34 results about "Test setup" patented technology

Proposed are a test device and a manufacturing method of the test device capable of testing a test object that is provided with an electrode which has a size and / or a pitch distance ranging from 1 to 100 micrometers (μm).

The invention relates to an interferometric testing arrangement for testing the surface shape of a test object, comprising a lighting device (105, 205, 305) for generating an input wave from electromagnetic radiation produced by a light source and an interferometer (150) in which, after splitting the input wave into at least one test wave directed towards the test object (170) and a reference wave, testing the surface shape of at least a partial surface of the test object (170) can be carried out by interferometric superposition of the at least one test wave and the reference wave, wherein a diffuser (130, 230, 330) is arranged in the lighting device, wherein the lighting device has a first optical path (110, 210, 310) and a separate second optical path (120, 220, 320), and wherein the input wave is transmitted via both the first optical path (110, 210, 310) and the second optical path (120, 220, 320). 220,320) can be coupled into the interferometer (150).

The invention provides a DDR wafer test anomaly detection method and device based on machine learning, and the method comprises the steps: obtaining a time sequence eye pattern synchronously collected in a DDR wafer test process and time sequence waveform data related to total jitter, deterministic jitter and random jitter, and carrying out the clock edge phase segmentation alignment of differential time sequence sampling points in the time sequence waveform data, phase domain dense sampling data is constructed, adaptive sparse coding is completed in combination with DDR jitter physical priori, noise and normal process fluctuation related components are removed, defect sensitive sparse components are obtained, variational mode decomposition is performed, components related to process drift, normal process fluctuation and abrupt change abnormity are obtained, and the defect sensitive sparse components are subjected to sparse coding; and the abrupt change anomaly correlation component is extracted as target detection data, a preset machine learning model is input, an anomaly mode correlation result is generated, a DDR wafer test anomaly detection result is output based on the result, and a corresponding test setting item adjustment instruction is generated. According to the invention, the overall efficiency and the result reliability of the DDR wafer test can be improved.

The invention discloses a vehicle parking test method and system and electronic equipment, and the method comprises the steps that a parking test interface is displayed, the parking test interface comprises a first display area and a second display area, the first display area is used for displaying test operation state information in the parking test process, the test operation state information comprises test state information and test debugging information, and the second display area is used for displaying test debugging information; the second display area is used for displaying a test management control and is used for a user to perform parking test setting and check parking test parameters; parking test information is determined according to operation of a user on the test management control, wherein the parking test information comprises any one of a real vehicle mode, a simulation mode, a playback mode and a recharge mode; according to the parking test information, corresponding parking test processing is carried out, and corresponding test operation state information in the parking test process is displayed in the first display area. Therefore, the parking test efficiency can be improved, the development and verification period can be accelerated, the test scene can be expanded, and the parking test coverage can be more comprehensive.

Exemplary embodiments according to the invention include an automatic test equipment for testing a test object, wherein the automatic test equipment comprises a plurality of device power supplies, the device power supplies being configured to operate in a multiple operating mode. The automatic test equipment is configured to provide individual acquisition measurement results that are assigned to the individual device power supplies of a set of device power supplies when the individual device power supplies of the set of device power supplies are grouped.

A switch circuit connects an external inspection device to a first internal circuit, a second internal circuit, or both the first internal circuit and the second internal circuit in a state where the external inspection device is connected to an external terminal. A switch control circuit selects a connection destination of the external inspection device in the switch circuit based on a test setting signal from outside.

The invention provides a stray capacitance self-calibration measurement device and a stray capacitance self-calibration measurement method. The stray capacitance self-calibration measurement device comprises a stray capacitance measurement module and an error compensation module, the stray capacitance measurement module is connected to the two ends of the test circuit and is used for measuring the first stray capacitance of the test circuit which is not provided with the to-be-tested device and measuring the second stray capacitance of the test circuit which is provided with the to-be-tested device; the error compensation module is connected with the stray capacitance measurement module and used for judging whether the first stray capacitance is within a preset capacitance range or not and subtracting the first stray capacitance from the second stray capacitance when the first stray capacitance is within the preset capacitance range to obtain a measured capacitance value of the device to be measured. Whether the stray capacitance test of the test circuit is normal or not is judged firstly, and the stray capacitance value of the test circuit provided with the to-be-tested device is tested after the stray capacitance test is normal, so that the problem that the capacitance value measurement of the test device is finally influenced due to inaccurate test of the test circuit is avoided.

