54 results about "Test setup" patented technology

A system for accidentology-based measuring of accident risk-indexing score values for a motor vehicle to be tested providing a measured accident probability value for an occurrence of an accident event having a physical impact to the tested motor vehicle. The system includes a driving scenario module, a test setting module, and a scoring module. The driving scenario module is configured for determining various driving scenarios for the motor vehicle by defining a set of measurable scenario characteristics, which include at least one ADAS variable. The test setting module is configured for determining a test setting in form of a multi-dimensional test matrix, which includes testing protocols for each of the measurable scenario characteristics for providing measured values of measurable scenario characteristics of the various driving scenarios. The scoring module is configured for generating the risk-indexing score by receiving the multi-dimensional test result signal and a historical data information signal.

Proposed are a test device and a manufacturing method of the test device capable of testing a test object that is provided with an electrode which has a size and / or a pitch distance ranging from 1 to 100 micrometers (μm).

The invention relates to the technical field of explosion-proof robot detection, in particular to an explosion-proof robot 3R structure test platform and test method.The test platform comprises a test PC, a control cabinet and a motor, a panel is arranged at the top end of the control cabinet, and a demonstrator is arranged at one end of the control cabinet; the panel is uniformly provided with a plurality of station bearing assemblies used for installing to-be-tested pieces, and the two ends of the panel are provided with protective supports fixed to the control cabinet. The test PC is arranged on the protective bracket close to one side of the to-be-tested workpiece mounting bracket; fault indicating lamps are arranged at the tops of the protective supports; the station bearing assembly is used for installing and carrying a to-be-tested piece, the motor is used for driving a J4 shaft of the to-be-tested piece to rotate, track data, fault codes and motor data generated by the demonstrator are automatically integrated through the testing PC, a visual report containing risk identification is generated, and therefore the problems that an explosion-proof robot depends on a traditional testing method, the testing period is long, and the testing efficiency is high are solved. Fault positioning is difficult, and maintenance is inconvenient.

The invention discloses a cabin area controller upgrading test device and method. The device comprises a cabin area controller, an initialization unit, a control unit, a switch switching unit and a power supply unit. The first input end of the switch switching unit is connected with the initialization unit, the second input end of the switch switching unit is connected with the control unit, and the output end of the switch switching unit is connected with the cabin domain controller; the switch switching unit is used for controlling the on-off between the initialization unit and the cabin domain controller; the control unit is used for sending a test signal to the cabin domain controller and switching the cabin domain controller from an initial setting state to a test setting state; the first end of the power supply unit is connected with the cabin area controller, the second end of the power supply unit is connected with the control unit, the power supply unit is used for supplying power to the cabin area controller based on the first control signal sent by the control unit, the structure is compact, the cost is low, the stability and the reliability are higher, and the system is suitable for a laboratory environment where a large number of OTA tests need to be repeatedly carried out.

The invention relates to an interferometric testing arrangement for testing the surface shape of a test object, comprising a lighting device (105, 205, 305) for generating an input wave from electromagnetic radiation produced by a light source and an interferometer (150) in which, after splitting the input wave into at least one test wave directed towards the test object (170) and a reference wave, testing the surface shape of at least a partial surface of the test object (170) can be carried out by interferometric superposition of the at least one test wave and the reference wave, wherein a diffuser (130, 230, 330) is arranged in the lighting device, wherein the lighting device has a first optical path (110, 210, 310) and a separate second optical path (120, 220, 320), and wherein the input wave is transmitted via both the first optical path (110, 210, 310) and the second optical path (120, 220, 320). 220,320) can be coupled into the interferometer (150).

