186 results about "Test setup" patented technology

Method and apparatus are provided for propagating microwave energy into heart tissues to produce a desired temperature profile therein at tissue depths sufficient for thermally ablating arrhythmogenic cardiac tissue to treat ventricular tachycardia and other arrhythmias while preventing excessive heating of surrounding tissues, organs, and blood. A wide bandwidth double-disk antenna (700) is effective for this purpose over a bandwidth of about six gigahertz. A computer simulation provides initial screening capabilities for an antenna such as antenna, frequency, power level, and power application duration. The simulation also allows optimization of techniques for specific patients or conditions. In operation, microwave energy between about 1 Gigahertz and 12 Gigahertz is applied to monopole microwave radiator (600) having a surface wave limiter (606). A test setup provides physical testing of microwave radiators (854) to determine the temperature profile created in actual heart tissue or ersatz heart tissue (841). Saline solution (872) pumped over the heart tissue (841) with a peristaltic pump (862) simulates blood flow. Optical temperature sensors (838) disposed at various tissue depths within the heart tissue (841) detect the temperature profile without creating any electromagnetic interference. The method may be used to produce a desired temperature profile in other body tissues reachable by catheter (510) such as tumors and the like.

An analog BIST (Built-in Self-Test) module for a load board in a test system for testing Integrated Chips (IC) and other devices-under-test (DUTs). Components of the test module perform test setup, transmission of analog test signals to a DUT, capture of analog and digital test data from the DUT, and on-board analysis of the test data using DSPs without sending the test data to a tester. Modules may be add-on boards to load boards an contain one or more processors and multiple components to test DUTs in parallel, significantly decreasing test and analysis times of a test system such as a Very Low Cost Tester (VLCT).

A method and system for testing a plurality of RFID devices disposed on a common carrier. In one embodiment, the RFID devices are evenly spaced along the length of the carrier, and the system comprises a short-range tester, a long-range tester and a computer, the short-range tester being coupled to the computer and having a short-range testing position, the long-range tester being coupled to the computer and having a long-range testing position, the long-range testing position being spaced downstream from the short-range testing position by a known number of device positions. In use, an RFID device of interest is first positioned at the short-range testing position, and the short-range tester reads a unique identifier for that RFID device and communicates the identifier to the computer. The carrier is then advanced so that subsequent RFID devices are read by the short-range tester. When the RFID device of interest has advanced to the long-range testing position, the long-range tester conducts a performance test and communicates any detected results to the computer. Because the distance between the two testing positions is known, the computer knows when the RFID device of interest is at the long-range testing position and uses the identifier to distinguish the results for that device from the results of any other devices.

The present technology involves an apparatus and method for calibrating a plurality of distinct signal paths connecting a device under test (DUT) to a time measurement device. The disclosed calibration circuit, which may be connected to the test setup throughout the testing process, measures the signal skew associated with each distinct signal path connecting a DUT, such as an integrated circuit, to a time measurement device, such as a time interval analyzer. The measured skew values, which may be collected throughout the testing process, are stored in memory. Such memory may be within the time measure device, an external storage device or a computing device that may be in communication with the time measurement device. The time measurement device uses the stored skew values to adjust the test signals to compensate for signal path related signal skew. In addition, the stored skew values are used to perform signal path diagnostics. This is accomplished by comparing newly measured skew values to stored skew values and generating a signal path failure signal when the newly measured skew values fall outside a user programmable range of acceptable skew values.

Each signal generating circuit for generating a CS signal, an address signal, a data signal or an R / W signal of a memory to be tested, and a test setting control circuit for generating a control data of these signal generating circuits are provided. The signal generating circuits and the test setting control circuit have shift registers, and a control data and a test data are serially input to these shift registers from external terminals.

Embodiments of the invention generally provide a containment system having integrated bubble tight-dampers. In another embodiment, the containment system includes an integral auto-scan mechanism disposed in the housing of the containment system so that a filter element, disposed in the housing, may be leak tested without accessing the interior of the housing. In yet another embodiment, a method for testing a filter disposed in a containment system includes challenging an upstream side of a filter element disposed in a housing of the containment system with a test aerosol, and automatically moving a probe disposed within the housing to obtain samples for leak testing.