A test apparatus (14) for testing an antenna under test (16) has a measurement device (26), a turntable (24) and at least one stationary probe antenna (28). The measurement device (26) is a multi-channel measurement device, wherein the turntable (24) comprises a first portion (36), a second portion (38), a first rotatable RF joint (44) and a holding section (34), wherein the second portion (38) is attached rotatably to the first portion (36), and the first rotatable RF joint (44) provides a rotatable RF path between the first portion (36) and the second portion (38). The measurement device (26) and the holding section (34) are arranged spatially fixed with respect to each other at the second portion (38) of the turntable (24), and wherein the at least one stationary probe antenna (28) is electrically connected to the measurement device (26) for transmission of RF signals via the first rotatable RF joint (44). Further, a test setup (10) and a method are provided.

Method (100) for bridging testing between adjacent semiconductor devices, comprising: Formation (S110) of a structured diffusion region (12) on a semiconductor substrate (10); Forming (S120) a first conductive layer (14) over the diffusion area (12), wherein the first conductive layer (14) is structured in the same structure as the structured diffusion area (12); Forming (S130) a second conductive layer (22) extending in a first direction over the first conductive layer (14); Structuring (S140) the second conductive layer (22) to form an opening (48) extending in the first direction in a central area of ​​the second conductive layer (22) to expose a section of the first conductive layer (14); Removal (S150) of the exposed section of the first conductive layer (14), exposing a section of the diffusion area (12). Forming (S160) a source / drain region (30) over the exposed section of the diffusion region (12); Formation (S170) of a dielectric layer (28) over the source / drain region (30); Forming (S180) a third conductive layer (34) above the dielectric layer (28); Removing (S190) opposite end sections along the first direction of the second conductive layer (22) to expose opposite first and second end sections (42, 44) of the first conductive layer (14), and Measuring (S200) the electrical resistance across the first conductive layer (14) between the opposite first and second end sections (42, 44) of the first conductive layer (14).

This invention provides a method for evaluating the long-term stability of vibration-damping elastomers under multi-mode coupling environments. The method includes sample preparation, test setup, test parameter setting, collaborative detection, damage source tracing, accelerated calculation, and life prediction. Collaborative detection includes macroscopic and microscopic detection; damage source tracing involves determining the contribution ratio of each component; accelerated calculation yields the total acceleration coefficient; and life prediction is based on the acceleration coefficient, providing a scientific basis for formulation optimization, structural design, and engineering applications. The method for evaluating the long-term stability of vibration-damping elastomers under multi-mode coupling environments provided by this invention realistically simulates the synergistic effect of damp heat and dynamic load, achieving rapid and accurate life prediction.

A method and a system for analysing an equipment for current cycling test is disclosed. A processor receives an input dataset corresponding to the equipment. The input dataset includes a set of test control parameters, specification data, historical cycling test data and a set of setup parameters. The equipment is analysed based on the input dataset using an artificial intelligence (AI) model. The analysis is based on a validation of the specification data, the set of test control parameters and the set of test setup parameters with respect to the historical cycling test data. An outcome of the current cycling test is predicted based on the analysis as one of failure or pass. Upon predicting the outcome as failure, a reason of failure is determined by prompting a generative AI model.

The invention relates to a test setup for testing gas transport machines, for example hydrogen transport machines. The test setup according to the invention for testing gas transport machines comprises a receptacle (1) for the test specimen (2), a first input path (3) whose input is connected to a first gas source (8) and whose output can be connected to an input of the test specimen (2), an output path (4) whose input can be connected to an output of the test specimen (2), wherein the first input path (3) has a first pressure regulator (5) for regulating the pressure at the input of the test specimen (2), and the output path has a second pressure regulator (6) for regulating the pressure at the output of the test specimen (2).

The invention relates to a method for producing a security or valuable document (20) comprising a data carrier (1) provided with a printed image (12) of a person. To increase the counterfeit protection, at least one image-specific feature (17) is determined from the image (12) after the image of the person has been created. The image feature (17) is incorporated into the data carrier (1) as an electrically conductive structure (18). Furthermore, the invention relates to a corresponding security or valuable document, a verification method for checking the authenticity of such a document, and a test setup (40) for such a verification method.

The invention relates to a test device (2), a test setup (1), and a method – each for conducting a test on a battery (3) in which thermal runaway is selectively triggered in a battery cell (20) of the battery (3). The test device (2) comprises a penetrator device (4) with a penetrator (5) and a penetrator guide body (10) in whose guide channel (11) the penetrator (5) can be axially movably mounted. By means of a linear actuator unit (17) of the test device (2), the penetrator (5) can be moved translationally along the guide channel (11) in a trigger direction (z). Neither the penetrator device (4) nor the linear actuator unit (17) has a braking element by means of which a translational movement of the penetrator (5) relative to the guide channel (11) in the trigger direction (z) can be braked.In the process, the penetrator (5) is inserted into the battery cell (20) in the trigger direction (z) by means of the linear actuator unit (17).

This invention provides a machine learning-based method and device for anomaly detection in DDR wafer testing. It acquires timing eye diagrams and timing waveform data related to total jitter, deterministic jitter, and random jitter synchronously during DDR wafer testing. The method performs clock edge phase segmentation alignment on the differential timing sampling points in the timing waveform data to construct dense sampling data in the phase domain. Combined with DDR jitter physical priors, adaptive sparse coding is performed to remove noise and components related to normal process fluctuations, obtaining defect-sensitive sparse components. Variational mode decomposition is then performed to obtain components related to process drift, normal process fluctuations, and abrupt anomalies. The components related to abrupt anomalies are extracted as target detection data, input into a preset machine learning model, and anomaly pattern association results are generated. Based on these, DDR wafer testing anomaly detection results are output, and corresponding test setting adjustment instructions are generated. This invention can improve the overall efficiency and reliability of DDR wafer testing results.

The invention relates to a system and method for testing a device. Furthermore, the invention relates to a corresponding computer readable medium. In particular, the invention discloses a system for testing a device, the system comprising: a DUT interface (10) comprising a plurality of DUT ports (1,..., 8); an allocation matrix unit (20) having an input side configured to be connected to a plurality of DUT ports (1,..., 8) and an output side configured to be connected to one or more measurement units (M1, M2); and a test processor (30). The test processor (30) is configured to: receive test setting data; controlling the distribution matrix unit (20) such that at least one of the plurality of DUT ports (1,..., 8) is connected to at least one of the measurement units (M1, M2) according to the test setting data; and controlling one or more of the measurement units (M1, M2) to perform a corresponding measurement.

A low voltage differential serial (LVDS) communication system includes a system-on-chip (SoC) which includes a transmitter configured to serially transmit data, a receiver configured to serially receive data, a loopback control circuit configured to provide transmitted test data from the transmitter directly to the receiver during testing, and a built-in self-test (BIST) circuit. The BIST circuit controls testing by setting a voltage level of a common mode voltage for the transmitter, providing a test data pattern for transmission by the transmitter and receiving the test data pattern from the receiver in which the loopback control circuit directly provides the transmitted test data pattern from the transmitter to the receiver when an internal loopback configuration is enabled, and determining whether the voltage level of the common mode voltage results in a pass or fail.

The present invention relates to radio interference test systems and a radio interference test method for live recording and replaying RF inferences from the air. The present disclosure provides an easily deployable RF interference test setup for testing interference robustness or problematic interferers in particular in the approach to an airport or an airport runway. The present invention is based on the idea to employ specific non-commercial aerial vehicles, such as drones or aerial test vehicles, which are equipment with a suitable test equipment in order to be able to follow an approach path or flight path of a commercial plane for testing purposes.

The utility model discloses a circular pipe interface valve test tool comprising a water tank, an under-table water tank is fixedly installed on the right side of the outer surface of the upper end of the water tank, a blow-down valve is fixedly installed on the outer surface of the front end of the water tank, and a test structure is fixedly installed on the left side of the outer surface of the upper end of the water tank. The testing structure comprises a water pump, an annular base, a supporting column, a water pumping pipe, a water outlet pipe, an electric valve, a bent pipe, a connecting pipe and a pressure meter, and a water injection opening is formed in the right side of the outer surface of the upper end of the water tank. According to the testing tool for the round pipe connector valve, the testing structure is arranged, the round pipe connector valve can be conveniently tested, the under-table water tank is arranged, a connecting pipe connector in the testing structure faces downwards, water can be collected through the under-table water tank, the protection effect can be achieved, the safety in the testing process is improved, and the testing efficiency is improved. And through the arrangement of a heater, liquid in the water tank can be conveniently heated, and the multifunctionality of the test is improved.

The invention describes a test rig (10) for testing a seat belt system and / or for testing components of a seat belt system. Said test rig (10) comprises a test rig base (12), a holding unit (18) for mounting a seat belt system to be tested and / or components to be tested of a seat belt system, an impact unit (16) configured to apply load to a seat belt system to be tested, and a linear drive unit (20). The invention further presents a test setup comprising such test rig (10). In addition, the invention provides a method for operating such test rig (10).

The invention relates to a parameter adjusting method, system and terminal for an abrasion tester, and belongs to the technical field of abrasion tests.The parameter adjusting method comprises the steps that test setting data input by a user is received; according to the test setting data, similar test records are retrieved in a historical database, corresponding historical test parameters are extracted, and a corresponding historical parameter set is generated; actual environment data are collected, and an environment data set is generated; fusing the historical parameter set and the environment data set to generate a unified feature vector; according to the feature vector, matching a predefined rule base, and generating an initial test parameter; and according to the initial test parameters, controlling a wear testing machine to carry out a wear test. The method and the device have the beneficial effects of improving the accuracy and the reliability of a test result and better meeting test requirements.

The embodiment of the invention discloses a tester testing method, device and equipment. According to the technical scheme provided by the embodiment of the invention, the test setting parameter is obtained through the upper computer, the target output parameter is determined according to the test setting parameter, the target output parameter is calibrated through the upper computer according to the preset linear calibration parameter and the phase angle calibration parameter, and the calibration output parameter is obtained; the programmable gate array controls the digital-to-analog conversion unit to output a test analog signal to a tested device connected with the tester according to the calibration output parameter, the upper computer obtains detection data obtained by detecting the tested device, and a test result of the tested device is determined according to the detection data. Test is carried out through calibration output parameters after linear calibration and phase angle calibration, the situation that a test analog signal output by the tester is inconsistent with a needed target analog signal due to working errors of hardware equipment in the tester is reduced, and the test effect of the tester is effectively improved.

An information processing device (100) according to the present invention is a RAN intelligent controller (RIC). More specifically, the information processing device (100) comprises an estimation unit (132), a setting unit (133), and a test execution unit (134). The estimation unit (132) estimates a calculation resource used for a predetermined test for executing the test on the connection between communication units arranged in predetermined software. The setting unit (133) sets each communication unit in the predetermined software on the basis of the calculation resource. The test execution unit (134) executes, in the predetermined software, a predetermined test on the connection between a first communication unit to be subjected to the predetermined test and a second communication unit among the communication units.

The invention relates to a measuring method (16) for determining the electromagnetic attenuation of test materials (10). This method comprises an electromagnetically shielded measuring housing (3) with a window opening (7), a transmitting antenna (5), and a receiving antenna (4). One of the antennas (4, 5) is arranged inside the measuring housing (3), and the other is arranged outside the measuring housing (3). A reference measurement without test material (10) and a test measurement with test material (10) arranged in or on the window opening (7) are then performed. The attenuation of the test material (10) is determined by comparing the results of these measurements. The invention also relates to a test setup (1) for carrying out the measuring method (16).