The invention provides a DDR wafer test anomaly detection method and device based on machine learning, and the method comprises the steps: obtaining a time sequence eye pattern synchronously collected in a DDR wafer test process and time sequence waveform data related to total jitter, deterministic jitter and random jitter, and carrying out the clock edge phase segmentation alignment of differential time sequence sampling points in the time sequence waveform data, phase domain dense sampling data is constructed, adaptive sparse coding is completed in combination with DDR jitter physical priori, noise and normal process fluctuation related components are removed, defect sensitive sparse components are obtained, variational mode decomposition is performed, components related to process drift, normal process fluctuation and abrupt change abnormity are obtained, and the defect sensitive sparse components are subjected to sparse coding; and the abrupt change anomaly correlation component is extracted as target detection data, a preset machine learning model is input, an anomaly mode correlation result is generated, a DDR wafer test anomaly detection result is output based on the result, and a corresponding test setting item adjustment instruction is generated. According to the invention, the overall efficiency and the result reliability of the DDR wafer test can be improved.

The invention relates to a method for interferometric surface measurement of a test specimen, a computer-generated hologram (CGH) and an interferometric test arrangement. In a method according to the invention, an interferometric superposition of a test wave directed by a CGH (120, 220, 320, 410, 420, 430, 510) onto the test piece (140, 240, 340, 540) and reflected therefrom is carried out with a reference wave not reflected at the test piece, wherein, based on a further interferometric superposition of light reflected at at least one Littrow structure (122, 222, 322, 412, 422, 432, 512) of the CGH with light reflected at a reference surface, a contribution to the optical effect of the CGH caused by a deformation present at the CGH is determined, and wherein a determination of the fit of the test piece (140, 240, 340, 540) is carried out taking this contribution into account.

The invention discloses a vehicle parking test method and system and electronic equipment, and the method comprises the steps that a parking test interface is displayed, the parking test interface comprises a first display area and a second display area, the first display area is used for displaying test operation state information in the parking test process, the test operation state information comprises test state information and test debugging information, and the second display area is used for displaying test debugging information; the second display area is used for displaying a test management control and is used for a user to perform parking test setting and check parking test parameters; parking test information is determined according to operation of a user on the test management control, wherein the parking test information comprises any one of a real vehicle mode, a simulation mode, a playback mode and a recharge mode; according to the parking test information, corresponding parking test processing is carried out, and corresponding test operation state information in the parking test process is displayed in the first display area. Therefore, the parking test efficiency can be improved, the development and verification period can be accelerated, the test scene can be expanded, and the parking test coverage can be more comprehensive.

Exemplary embodiments according to the invention include an automatic test equipment for testing a test object, wherein the automatic test equipment comprises a plurality of device power supplies, the device power supplies being configured to operate in a multiple operating mode. The automatic test equipment is configured to provide individual acquisition measurement results that are assigned to the individual device power supplies of a set of device power supplies when the individual device power supplies of the set of device power supplies are grouped.

A switch circuit connects an external inspection device to a first internal circuit, a second internal circuit, or both the first internal circuit and the second internal circuit in a state where the external inspection device is connected to an external terminal. A switch control circuit selects a connection destination of the external inspection device in the switch circuit based on a test setting signal from outside.

Method for fatigue testing of a beam-shaped test specimen with a predetermined target load distribution, comprising at least a first test sequence (SQ1) of a first segment (SG1) of the test specimen, wherein one end of the first segment (SG1) is fixed in a test device (2) and is excited with a first predetermined load collective, comprising a load amplitude for each cross-section along the segment (SG1) of the test specimen, a load mean value for each cross-section along the segment (SG1) of the test specimen and a number of cycles, by an active load introduction means (4) at a first load frequency close to or equal to the system natural frequency of the test setup, and, subsequently, a second test sequence (SQ2) of a second segment (SG2) of the test specimen, which overlaps at least partially with the first segment (SG1) of the test specimen, wherein one end of the second segment (SG2) is fixed in a test device (2) and is excited with a second predetermined load collective by an active load introduction means (4) at a second load frequency close to or equal to the system natural frequency of the test setup, wherein the first predetermined load collective together with the second predetermined load collective accumulates at individual cross-sections along the test specimen and thereby achieves or exceeds the predetermined target load distribution, wherein the first load collective and the second load collective act together in the impact or pivoting direction or together in the impact and pivoting direction.

