A semiconductor device having a silicon substrate, an element isolating film, an active region, a gate electrode provided via a gate insulating film, a diffusion layer provided on the active region on opposite sides of the gate electrode, an interlayer insulating film, and a plug filled in a hole formed on the interlayer insulating film, wherein the semiconductor device further has a contact forming region surrounded by the element isolating film, and a conductive layer formed on the contact forming region, the gate electrode extends so as to overlap with a portion of the contact forming region and is connected to the conductive layer at the overlapping portion, and the plug contacts the conductive layer at another portion of the contact forming region and is electrically connected to the gate electrode via the conductive layer.