The invention discloses a method for testing all performance parameters of an EMCCD chip based on Labview. A test system of the method is composed of an integrating sphere light source with continuously adjustable light intensity, a low-light illuminometer, a grating monochromator, a camera obscura, an electronic control box and an NI professional industrial personal computer. Based on a Labview platform, control of each component of the test system, test environment information recording and performance parameter algorithm calculation are combined together. 15 parameters including blind pixelrate, charge-voltage conversion factor, charge transfer efficiency, quantum efficiency, spectral response rate, detection sensitivity, dynamic range, readout noise, full well charge, dark signal, dark signal non-uniformity, photon response non-uniformity, gain multiple, noise factor and multiplication equivalent readout noise are tested; not only can the test performance of the EMCCD chip be completely evaluated, but also the test time is greatly shortened, and the requirements of test personnel on the basic knowledge of the EMCCD are reduced; the test result is accurate and reliable, the test process is convenient and fast, and the tester burden is small.