The invention relates to the technical field of radio frequency microwaves, and discloses an automatic test system and method for a vector network analyzer, and the system comprises a data interaction module which is used for achieving the data interaction with the vector network analyzer; the test setting module is used for setting test items: according to the electronic product to be tested, items needing to be tested are added to a test process, test item information is set, and the test item information comprises test item names, test parameters and test index value ranges input by testers; and the data processing module is used for executing the test items: processing the test data returned by the vector network analyzer according to different test items to obtain a test result, and checking whether the test items meet the requirements of the to-be-tested electronic product or not according to a set test index value range. The problem that an automatic test system can only test electronic products of a single model is solved.

The invention provides a stray capacitance self-calibration measurement device and a stray capacitance self-calibration measurement method. The stray capacitance self-calibration measurement device comprises a stray capacitance measurement module and an error compensation module, the stray capacitance measurement module is connected to the two ends of the test circuit and is used for measuring the first stray capacitance of the test circuit which is not provided with the to-be-tested device and measuring the second stray capacitance of the test circuit which is provided with the to-be-tested device; the error compensation module is connected with the stray capacitance measurement module and used for judging whether the first stray capacitance is within a preset capacitance range or not and subtracting the first stray capacitance from the second stray capacitance when the first stray capacitance is within the preset capacitance range to obtain a measured capacitance value of the device to be measured. Whether the stray capacitance test of the test circuit is normal or not is judged firstly, and the stray capacitance value of the test circuit provided with the to-be-tested device is tested after the stray capacitance test is normal, so that the problem that the capacitance value measurement of the test device is finally influenced due to inaccurate test of the test circuit is avoided.

This invention relates to an automatic servo testing system and method based on a programmable power supply. The testing system includes a host computer module providing a testing software interface; an automatic power supply start-up and test information setting module for reading and storing power supply and test setting information; an automatic power supply on / off control module for automatically controlling the power supply and control power supply; an automatic command sending and feedback acquisition and processing module for acquiring test command types and command cycles, sending test commands, and judging and extracting received feedback data; an automatic fault judgment and processing module for periodically querying the status of the control power supply and power supply, querying and judging feedback data in real time, and receiving and judging position feedback in real time; and an automatic process monitoring and processing module for automatic real-time monitoring. This invention solves the problems of high manpower requirements, low automation, slow fault handling, and low safety and reliability in existing servo product testing.

A test apparatus (14) for testing an antenna under test (16) has a measurement device (26), a turntable (24) and at least one stationary probe antenna (28). The measurement device (26) is a multi-channel measurement device, wherein the turntable (24) comprises a first portion (36), a second portion (38), a first rotatable RF joint (44) and a holding section (34), wherein the second portion (38) is attached rotatably to the first portion (36), and the first rotatable RF joint (44) provides a rotatable RF path between the first portion (36) and the second portion (38). The measurement device (26) and the holding section (34) are arranged spatially fixed with respect to each other at the second portion (38) of the turntable (24), and wherein the at least one stationary probe antenna (28) is electrically connected to the measurement device (26) for transmission of RF signals via the first rotatable RF joint (44). Further, a test setup (10) and a method are provided.

