498 results about "Monitoring tool" patented technology

A system for wirelessly providing data regarding surgical implements such as surgical tools, trial and inserts themselves to a surgical navigation unit. Each implement includes an RFID in which data regarding the implement are stored. The tool used to fit the implement has a first coil positioned to exchange signals with a complementary coil integral with the RFID. The tool also has a prism for receiving a navigation tracker. A second tool coil, in the prism, is connected to the first coil. The second tool coil is also connected to an RFID integral with the tool. The tracker, through the tool coils, reads the data in the implement RFID and the tool RFID. A transmitter in the tracker wirelessly forwards the data to the surgical navigation system. The data are used to facilitate reactive workflow guidance of the procedure and monitor the position of the implement.

A distributed computing environment and associated method for monitoring a queue-based messaging system. The queue-based messaging system controls the exchange of messages between a server process and client process applications. A messaging application residing at the server computer platform and forming part of the queue-based messaging system manages a plurality of trigger-initiated local queues, each associated with one of the plurality of client process applications and having queue depth, trigger enable, get enable and put enable attributes. A monitoring tool residing on the server computer platform acquires a value for the queue depth, trigger enable, put enable and get enable attributes for a plurality of trigger-initiated local queues and generally simultaneously displays, on a user interface coupled to the server computer platform, the value for the queue depth, trigger enable, put enable and get enable attributes for each one of the plurality of trigger-initiated local queues.

A method and system for monitoring tool performance for processing tools in a semiconductor processing system. The semiconductor processing system includes a number of processing tools, a number of processing modules, a number of sensors, and an alarm management system. A tool health control strategy is executed in which tool health data for the processing tool is collected. A tool health analysis strategy is executed in which the tool health data is analyzed. An intervention manager can pause the processing tool when an alarm has occurred. The intervention manager refrains from pausing the processing tool when an alarm has not occurred.

Methods and systems for reporting performance data for application programming interfaces (APIs) are provided. A method includes receiving a subscription request from a subscriber for a particular API of a plurality of APIs, and monitoring performance of the particular API for a predetermined event that includes a change in at least one of performance status for the particular API and one or more various measurements of performance of the particular API. The method further includes comparing the predetermined event to a table or database of information that includes notification and alert rules for the particular API that specify notification policies for various predetermined events, and when the predetermined event matches at least one of the notification and alert rules, sending, by the computer system, a notification or alert to the subscriber based on the notification policy for the at least one of the notification and alert rules.

A system for treating a blood sample (700) having an analyte of interest comprises a strip (200) having a membrane (218), respective portions (216, 220 and 222, or 300) which are provided for receiving the sample, for lysing cells of the sample to liberate hemoglobin, and for capturing glycated hemoglobin. The latter two portions (220 and 222, or 300) of the membrane are treated with lysing and capture agents, respectively. A portion of the strip (214 or 230 or 240) is provided for holding an eluting agent and for releasing the agent upon a release condition. A system for detecting analyte comprises an optical subsystem (550) that is aligned with the strip to provide a signal corresponding to an amount of analyte, and an electronic subsystem (650) for processing the signal (560) to provide a result, such as an amount or percentage of glycated hemoglobin. To use these systems, the user simply applies a small sample (700) to the membrane (218) and closes a door (10) of the detection system over the strip (200) such that the door triggers the release of the eluting agent. No sample pre-treatment is required. The preferably handheld system (100) is a simple and convenient monitoring tool for the user, such as a diabetic patient who must monitor blood glucose on an on-going basis. While the systems are useful in the monitoring of blood glucose, they may be used for treating a sample other than blood and detecting an analyte other than an analyte in blood.

A system and methods of diagnosing and monitoring neurological disorders in a patient utilizing an artificial intelligence based system. The system may comprise a plurality of sensors, a collection of trained machine learning based diagnostic and monitoring tools, and an output device. The plurality of sensors may collect data relevant to neurological disorders. The trained diagnostic tool will learn to use the sensor data to assign risk assessments for various neurological disorders. The trained monitoring tool will track the development of a disorder over time and may be used to recommend or modify the administration of relevant treatments. The goal of the system is to render an accurate evaluation of the presence and severity of neurological disorders in a patient without requiring input from an expertly trained neurologist.

A method for monitoring health of a tool includes receiving at least one tool parameter related to the processing of a workpiece in a tool; receiving a model selection trigger; selecting a tool health model based on the model selection trigger; generating at least one predicted tool parameter based on the selected tool health model; and generating a tool health rating for the tool based on a comparison between the measured tool parameter and the predicted tool parameter. A tool health monitor includes a library of tool health models, a model selector, and a fault detection and classification unit. The model selector is adapted to receive a model selection trigger and select a tool health model based on the model selection trigger. The fault detection and classification unit is adapted to receive at least one tool parameter related to the processing of a workpiece in a tool, generate at least one predicted tool parameter based on the selected tool health model, and generate a tool health rating for the tool based on a comparison between the received tool parameter and the predicted tool parameter.

A method and system of ranking information according to the likelihood of its being seen as result of a keyword search on any given issue.

