The invention relates to a calibration technology for multiple structured light projected three-dimensional profile measuring heads, discloses a technology for calibrating multiple structured light projected three-dimensional profile measuring heads in different directions, which can be used for the quick label-free measurement of an object profile projected by structured light, and belongs to the technical field of optical measurement. In the calibration technology, only a calibration object of a plane with a plurality of calibration patterns is required to be designed and is not required to be manufactured into a high-precision three-dimensional target with known geometrical relationships on all surfaces; and geometrical parameters among all planes of the calibration object can be obtained by a close-range photogrammetry technology to upgrade the calibration object into the three-dimensional target, so the difficulty of machining and maintaining the high-precision three-dimensional target directly is reduced. By utilizing the technology, multiple structured light projected three-dimensional profile measuring heads can be measured from different visual angles in a label-free mode, and point clouds scanned in different directions are unified to one coordinate system automatically, so error accumulation caused by splicing is avoided effectively, and the time of the three-dimensional appearance reconstruction of the object can be shortened.