The invention relates to the technical field of
chip testing, and discloses a
chip noise anti-interference testing
system which comprises a first direct-current power supply, a
signal generator, a
coupling plate, an evaluation plate and an
oscilloscope. The
coupling plate is provided with a
signal input connector, a power supply input connector, a filter circuit, an
electronic switch and an output connector. The
signal input connector is connected with the
signal generator. The power supply input connector is connected with the output end of the first direct-current power supply. The control end of the
electronic switch is connected with the signal input connector, the input end is connected with the power supply input connector through the filter circuit, and the output end is connected with the output connector. The evaluation board is provided with a
test input connector, a test output connector, a feedback connector and a
chip test seat which is electrically connected with the three connectors. The
test input connector is connected with the output connector, the test output connector is connected with the
oscilloscope, and the feedback connector is connected with the feedback end of the first direct-current power supply. The
system can carry out anti-interference test on a high-current and low-
voltage chip with low cost.