1. The name of the design product: graphical user interface of laser gyro dynamic lock area test system for electronic device. 2. The use of the design product: for running laser gyro dynamic lock area test system program and displaying information on electronic device. 3. The design points of the design product: graphical user interface on electronic device. 4. The picture or photo that best shows the design points: front view. 5. The electronic device is a common design, and the rear view, left view, right view, top view and bottom view are omitted. 6. The use of the graphical user interface: after opening the software, enter the main view, the system automatically searches for test equipment, each test equipment searched has 4 channels, which correspond to 4 cells respectively, as shown in [interface change state diagram 1]; click "test setting" in the upper left corner of [interface change state diagram 1], three options are popped up, as shown in [interface change state diagram 2], select the dynamic lock test option, and the dynamic lock area test pop-up sub-interface shown in [interface change state diagram 3] is popped up, the dynamic lock area test pop-up interface displays the temperature monitoring state of the oven and the monitoring state of the single-axis turntable, in the test setting column of [interface change state diagram 3], select the oven, and set the oven temperature, temperature change rate, waiting time, start pulse, end pulse and turntable speed in the test setting column, and check the unit channel that needs to be tested in the dynamic lock area automatic test column, in this example, it is the No. 1 unit channel, as shown in [interface change state diagram 4], click the start test button, enter [interface change state diagram 5], a channel unit confirmation pop-up window is popped up, click the confirm button of the pop-up window to confirm the selected test channel, the system will enter the automatic test, after starting the test, the oven will first change the temperature to the oven temperature set in the test setting, and display the remaining time of the temperature change, as shown in [interface change state diagram 6]; after the temperature reaches the target temperature of the oven set in the test setting, start waiting for the set waiting time, and display the remaining waiting time, as shown in [interface change state diagram 7]; after the waiting time is over, the system automatically opens the selected test unit channel, in this example, it is the No. 1 unit channel, starts data collection, and displays on the test interface, as shown in [interface change state diagram 8], in order to view the state change of the main interface, the dynamic lock area test pop-up sub-interface in [interface change state diagram 8] is minimized; at the same time when the channel is automatically opened, the turntable automatically returns to zero position, the current position in the turntable state column of the dynamic lock area test pop-up interface displays 0°, as shown in [interface change state diagram 9], and the system background automatically starts to find the corresponding start position and end position of the turntable according to the set start pulse and end pulse, after the background calculates the start position and end position, the turntable first returns to the start position, and displays in the turntable state column of the dynamic lock area test pop-up interface, as shown in [interface change state diagram 10], after the turntable returns to the start position, it starts to move to the end position at 0.01 / s, at this time, the position to position indicator in the state of the turntable is off, the running indicator is on, the turntable returns to the starting position, at the same time, the test interface unit 1 is cleared, from this moment, the digital gyroscope test data is collected and stored again, as shown in [interface change state diagram 11], for the convenience of viewing the main interface state change, the dynamic lock area test pop-up window sub-interface is minimized in [interface change state diagram 11]; the collected points are displayed on the dynamic lock area test result column of the dynamic lock area test pop-up window sub-interface after 20 s sliding average, and the calculated fitting straight line is displayed synchronously, as shown in [interface change state diagram 12], until the turntable moves to the end position; after the turntable moves to the end position, the dynamic lock area test is completed, the lock area position is calculated automatically and displayed on the fitting curve, as shown in [interface change state diagram 13]; clicking the data record button on the dynamic lock area test result column of [interface change state diagram 13], the saved test data file and the calculated starting position and inflection point corresponding to the lock area can be seen on the displayed data record sub-page, as shown in [interface change state diagram 14], after minimizing the dynamic lock area test pop-up window interface, the original curve of the collected data in this test can also be seen on the test interface, as shown in [interface change state diagram 15].

The invention provides a vehicle test method and system, and relates to the technical field of motor vehicle active safety test.The method comprises the steps that test setting information of a target user is obtained, and the test setting information comprises geographic information of a test area, attribute information of a test object and set track data; the test object comprises a target vehicle with an advanced driving assistance system; specifying a test area in the test field according to the geographic information, and generating a global map corresponding to the test area; determining Y test objects from X objects to be selected according to the attribute information, and generating simulation icons corresponding to the Y test objects one by one; for each test object, issuing the set track data corresponding to the test object to the test object, so that the test object moves in the test area according to the corresponding set track; receiving target test data generated in the process that the target vehicle moves according to the corresponding set track; and judging whether the target test data accords with a test expected result or not.

