The application discloses an energy grid test method of an LDI
direct writing exposure machine, which comprises the following steps: S1, obtaining a substrate sample and performing pretreatment; S2,
coating ink on the pretreated substrate, baking and curing, and then placing the substrate at a preset position of an
exposure machine chuck pad; S3, obtaining an energy test pattern based on a preset proportion of a graphic pixel, and performing
exposure treatment on the energy test pattern by using the exposure
machine; and S4, developing and reading the energy test pattern obtained after the
exposure treatment, and obtaining the energy grid of the energy test pattern. The energy test pattern is directly scanned and imaged onto photosensitive ink by a
laser beam through a
spatial light modulator, and the energy grid of the pattern is read after development, so that the problem that the service life of an exposure ruler in the prior art is limited and the exposure ruler needs to be replaced regularly and has high cost is solved. Meanwhile, the depreciation of the exposure ruler reduces accuracy, and the
infrared function easily causes
high heat of the exposure ruler, thereby causing risks such as fire.