Method for automatically generating test coverage rate of flying probe test program

A technology for test coverage and flying probe testing, which is applied in the field of automatic generation of flying probe test program test coverage, which can solve the problems of cost, inability to explain the test method of the tested component in detail, consuming a lot of manpower and time, etc.

Inactive Publication Date: 2011-03-23
MITAC COMP (SHUN DE) LTD
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Problems solved by technology

[0003] However, the readability of the test program test coverage evaluation report output in text files is very low, the format and identification of text file descriptions are messy, and the test method of each tested component cannot be explained in detail. It takes a lot o...

Method used

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  • Method for automatically generating test coverage rate of flying probe test program
  • Method for automatically generating test coverage rate of flying probe test program

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Embodiment Construction

[0016] Please refer to figure 1 Shown is the flow chart of the method of the present invention. The invention provides a method for automatically generating the test coverage of a flying probe test program, which is developed based on Javelin flying probe test machine control software. The flying probe test is a test method for electrical testing of printed circuit boards. Contact the printed circuit board through the flying probe to test the electrical properties of the printed circuit board, such as resistance value and capacitance value.

[0017] Wherein, the present invention provides a method for automatically generating the test coverage of a flying probe test program, which mainly includes the following steps:

[0018] Step 101. Specify the flying probe program directory;

[0019] Step 102. Read the test data after the debugging of the flying probe program;

[0020] Step 103. Judging whether the current test data is the test data obtained by effective testing of the ...

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Abstract

The invention provides a method for automatically generating test coverage rate of a flying probe test program, which comprises the following steps of: appointing a flying probe program menu; reading the test data after testing and debugging a flying probe; judging whether the debugged test data is valid to test an element, if so, determining the test data is valid, if not, determining the test data is invalid; analyzing and storing the valid test data according to type of the element and storing name of the element and corresponding valid test data; analyzing the invalid test data and storing the invalid test data in class; judging whether the stored test data is repeated or not, if so, removing repeated test data, and if not, calculating the test coverage rate; and outputting the test coverage rate and storage result. The invention analyzes automatically and stores the test results and collects test results in form of tables so that the test coverage rate or other information can be acquired intuitively.

Description

technical field [0001] The invention relates to an evaluation test method, in particular to a method for automatically generating the test coverage rate of a flying probe test program developed under the control software of a Javelin flying probe test machine. Background technique [0002] After the debugging of the flying probe test program of a certain model is completed, analyze the test data to obtain the test coverage report of the tested model required by the customer. When evaluating the test coverage rate of a certain model, the test coverage rate generation program that comes with the original machine is to directly format the debugged result file and output it as a text file for users to consult. [0003] However, the readability of the test program test coverage evaluation report output in text files is very low, the format and identification of text file descriptions are messy, and the test method of each tested component cannot be explained in detail. It takes ...

Claims

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Application Information

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IPC IPC(8): G06F9/44G01R31/00G01R31/26
Inventor 李军
Owner MITAC COMP (SHUN DE) LTD
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