Method (100) for bridging testing between adjacent semiconductor devices, comprising: Formation (S110) of a structured diffusion region (12) on a semiconductor substrate (10); Forming (S120) a first conductive layer (14) over the diffusion area (12), wherein the first conductive layer (14) is structured in the same structure as the structured diffusion area (12); Forming (S130) a second conductive layer (22) extending in a first direction over the first conductive layer (14); Structuring (S140) the second conductive layer (22) to form an opening (48) extending in the first direction in a central area of ​​the second conductive layer (22) to expose a section of the first conductive layer (14); Removal (S150) of the exposed section of the first conductive layer (14), exposing a section of the diffusion area (12). Forming (S160) a source / drain region (30) over the exposed section of the diffusion region (12); Formation (S170) of a dielectric layer (28) over the source / drain region (30); Forming (S180) a third conductive layer (34) above the dielectric layer (28); Removing (S190) opposite end sections along the first direction of the second conductive layer (22) to expose opposite first and second end sections (42, 44) of the first conductive layer (14), and Measuring (S200) the electrical resistance across the first conductive layer (14) between the opposite first and second end sections (42, 44) of the first conductive layer (14).

This invention provides a method for evaluating the long-term stability of vibration-damping elastomers under multi-mode coupling environments. The method includes sample preparation, test setup, test parameter setting, collaborative detection, damage source tracing, accelerated calculation, and life prediction. Collaborative detection includes macroscopic and microscopic detection; damage source tracing involves determining the contribution ratio of each component; accelerated calculation yields the total acceleration coefficient; and life prediction is based on the acceleration coefficient, providing a scientific basis for formulation optimization, structural design, and engineering applications. The method for evaluating the long-term stability of vibration-damping elastomers under multi-mode coupling environments provided by this invention realistically simulates the synergistic effect of damp heat and dynamic load, achieving rapid and accurate life prediction.

A method and a system for analysing an equipment for current cycling test is disclosed. A processor receives an input dataset corresponding to the equipment. The input dataset includes a set of test control parameters, specification data, historical cycling test data and a set of setup parameters. The equipment is analysed based on the input dataset using an artificial intelligence (AI) model. The analysis is based on a validation of the specification data, the set of test control parameters and the set of test setup parameters with respect to the historical cycling test data. An outcome of the current cycling test is predicted based on the analysis as one of failure or pass. Upon predicting the outcome as failure, a reason of failure is determined by prompting a generative AI model.

The invention relates to a test setup for testing gas transport machines, for example hydrogen transport machines. The test setup according to the invention for testing gas transport machines comprises a receptacle (1) for the test specimen (2), a first input path (3) whose input is connected to a first gas source (8) and whose output can be connected to an input of the test specimen (2), an output path (4) whose input can be connected to an output of the test specimen (2), wherein the first input path (3) has a first pressure regulator (5) for regulating the pressure at the input of the test specimen (2), and the output path has a second pressure regulator (6) for regulating the pressure at the output of the test specimen (2).

The invention relates to a method for producing a security or valuable document (20) comprising a data carrier (1) provided with a printed image (12) of a person. To increase the counterfeit protection, at least one image-specific feature (17) is determined from the image (12) after the image of the person has been created. The image feature (17) is incorporated into the data carrier (1) as an electrically conductive structure (18). Furthermore, the invention relates to a corresponding security or valuable document, a verification method for checking the authenticity of such a document, and a test setup (40) for such a verification method.

The invention relates to a test device (2), a test setup (1), and a method – each for conducting a test on a battery (3) in which thermal runaway is selectively triggered in a battery cell (20) of the battery (3). The test device (2) comprises a penetrator device (4) with a penetrator (5) and a penetrator guide body (10) in whose guide channel (11) the penetrator (5) can be axially movably mounted. By means of a linear actuator unit (17) of the test device (2), the penetrator (5) can be moved translationally along the guide channel (11) in a trigger direction (z). Neither the penetrator device (4) nor the linear actuator unit (17) has a braking element by means of which a translational movement of the penetrator (5) relative to the guide channel (11) in the trigger direction (z) can be braked.In the process, the penetrator (5) is inserted into the battery cell (20) in the trigger direction (z) by means of the linear actuator unit (17).

