The invention relates to a built-in self-test
system and method for an MTP memory, belongs to the technical field of
chip testing, and solves the problems that the existing built-in self-test function is single and cannot be applied to different memory areas at the same time. The
address generator is used for generating an address
signal; the mode generator is used for obtaining a test operation
signal according to the area selection
signal, the
mode selection signal and the
test sequence selection signal, starting the mode state
machine and entering a corresponding test state; the
signal generator is used for starting the signal state
machine and entering a corresponding signal state according to the test state signal and the preset time of the
time sequence counter; the MTP memory is used for starting testing according to the address signals, the test operation signal and the signal state, acquiring
test data of each address signal and returning the
test data to the
comparator; and the
comparator is used for comparing the
test data of each address signal with the received address signal and the test operation signal, and feeding back a comparison result to the mode generator. And various and flexible built-in self-testing is realized.