and / or spatial beam shaping.

A virtual image display device includes a display, and an optical member, in which the optical member includes a lens member, a transmissive reflective optical element provided facing a first optical surface of the lens member that is close to the display, a reflective polarizing optical element provided facing a second optical surface of the lens member that is far from the display and reflects first polarized light, that is, image light linearly polarized light in a first polarization direction, and a wave plate provided between the reflective optical element and the polarizing optical element, is formed of a photo-crosslinkable polymeric liquid crystal material, converts the image light, that is, linearly polarized light in the first polarization direction, and converts the image light, that is reflected by the reflective optical element to reciprocate, into second polarized light in a second polarization direction.

A plastic optical turning element, an imaging lens module and an electronic device are disclosed. The plastic optical turning element includes an entrance surface, an exit surface, a reflection surface and a reflective optical film layer. The entrance surface is configured to allow an imaging light to enter the plastic optical turning element. The exit surface is configured to allow the imaging light to exit the plastic optical turning element. The reflection surface is configured to turn the imaging light. The reflective optical film layer is disposed on a surface of the reflection surface and includes a silver atomic layer, a bottom optical film and a top optical film. The bottom optical film is in direct contact with the silver atomic layer, and the bottom optical film is closer to the reflection surface of the plastic optical turning element than the silver atomic layer. The top optical film has a refractive index lower than that of the bottom optical film, the top optical film is not in direct contact with the silver atomic layer, and the top optical film is farther away from the reflection surface of the plastic optical turning element than the silver atomic layer. In this way, the image restoration can be improved.

A method treats a reflective optical element for the VUV wavelength range, wherein the optical element has an aluminium surface. Treating the reflective optical element comprises irradiating the reflective optical element with a hydrogen plasma jet for removing an aluminium oxide layer formed on the aluminium surface. A reflective optical element for use in the VUV wavelength range treated by the method can be included in an optical arrangement.

The present disclosure describes near-eye display systems including an array of projectors and a one-dimensional exit pupil expander. The array of projectors can be arranged along a first dimension and can output image light towards an input coupler within a waveguide that provides one-dimensional exit pupil expansion. In some implementations, arrays of monochromatic projectors are implemented and arranged in offset columns. The input coupler in-couples the image light from the array of projectors into a TIR path within the waveguide. Different optical elements, including diffractive and reflective optics, may be implemented as the input coupler. The image light travels within the waveguide until it interacts with an output coupler. Upon interaction with the output coupler, the image light is expanded in a second dimension transverse to the first dimension and is coupled out of the waveguide.

The utility model provides a kind of automatic test LIBS system, it can solve the problem of poor test stability caused by uneven alloy sample material to be measured, improve test result accuracy;Including: reflective optical element group, set on the output light path of laser, for the laser beam of output reflection forms reflected light beam;Focusing lens, set on the reflected light path of reflective optical element group, for focusing reflected light beam on alloy to be measured to produce plasma signal;Moving unit, for driving reflective optical element group, focusing lens reciprocating displacement together, and along moving direction, focusing light beam is focused on the detection point of different area of alloy to be measured;Signal analysis unit, for collecting plasma signal, and analyzing plasma signal to determine the characteristic spectrum on the detection point of different area of alloy to be measured;Data processing unit is connected with signal analysis unit, for reading characteristic spectrum, determines the component result of alloy to be measured.

The invention relates to a semiconductor technology installation, in particular an EUV lithography installation, comprising: a housing (25), in which a plurality of preferably reflective optical elements (M1, M2,...) are provided in a beam path (33) of the semiconductor technology installation; and an inspection device, in particular a camera (30), which comprises an imaging optical unit (31) for imaging at least one sub-region (T1, T2,...) of an optical surface (M1', M2',...) of at least one optical element (M1, M2,...) to be inspected in the housing (25) onto a spatially resolving detector (32). The inspection device is designed to image at least the sub-region (T2, T3,...) of the optical surface (M2', M3',...) of the optical element (M2, M3,...) to be inspected via at least one optical surface (M1', M2',...) of at least one optical element (M1, M2,…), which is situated in the beam path (33) between the optical element (M2, M3,...) to be inspected and the inspection device in the housing (25). The invention further relates to an associated method.

An optical assembly for optical aperture expansion combines facet reflective technology with diffractive technology. At least two diffractive components having opposite optical power (matching) are used, so that chromatic dispersion introduced by the first diffractive component will then be cancelled by the second diffractive component. The two diffractive components are used in combination with a reflective optical component to achieve more efficient aperture expansion (for near eye display), reducing distortions and noise, while also reducing design constraints on the system and individual components, as compared to conventional techniques. The assembly eliminates and / or reduces the need for polarization management, while enabling wider field of view. In addition, embodiments can have reduced nonuniformity, as compared to conventional single technology implementations, since the distortion patterns of the two technologies do not correlate.

Embodiments of this disclosure relate to reflectors having tunable spectral reflectivity. Optical devices are used to enable more flexible and precise control of spectral reflectivity within a selected wavelength range, where the selected wavelength range has a maximum wavelength (λ). max ) and minimum wavelength (λ) min The equipment includes: a first Mach-Zehnder interferometer (MZI), which comprises a first arm and a second arm, the first arm and the second arm having a diameter greater than 2 × λ. max The tunable first optical path difference (OPD); and a second MZI, which is coupled in series with the first MZI, and the second MZI includes a third arm and a fourth arm, the third arm and the fourth arm having a diameter less than 2×λ. min A tunable second OPD is provided. An optical coupler is configured to direct an input optical signal within a selected wavelength range into a first MZI and a second MZI, and to output a reflected optical signal from the first MZI and the second MZI. A controller is configured to adjust the first tunable OPD and the second tunable OPD to control the spectral reflectivity of the output reflected optical signal.

A neutron detector comprising an optical fission chamber with a reflective optical cavity and a detection head coupled to the chamber comprising an optical lens and an optical fiber coupler. The invention relates to a neutron detector (1) comprising at least one sealed ionization chamber (2) with optical transduction, called an optical fission chamber (OFC) with a single optical cavity, the operation of which is based on optical transduction and which integrates, at one of its longitudinal ends, a window and an optical lens as an optical interface and, at the other end, a mirror to reflect photons traveling in the opposite direction to that of the window. Figure for the abstract: Fig. 9

The application provides a camera adapter, comprising a main body and a style replacement. The main body has an axially opposite lens front port and a camera rear port, and a light path channel communicating therebetween. The style replacement is detachably mounted inside the main body and constitutes a part of the light path channel, and has a reflective optical surface inside. The reflective optical surface is configured to change the light path characteristics to generate a preset visual style effect. The camera adapter of the application can flexibly switch the imaging style by replacing different style replacements on the main body without relying on post-processing or special lenses. The application has simple structure and convenient operation, significantly improves the flexibility and efficiency of photographic creation, and reduces the production cost of special visual effects.

The invention relates to an installation auxiliary structure and method for a TDLAS high-temperature-resistant multiple-reflection optical system, and the auxiliary structure comprises a positioning reference seat, a laser calibration assembly, an air exhaust adsorption assembly, and a reinforcement positioning assembly. The reflector mounting seat is used for mounting the reflectors and adjusting the relative positions and angles of the two reflectors, the positioning reference seat is used for quickly positioning when the quartz optical bracket is mounted and connecting the reflector mounting seat, and the reinforcing and positioning assembly is used for assisting the mounting and positioning of the high-temperature reinforcing structure. According to the method, a composite fixing mode of organic glue bonding and inorganic glue reinforcing is adopted, it is ensured that the installed system can stably operate for a long time in the high-temperature environment of 300-500 DEG C, and the problems that at the high temperature, an optical system is short in optical path, large in assembly difficulty, incapable of being produced in batches, prone to losing efficacy of the optical path, prone to deviation of precision and the like are solved.

Three-waveband off-axis reflective optical system with field of view switching and focusing detection function. It belongs to the field of optoelectronic technology. Multi-waveband common aperture imaging is realized by adopting off-axis two-mirror optical path form, imaging information can be obtained uninterruptedly day and night, laser emission and receiving ability is considered, and functions such as positioning and aiming, laser guiding are possessed. Large and small field of view switching imaging is realized by cutting in and out of the secondary mirror, and the ability of fast searching in large field of view range and accurate identification and tracking in small field of view range is possessed. Optical system autocollimation focusing is realized by switching the position of focusing detection mirror and setting focusing detection system, and clear imaging under different atmospheric pressure, temperature change and photographic distance is ensured, and the system is suitable for accurate aiming and detection of targets in various complex and harsh working conditions. The all-reflective optical system has no chromatic aberration, no obstruction, compact structure and high system integration, and meets the diversified functional requirements of optoelectronic system.