The invention relates to a ground test condition
selection method for effectively simulating space
electron deep charging, and the method comprises the steps: obtaining environment
electron spectrum plane integral flux data of a to-be-simulated known space, inputting the data into a preset numerical model for calculation, and outputting a first charging balance maximum
electric field, the plane integration flux data comprises an energy value and a corresponding flux value, the numerical model transmits the plane integration flux data through a target
radiation sample medium, and a charging balance maximum
electric field is calculated; acquiring simulated single-energy-
beam electron energy and a plurality of corresponding flux guess values, inputting the simulated single-energy-
beam electron energy and the plurality of corresponding flux guess values into the numerical model for calculation, and outputting a plurality of second charging balance maximum electric fields; a second charging balance maximum
electric field closest to the first charging balance maximum electric field is indexed through the minimum difference value, and a corresponding flux
guess value, namely a ground test condition selection value for effectively simulating space
electron deep charging, is obtained. According to the invention, the corresponding electronic condition can be conveniently selected for the used
test equipment according to the
radiation sample.