The application discloses a kind of instrument amplifier misadjustment voltage test method and device, it is related to amplifier (or integrated circuit) test technical field, method includes: by standard instrument amplifier and the measured instrument amplifier form group, test sets up standard instrument amplifier and the two groups of gain of measured instrument amplifier group body two total misadjustment voltages, namely accurate test instrument amplifier input misadjustment voltage and output misadjustment voltage can be realized, device includes: first condition applying module, first total misadjustment voltage acquisition module, second condition applying module, second total misadjustment voltage acquisition module, first calculation module, second calculation module, third calculation module, output module.This method and device can obtain higher test precision result with lower test resource requirement, can carry out automatic test.

This invention relates to a method and test setup (TA) for testing a radar sensor (RUT), comprising: a receiving portion (A) for the radar sensor (RUT), wherein the radar sensor (RUT) is configured to emit a radar signal (RS); at least one receiving antenna (RX) configured to receive the radar signal (RS); at least two transmitting antennas (TX1, TX2) configured to transmit corresponding reflected signals (TS1, TS2), wherein a superimposed signal is a superposition of the reflected signals (TS1, TS2), the superimposed signal being receivable by the radar sensor (RUT), wherein a first number of the at least one receiving antenna (RX) is less than a second number of the at least two transmitting antennas (TX1, TX2); and a calculation unit (Re) configured to calculate at least one parameter of the corresponding reflected signal (TS1, TS2) based on the received radar signal (RS).

The invention relates to a method for optimizing the setup of a test bench test of a vehicle assembly.

Probe head (101) with a housing part (101A) for optical shape detection and / or surface inspection of a component (B) n ) comprehensive - at least one camera (K0) with at least one lens for recording image data of at least one measurement area image of a measurement area image sequence of a component surface of the component (B) n ), - at least one switchable lighting element (101B) as a light source for illuminating at least one area of ​​the component surface of the component (B n ) during the recording of the at least one measurement range image, wherein - the at least one illumination element (101B) outside the north pole of a hemispherical scattering body (101D) opposite a measuring plane (ΔS) Bx x ΔS By ) of the measurement range image is arranged at an angle and - that at least one lens of the camera (K0) is arranged relative to the scattering body (101D) such that the lens of the camera (K0) through the viewing aperture (101D-1) of the scattering body (101D) illuminates the illuminated area of ​​the component surface of the component (B) at its north pole n ) parallel to the measurement plane (ΔS Bx × ΔS By ) of the measurement range image, characterized in that - a diffuser element (101B-1) is assigned to the at least one lighting element (101B), which scatters the light emitted by the at least one lighting element (101B), which then strikes an inner wall of the housing part (101A) at a predefinable angle, wherein - the inner wall of the housing part (101A) is coated to scatter the light, so that the inner wall acts as a light reflector (101G) and as a scattering element, and the scattered light is emitted from the inner wall at a reflection angle, which then points onto a component (B) n ) far-facing surface of the scattering body (101D) hits, - wherein the scattering body (101D) distributes the light passing through it on the exit side of the scattering body (101D), which is directed onto the area of ​​the component surface of the component to be illuminated (B). n ) meets.

The invention provides a product curvature testing device and method. The device comprises a control system, a test board, a material taking module, a test module and a pressing module, wherein the material taking module, the test module and the pressing module are arranged on the test board; wherein the test module comprises a test PCB, a product fitting point arranged on the test PCB, and a strain gauge located below the product fitting point; a to-be-tested product is attached to the product attaching point; the material taking module is used for grabbing the test module on which the to-be-tested product is attached and placing the test module on the test station of the test board; the pressing module is used for pressing down the PCB to be tested; and the control system is used for determining the bending degree of the product to be tested according to the detection data of the strain gauge and the pressing stroke of the pressing module. According to the invention, automatic and high-precision testing of the bending degree of the product can be realized.

User-specific neurostimulation settings are efficiently determined and optimized based on an optimized set of population-based neurostimulation settings. The population data are clustered and a set of test settings for a new user are selected as settings that efficiently discriminate between the clusters. User preference of the test settings are used to map the user to a particular cluster of settings, which can be used to determine user-specific neurostimulation settings. The user-based settings can be iteratively updated and / or optimized using information from the population data, such as by using average preference score surfaces in the population data to identify and / or filter new test settings for the user.