The material detection image defect enhancement method based on multi-
light source complementation of the application comprises the following steps: collecting and identifying parameters,
processing the parameters by a ternary mapping model, and outputting
noise feature prediction values and multi-
light source initial parameters; adjusting multiple light sources after optimizing the multi-
light source initial parameters to obtain optimized parameters, and collecting a noisy image of a material to be detected through a detection camera; inputting the
noise feature prediction values, the optimized parameters, and the noisy image into a preset conditional GAN anti-
noise model with light source constraints, and generating a defect enhancement image; when the parameter optimization criterion is not met, adjusting the optimized parameters, collecting a new noisy image, and repeating the steps until the parameter optimization criterion is met, and outputting the defect enhancement image, through the cooperation of multi-light source parameter adjustment and the introduction of the conditional GAN, a defect enhancement image with obvious and accurate features is generated, and through the introduction of an
artificial intelligence function
library and computer visual and auditory training and reinforcement of the model, the accuracy of subsequent defect recognition can be greatly improved.