Method for quantitatively detecting three-dimensional defects in device

A quantitative detection and defect technology, applied in the direction of material defect testing, etc., can solve the problems that affect the accuracy of quantitative verification and the low level of quantitative detection, and achieve the effect of improving anti-interference ability and high detection accuracy
CN109540968AActive Publication Date: 2019-03-29CHONGQING UNIV
7 Cites 3 Cited by

Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Applications(China)
Current Assignee / Owner
CHONGQING UNIV
Publication Date
2019-03-29

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The invention relates to a method for quantitatively detecting three-dimensional defects in a device. The method comprises the following steps of: 1) selecting K temperature sampling points on the measurement surface of a measured object, setting a defect geometric parameter vector P; 2) establishing a heat transfer model of the measured object according to the guess value of P, and employing thefinite element method to calculate and obtain a temperature departure ek of the K temperature sampling points, if the ek meets an iteration stop condition, finishing the iteration process, and takingthe guess value as a detection result of P, or else, entering the step 3); 3) establishing a fuzzy inference unit corresponding to the K temperature sampling points; 4) establishing a weighting comprehensive matrix of the fuzzy inference unit, and constructing a decentralized fuzzy inference module; and 5) performing decentralized fuzzy inference, and performing iteration correction of the guess value of the P according to the decentralized fuzzy inference result to replace the correction value as a guess value, and turning to the step 2). The method provided by the invention can quantitatively detecting the three-dimensional physical dimensions and depth information of the internal defects of the device to achieve the quantitative detection.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention belongs to the technical field of non-destructive testing of materials, and in particular relates to a method for quantitatively testing three-dimensional defects inside equipment. Background technique

[0002] Many industrial equipment have been operating under harsh conditions such as high temperature, high pressure and high-intensity alternating load for a long time. The internal defects formed or existing in the equipment during operation may cause major equipment failures or safety accidents. Therefore, internal defect identification is very important for equipment Health monitoring and accident prevention are important.

[0003] Modern non-destructive testing and evaluation technology not only needs to qualitatively detect the existence of defects, but more importantly, it needs to give quantitative detection results of related defects (size, position, shape, etc.). X-ray, ultrasonic testing, etc. Infrared thermal image non-destru...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More