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659 results about "Then test" patented technology

Threshold voltage roll-off compensation using back-gated MOSFET devices for system high-performance and low standby power

A method for compensating the threshold voltage roll-off using transistors containing back-gates or body nodes is provided. The method includes designing a semiconductor system or chip having a plurality of transistors with a channel length of Lnom. For the present invention, it is assumed that the channel length of these transistors at the completion of chip manufacturing is Lmax. This enables one to set the off-current to the maximum value of I-offmax which is done by setting the threshold voltage value to Vtmin. The Vtmin for these transistors is obtained during processing by using the proper implant dose. After manufacturing, the transistors are then tested to determine the off-current thereof. Some transistors within the system or chip will have an off-current value that meets a current specification. For those transistor devices, no further compensation is required. For other transistors within the system or chip, the off-current is not within the predetermined specification. For those transistors, threshold voltage roll-off has occurred since they are transistors that have a channel length that is less than nominal. For such short channel transistors, the threshold voltage is low, even lower than Vtmin, and the off-current is high, even higher than I-offmax. Compensation of the short channel transistors is achieved in the present invention by biasing the back-gate or body node to give increased threshold voltage about equal to Vtmin and hence an off-current that meets the predetermined specification, which is about equal to I-offmax.
Owner:ETHICON INC +1

Suicide among well-mannered cluster nodes experiencing heartbeat failure

Methods for re-configuring a cluster computer system of multiple or more nodes when the cluster experiences communications failure. First and second nodes of the cluster have respective channel controllers. A SCSI channel and the controllers communicatively connect the multiple nodes. When a node becomes aware of a possible communications failure, the node attempts to determine the authenticity the failure and responds according to the determined authenticity. According to one method, a first node detects heartbeat node-to-node communications failure on the channel and then tests a physical drive on the channel. If the testing is successful, the node kills the other node. If the testing is unsuccessful, the first node commits suicide. In one embodiment, the coupling includes multiple channels communicatively coupling the first and second nodes and the first node selecting one of the channels for node-to-node communications. In this environment, choosing a physical drive involves testing node-to-node communications on another of the channels if no physical drive is online on the channel (and terminating the re-configuring method). If a drive is available, the first node uses the first physical drive online on the channel for testing. In another method, the second node initially detects communications failure and communicates that by attempting to negotiate wih the first node for a new configuration of the computer system. The first node tests a physical drive in response and negotiates with the second node if the testing was successful. If the testing was unsuccessful, the first node commits suicide.
Owner:XYRATEX TECH LTD

Rock true triaxial test system with CT (Computed Tomography) real-time scanning system and method

ActiveCN105181471ASolve the problem of not being able to penetrate the traditional true triaxial testing machineReal-time coordinationMaterial strength using tensile/compressive forcesMaterial analysis by transmitting radiationFiberTime extension
The invention relates to a rock true triaxial test system with a CT (Computed Tomography) real-time scanning system and a method. The rock true triaxial test system with the CT real-time scanning system comprises a triaxial pressure box, a triaxial host frame, a loading device and a CT scanning device, wherein the triaxial host frame comprises a bottom plate, a top plate and a stand column supported on the bottom plate; the loading device comprises a reversed force device, a jack and a measuring device; the pressure box, the stand column, and the reversed force device located in a scanning area of the CT scanning device are respectively made of carbon fiber materials. The rock true triaxial test system adopts the horizontal loading device, a carbon fiber force transfer plate and the stand column with special designs for a CT scanning area; solves the difficult problem that an X ray cannot penetrate through a traditional triaxial tester; overcomes the defect that in the traditional test, a rock sample needs to be unloaded and taken down from a true triaxial test bed and is then tested through CT scanning; realizes real-time coordination of rock true triaxial and CT scanning test; has significance on researching real-time extension and evolution law of microfissuring and microvoid in rocks under the triaxial stress state.
Owner:CHINA UNIV OF MINING & TECH

Method for testing flow conductivity of self-supported crack in riverfrac treatment