This invention provides a machine learning-based method and device for anomaly detection in DDR wafer testing. It acquires timing eye diagrams and timing waveform data related to total jitter, deterministic jitter, and random jitter synchronously during DDR wafer testing. The method performs clock edge phase segmentation alignment on the differential timing sampling points in the timing waveform data to construct dense sampling data in the phase domain. Combined with DDR jitter physical priors, adaptive sparse coding is performed to remove noise and components related to normal process fluctuations, obtaining defect-sensitive sparse components. Variational mode decomposition is then performed to obtain components related to process drift, normal process fluctuations, and abrupt anomalies. The components related to abrupt anomalies are extracted as target detection data, input into a preset machine learning model, and anomaly pattern association results are generated. Based on these, DDR wafer testing anomaly detection results are output, and corresponding test setting adjustment instructions are generated. This invention can improve the overall efficiency and reliability of DDR wafer testing results.

The invention relates to a system and method for testing a device. Furthermore, the invention relates to a corresponding computer readable medium. In particular, the invention discloses a system for testing a device, the system comprising: a DUT interface (10) comprising a plurality of DUT ports (1,..., 8); an allocation matrix unit (20) having an input side configured to be connected to a plurality of DUT ports (1,..., 8) and an output side configured to be connected to one or more measurement units (M1, M2); and a test processor (30). The test processor (30) is configured to: receive test setting data; controlling the distribution matrix unit (20) such that at least one of the plurality of DUT ports (1,..., 8) is connected to at least one of the measurement units (M1, M2) according to the test setting data; and controlling one or more of the measurement units (M1, M2) to perform a corresponding measurement.

The present invention relates to the technical field of testing and / or approving fire protection concepts for the storage and / or safekeeping of accumulators. In particular, the present invention relates to a method and a test setup for testing and / or approving fire protection concepts for the storage and / or safekeeping of accumulators, especially for verifying the effectiveness and / or reliability of a fire protection system in the preferably cross-type storage and / or safekeeping of accumulators.

The utility model discloses a withhold type upright lockrand plate support anti-drawing test device which comprises a clamping piece, connecting pieces matched with the clamping piece are arranged on the two sides of the clamping piece, and a pull rod matched with a piece to be tested is detachably arranged on the lower portion between the connecting pieces. According to the anti-drawing test device for the buckling-pressing type upright lockrand plate support, the strength of the buckling-pressing type upright lockrand plate support can be tested, the clamping piece, the connecting piece and the pull rod are used in a matched mode, installation is convenient and fast, the test effect is matched with engineering practice, and the actual drawing bearing capacity of the support can be truly reflected. Meanwhile, different connecting pieces and pull rods can be selected according to the size of the test piece, so that the test of the buckling-pressing type upright lockrand plate supports with different sizes is realized; in addition, due to the existence of the clamping piece, the whole set of testing device can be used on testing machines with different tonnages, a hydraulic chuck of the testing machine does not need to be replaced, testing can be rapidly carried out, operation is easy, and use is convenient.

A low voltage differential serial (LVDS) communication system includes a system-on-chip (SoC) which includes a transmitter configured to serially transmit data, a receiver configured to serially receive data, a loopback control circuit configured to provide transmitted test data from the transmitter directly to the receiver during testing, and a built-in self-test (BIST) circuit. The BIST circuit controls testing by setting a voltage level of a common mode voltage for the transmitter, providing a test data pattern for transmission by the transmitter and receiving the test data pattern from the receiver in which the loopback control circuit directly provides the transmitted test data pattern from the transmitter to the receiver when an internal loopback configuration is enabled, and determining whether the voltage level of the common mode voltage results in a pass or fail.

The present invention relates to radio interference test systems and a radio interference test method for live recording and replaying RF inferences from the air. The present disclosure provides an easily deployable RF interference test setup for testing interference robustness or problematic interferers in particular in the approach to an airport or an airport runway. The present invention is based on the idea to employ specific non-commercial aerial vehicles, such as drones or aerial test vehicles, which are equipment with a suitable test equipment in order to be able to follow an approach path or flight path of a commercial plane for testing purposes.