This invention discloses an addressable test circuit and test method with multiple addressing
modes, wherein: the addressing circuit connects to and controls the switching circuit, and the switching circuit connects to each unit under test in the DUT array; the addressing circuit includes an address input terminal, a decoding output terminal, and an enable control terminal, and the enable control terminal receives a prefix enable
signal; the addressing circuit is configured to switch between the following two
modes according to the state of the prefix enable
signal: Prefix gating mode: when the prefix enable
signal is at a first
logic level, the decoding output terminal simultaneously generates gating signals for multiple units under test to select all units under test whose addresses are less than or equal to the input address; Precise
addressing mode: when the prefix enable signal is at a second
logic level, the decoding output terminal outputs only a single gating signal corresponding to the input address to select the corresponding unit under test.