408results about "Marginal checking" patented technology

Systems, methods and program codes are provided for testing multi-core processor chip structures. Individual processor core power supply voltages are provided through controlling individual power supplies for each core, in one aspect to ensure that one or more cores operate at clock rates in compliance with one or more performance specifications. In one example, a first power supply voltage supplied to a first processing core differs from a second core power supply voltage supplied to a second processing core, both cores operating in compliance with a reference clock rate specification. Core power supply voltages may be selected from ordered discrete supply voltages derived by progressively raising or lowering a first supply voltage, optionally wherein the selected supply voltage also enables the core to operate within another performance specification.

A preferred integrated circuit (IC) includes a first pad electrically communicating with at least a portion of the IC. The first pad includes a first driver and a first receiver, with the first driver being configured to provide a first pad output signal to a component external to the IC, and the first receiver being configured to receive a first pad input signal from a component external to the IC. The first receiver also is configured to provide, to a component internal to the IC, a first receiver digital output signal in response to the first pad input signal. A first test circuit also is provided that is internal to the IC. The first test circuit is adapted to provide information corresponding to the driver clock-to-q time of the first pad. Systems, methods and computer-readable media also are provided.

An electronic device that includes a part prone to aged deterioration includes an environmental load applying unit that applies a higher environmental load on the part than an environmental load in a normal operation, an error detecting unit that detects an error in the part with the higher environmental load applied, and a failure predicting unit that predicts a failure of the part based on the error detected.

The problem is to branch back to an appropriate location within a memory tester test program, and also restore its state of algorithmic control, when an error associated therewith occurs later in time at the DUT. Owing to delays in pipelines connecting the program execution environment to the DUT and back again. These delays allow the program to arbitrarily advance beyond where the stimulus was given. The arbitrary advance makes it difficult to determine the exact circumstances that were associated with the error. A branch based on the error signal can restart a section of the test program, but it is likely only a template needing further test algorithm control information that varies dynamically as the test program executes. The solution is to equip the memory tester with History FIFO's whose depths are adjusted to account for the sum of the delays of the pipelines, relative to the location of that History FIFO. When the error flag is generated the desired program location and state information is present at the bottom of an appropriate History FIFO.

A method, system, and computer program for predicting the failure of an electronic circuit. One embodiment of the invention monitors the current utilization, environment conditions, and operating conditions of the electronic circuit. A system manager is altered if the current utilization of the electronic circuit is outside a pass range at the measured environmental conditions and the measured operating conditions of the electronic circuit. The invention may also be configured such that if the electronic circuit fails, the electronic circuit is isolated from among a plurality of potentially failed electronic circuits using the measured current utilization, environment conditions, and operating conditions of the electronic circuit.

The soft error rate (SER) detector circuit presented here can be used to measure SER in combinatorial logic devices caused by radiation. The SER detector circuit includes a plurality of detector arrays coupled in series, and each having a plurality of SER test structures coupled in series. Each of the SER test structures includes a plurality of detector elements coupled in series. Each of the SER test structures is configured to detect single event transients (SETs) in a first operating mode and single event upsets (SEUs) in a second operating mode. The SER detector circuit also has control logic elements to control operation of the plurality of detector arrays.