The invention relates to a method for testing flow conductivity of self-supported cracks in riverfrac treatment. The method comprises the steps of: manufacturing a core test piece which satisfy closed state of the crack wall surface after pressure relief return of riverfrac treatment, drilling a phi 50*100 mm cylindrical test piece, enabling the cylindrical test piece to be orthogonal with a pre-formed scratch, splitting the pre-formed scratch to manufacture a tensile fracture type crack wall surface, dislocating the crack wall surface, smoothly grinding the end surface of the core test pieceto obtain a non-proppant non-engaged crack wall surface combination; then testing the flow conductivity of the crack, putting the manufactured core test piece into a core clamping system, simulating formation stress and temperature, setting and sending a control instruction, enabling each system to work and feed back signals, and finally, collecting the test results and calculating the flow conductivity of self-supported crack in the riverfrac treatment. The method in the invention can really reflect the tensile fracture and shear slip process of the riverfrac treatment, and reduce the process to a pressure and temperature environment under the ground to test the flow conductivity; and the test method is achievable.
Owner:NORTHEAST GASOLINEEUM UNIV

Coding unit synchronous adaptive loop filter flags

An apparatus and method for coding unit-synchronous adaptive loop filtering (ALF) for an image area that is partitioned into a plurality of coding units are disclosed. In a conventional approach, the slice-level bitstream cannot be generated until all coding units in a slice are processed since the ALF filter coefficients are determined based on reconstructed pixels and original pixels of a slice. According to one embodiment, the method processes the coding units in the image area one after the other to generate a CU-level bitstream. The method also reconstructs the coding units to from reconstructed coding units which are subject to adaptive loop filtering. Upon the availability of reconstructed coding units for the image area, the method derives filter coefficients for the ALF filter based on the reconstructed pixels and original pixels in the image area. The designed ALF filter is then tested for each coding unit to determine whether the ALF filter should be applied to the coding unit and the decision is indicated by an ALF flag. After all ALF flags are determined, an image area header is created by incorporating the filter coefficients and ALF flags in the header. The header and the CU-level data previously created are combined into an image area level bitstream. An apparatus to perform the steps recited in the method is also disclosed.
Owner:MEDIATEK INC

Semiconductor component with redistribution circuit having conductors and test contacts

A bumped semiconductor component includes bumped contacts, a semiconductor die having die contacts, and a redistribution circuit having conductors for establishing electrical communication between the die contacts and the bumped contacts. The redistribution circuit also includes test contacts in electrical communication with the die contacts and with the bumped contacts. The test contacts allow the die to be tested without electrical engagement of the bumped contacts. The bumped semiconductor component can be contained on a wafer, or can be a singulated component such as a flip chip package. A test system includes the bumped semiconductor component, and an interconnect having contacts configured to electrically engage the test contacts without interference from the bumped contacts. If the test contacts are aligned with the die contacts, the same interconnect can be used to test the bare die as well as the bumped component. A test method includes the steps of: providing the bumped component with test contacts; providing the interconnect with interconnect contacts configured to engage the test contacts without interference from the bumped contacts; and then testing the component by applying test signals through the interconnect contacts to the test contacts.
Owner:MICRON TECH INC

Ultrasonic guided wave combined type nondestructive testing method and ultrasonic guided wave combined type nondestructive testing device

The invention provides an ultrasonic guided wave combined type nondestructive testing method. The method tests an object to be tested by allowing ultrasonic guided waves to transmit in the object to be tested and then testing reflection echo, and is characterized in that: the method for generating the ultrasonic guided wave by excitation adopts an electromagnetic excitation mode; and the mode of receiving the reflection echo is using a piezoelectric element for testing. The invention also claims the protection of the testing device corresponding to the ultrasonic guided wave combined type nondestructive testing method. The device of the invention can realize the defect test at greater distance and with higher sensitivity under a condition that the prior pipeline has a damping effect on theultrasonic guided wave. The technique can be used for nondestructive testing of components such as common pipes, steel rails, special pipes / rods, wire ropes, tank bottoms of oil tanks and the like. The method of the invention creatively combines two big technical advantages, so that the method has more obvious and better technique effect, and predicable huge economic values and social values.
Owner:INST OF METAL RESEARCH - CHINESE ACAD OF SCI
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