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77results about How to "Shorten the light path" patented technology

Optical system and head-mounted display device provided with optical system

InactiveCN106444046AReduce thickness and volumeShorten the light pathOptical elementsScattered lightOptoelectronics
The invention discloses an optical system and a head-mounted display device provided with the optical system. The optical system is located between an image generation unit and an image receiver, and comprises a lens, a light splitting assembly, a light modulation assembly and a polarization filter, wherein the lens is used for forming a pre-set focal distance of image optical information of an image generation unit; the light splitting assembly is used for enabling target light in the image optical information of the image generation unit to move back and forth for a plurality of times to pass through the lens and then enter the image receiver, and comprises a first light splitting device arranged between the lens and the image generation unit and a second light splitting device arranged between the lens and the image receiver; the light modulation assembly is used for modulating a polarization state of incident polarized light; and the polarization filter is used for stopping scattered light from entering the image receiver. The head-mounted display device comprises the optical system and the image generation unit. The optical device disclosed by the invention is relatively simple and effective; and a light path can be shortened through utilizing one piece of the lens, and the whole weight of the display device is reduced. The device has a small total length, a small size and a light weight and is convenient for a user to carry and use.
Owner:浙江舜通智能科技有限公司

Micro-spectrum analysis method and device based on Fresnel zone plate

The invention discloses a micro-spectrum analysis method and device based on Fresnel zone plate, wherein intensities of incoming lights with different wavelengths are detected in axial direction in adoption of axial light splitting characteristics of Fresnel zone plate, thereby realizing spectrum analysis / detection. An axial light-splitting component consisting of Fresnel zone plates is regarded as an upper movable light-splitting structure; a single static photoelectric detection unit and a drive circuit are regarded as lower static detection and active drive structure, wherein the two structures are connected via a bridge-like support structure. Optical signal is firstly radiated to an upper Fresnel zone plate to be focused to a photoelectric detection unit on lower layer; the drive circuit longitudinally pulls down the Fresnel zone plate to make focusing points with different wavelengths orderly lie on the photoelectric detection unit; thereafter, the optical signal is converted into electric signal, and incoming light spectrum is therefore acquired in adoption of subsequence signal treatment and algorithm analysis. Further, this invention can be achieved using MEMS technique and optical micro-machining technique, thereby greatly shortening light path, and achieving compacter device component structure, higher integration degree as well as smaller dimension.
Owner:CHONGQING UNIV

Small structured light illumination super-resolution microscopic imaging system

The invention discloses a small structured light illumination super-resolution microscopic imaging system which includes a laser light source, a collimating lens, a rotary light baffle module, a dichroic mirror, a filter plate, a microscopic objective lens, a carrier table, an imaging lens, a photoelectric detector and a synchronous control system. The light emitted by the laser light source is collimated by the collimating lens into parallel beams, the parallel beams are partially blocked by the rotary light baffle module, divided by the dichroic sheet and filtered by the filter plate placedon the entrance pupil surface of the microscopic objective lens, and then, structured light illumination is formed on the surface of a sample on the carrier table through the microscopic objective lens. The imaging lens and the photoelectric detector are placed behind the dichroic mirror and used for forming an image of fluorescence distribution on the surface of the sample. The synchronous control system is connected in a control manner with the rotary light baffle module, the carrier table and the photoelectric detector. The small structured light illumination super-resolution microscopic imaging system has the advantages of small size, compact structure, low cost, and the like, and is easy to carry. The application scope of structured light illumination super-resolution imaging is greatly extended.
Owner:INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI

Method for detecting heavy metal by using plasma atomic emission spectrometer

ActiveCN108802009AThe principle is simple and reasonableEasy to useAnalysis by electrical excitationHeavy metalsLow speed
The invention relates to a method for detecting heavy metal by using a plasma atomic emission spectrometer, and solves the technical problems of inconvenient operation of the detection process of theheavy metal and high photosignal loss, high detection cost, low efficiency and low speed caused by the serious pollution of a diaphragm. The invention provides the method for detecting the heavy metalby using the plasma atomic emission spectrometer. The method comprises the following steps: (1) introducing a working air source into an air intake branch pipe from a gas inlet; (2) producing stableplasma in a plasma excitation area through a plasma excitation device after preparing a gaseous state to-be-detected sample; (3) after the gaseous state to-be-detected sample enters the plasma excitation area, exciting the gaseous state to-be-detected sample by the plasma, producing a corresponding characteristic photosignal, then transmitting out the characteristic photosignal along the inner part of a main pipe through the diaphragm through a daylight opening opposite to the direction of a gas outlet, entering into the spectrometer, and acquiring spectral information of a to-be-detected sample atom. The method is widely applied to the field of spectrographs of analytical instruments.
Owner:HARBIN INST OF TECH AT WEIHAI
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