A sensor head apparatus is configured to include a plurality of sensor ports each configured to receive and electrically interconnect with a sensor head component. The sensor head is further configured to be connectable to a housing for a multi-parameter monitoring tool assembly, wherein electrical connections are provided between the electronics for the tool assembly and any sensor head component engaged in the sensor head. Each port in the sensor head is configured to receive and engage a sensor head component through application of a linear force on the component.

Disclosed is an internet traffic monitoring method. In the method, a first packet, sent from a user client, having a web content request meeting certain monitoring selection criteria is detected. Upon detection of the first packet, a second packet is forwarded to the user client. The second packet has a redirection with a fabricated web content request to a monitoring web page including at least one monitoring implement.

A method of fault identification on a semiconductor manufacturing tool includes monitoring tool sensor output, establishing a fingerprint of tool states based on the plurality of sensors outputs, capturing sensor data indicative of fault conditions, building a library of such fault fingerprints, comparing present tool fingerprint with fault fingerprints to identify a fault condition and estimating the effect of such a fault condition on process output. The fault library is constructed by inducing faults in a systematic way or by adding fingerprints of known faults after they occur.

A sensor head component is configured for use with a monitoring tool assembly in the performance of one or functions as part of a monitoring process. The sensor head component is configured to include at least one electrical component for performing the function as well as a memory device upon which operational information for the component is storable. The sensor head component is further configured to include an elongated body within which the electrical component is positionable and a base portion connectable to the elongated housing which further provides for mechanical and electrical engagement in a port for the tool assembly through application of a linear force.

A system for debugging a processor includes logic circuits for communicating commands and data between a serial input/output port, a trace logic, and the processor. Some embodiments of the debugging system also include a parallel input/output port so that the logic circuits also communicate commands and data between the parallel input/output port, the trace logic, and the processor. The debug system includes a plurality of state machines that read the commands and data from the serial input/output ports. The commands are decoded by a decode logic. Some of the commands, such as commands for reading data from memory, utilize processor intervention and are transferred to the processor for execution. The state machines operate only on a single command at one time so that an active state machine does not accept additional commands until completion of the command that is currently executed. Once execution of the command is complete, the state machines generate an indication of the completion event or condition, typically by setting a flag in a debug register or by asserting a readable output pin. The completion event or condition is accessed by a debug tool such as a host processor, a monitoring tool, or the like.

A system and tool for monitoring ground-engaging products for earth working equipment that can monitor characteristics such as part identification, presence, condition, usage, and/or performance of the products on earth working equipment used, for example, in mining, construction, and dredging environments. The monitoring tool includes or is supported by a mobile device that is separate from the earth working equipment. Supporting the monitoring tool on a mobile device can, e.g., provide unique vantage points to monitor the earth working equipment products, monitor the products without inhibiting the operation of the earth working equipment or endangering personnel, closely approach areas of interest for secure and reliable gathering of information, monitor multiple earth working equipment, and/or be protected from the vibrations and impact shocks that can be associated with earth working equipment.

A change management system for and method of change management control, monitoring, and analysis is disclosed. A change management system comprises a means for generating configuration item change information, and a means for processing configuration item change information for logical system groups according to an information structure. The information structure for the logical groups is comprised at least one of change rule information for the configuration items, interrelationship information between the configuration items and the system components, interrelationship information between system components. The method can be used as a monitoring tool for determining the effect of configuration changes. The configuration item change information is analyzed according to an information structure which comprises at least one of information structure that defines one or more configuration item change rules, interrelationship information between the at least one configuration item and one or more system components, and interrelationship information between one or more system components.

A tool usage monitoring system and method is provided. The system comprises a sensing element for detecting when a tool is in use and producing a signal representative of tool usage. A processor-based device that is communicatively coupled to the sensing element is also provided. The processor-based device is programmed to maintain a running total of tool usage based on the signal representative of tool usage. The processor-based device also is operable to store a defined tool usage total corresponding to the tool. The system further comprises a user interface coupled to the processor-based device. The processor-based device is programmed to send a signal to the user interface when the running total of tool usage either equals or exceeds the defined tool usage total. The system is also capable of monitoring usage of a plurality of tools.

For the contact opening in advanced IC processing, it becomes critical to monitor the degree of overetching of the thin silicide layer and also to obtain the etching rate of the silicide layer. A method is disclosed which will allow the electrical measurements of the sheet resistance of the exposed (by the contact etch) silicide layer, thus allowing electrical measurements to the integrity as well as the thickness of the remaining silicide layer. A main feature of the disclosed test method is a modification of the conventional van der Pauw test structure, or of the cross-bridge structure (which will allow electrical measurement of the line width, in addition to the sheet resistance information). Contrary to the conventional van der Pauw structure or cross-bridge structure where the contact opening pattern is designed to expose only the specific areas needed for allowing electrical connection to the four measurement pads, the contact opening mask is designed to expose some or all of the van der Pauw or cross-bridge structure, thus allowing the electrical measurement of the degree of silicide overetching during contact opening. The disclosed test method and corresponding structure can be applied as an on-wafer process monitor tool following the complete normal process flow, thus serving as a convenient on-wafer monitor.