A method and device for testing D/A conversion function of D/A conversion chip

A digital-to-analog conversion and chip technology, applied in the direction of analog/digital conversion calibration/testing, etc., can solve the problems of inability to apply batch single-board functional testing and low efficiency, and achieve the effects of easy implementation, avoidance of manual intervention, and simple installation

Inactive Publication Date: 2008-03-19
ZTE CORP
View PDF0 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

But this method requires manual intervention, the efficiency is very low, and it cannot be applied to the functional test of batch single boards

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method and device for testing D/A conversion function of D/A conversion chip

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0029] The test of the digital-to-analog conversion function of the D / A chip is mainly to test whether the voltage of the analog output terminal of the D / A chip changes with the numerical value of the digital input terminal of the D / A chip. When the value of the digital input terminal becomes smaller, the voltage output of the analog output terminal should be smaller; when the value of the digital input terminal becomes larger, the voltage output of the analog output terminal should also increase accordingly. Therefore, the design idea of ​​the device in the specific embodiment of the present invention is: use the voltage comparator to compare the analog output voltage of the D / A chip with a reference voltage, change the digital input value of the digital input terminal of the D / A chip, and then read Take the comparison result of the voltage ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for testing the digital-analog conversion function of a digital-analog conversion chip and a device thereof. The method comprises firstly controlling the input at the digital input terminal of a digital-analog conversion chip to acquire the analog output voltage of the digital-analog conversion chip; then comparing the analog output voltage with reference voltage, and outputting voltage comparison result; and finally judging whether the digital-analog conversion function of the digital-analog conversion chip is at normal state based on the voltage comparison result. The invention can prevent manual intervention, and can rapidly and automatically carry out the digital-analog conversion function test of digital-analog conversion chip. The invention has the advantages of simple device and easiness to carry out.

Description

technical field [0001] The invention relates to the field of industrial control and communication, in particular to a method and device for testing the digital-to-analog conversion function of a digital-to-analog conversion chip. Background technique [0002] A digital-to-analog conversion chip (hereinafter referred to as a D / A chip) is an integrated chip that converts digital signals into analog voltage signals. It is widely used in the field of industrial control, and is also widely used in the field of communication electronics, such as the voltage input of the voltage-controlled crystal oscillator control voltage terminal, the analog IF signal conversion of the digital baseband IF signal in the wireless communication base station, etc. [0003] The test of the D / A chip can be divided into two aspects, one is the test of the digital input interface, and the other is the functional test of the analog output interface (that is, the test of the digital-to-analog conversion f...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10
Inventor 孟治
Owner ZTE CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap