Method for testing failure of airplane antiskid brake control box under condition of temperature cycle

A technology of anti-skid brakes and temperature cycling, applied in electrical testing/monitoring, etc., can solve the problems of incomplete screening of defects, unsatisfactory excitation, and incomplete screening of faults, etc.

Inactive Publication Date: 2014-09-17
XIAN AVIATION BRAKE TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although this method has an obvious effect on screening defects such as welding of electronic products, some solder joints still break during use, or other failures occur, and the screening of defects is not thorough;
[0009] 2) According to the rapid temperature cycle method in GMW8287 "Highly Accelerated Life/Highly Accelerated Stress Screening and Sampling Inspection" written by General Motors Corporation of the United States, the heating and cooling rate is ...

Method used

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  • Method for testing failure of airplane antiskid brake control box under condition of temperature cycle
  • Method for testing failure of airplane antiskid brake control box under condition of temperature cycle
  • Method for testing failure of airplane antiskid brake control box under condition of temperature cycle

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0086] This embodiment is a performance test of an anti-skid brake control box of a transporter under temperature cycle conditions.

[0087] Implementation steps:

[0088] Step 1. Determine the high temperature value of the antiskid brake control box temperature cycle

[0089] The high-temperature working limit of the anti-skid brake control box was tested by using the method of applying high-temperature step stress to the anti-skid brake control box disclosed in the invention of Patent No. 201110310885.1. The antiskid brake control box described in this embodiment is improved to achieve a high temperature working limit of 100°C;

[0090] Determine the high temperature value of the temperature change in the reliability strengthening test chamber. The high temperature value of the temperature cycle is 5°C lower than the high temperature working limit. The high temperature value in this embodiment is 95°C, and 95°C is used as the high temperature value for formulating the tempe...

Embodiment 2

[0128] Both embodiment 2 and embodiment 3 include determining the high temperature value of the antiskid brake control box temperature cycle, determining the low temperature value of the antiskid brake control box temperature cycle, determining the rising rate and falling rate of the temperature in the test chamber, and determining the output of the antiskid brake control box. working current, determine the output duration of the working current of the anti-skid brake control box, determine the duration after the anti-skid brake control box reaches the highest temperature and the lowest temperature, determine the number of temperature cycles, and carry out the test steps according to the requirements of the temperature cycle test. The specific process is the same as The process of Example 1 is the same.

[0129] The difference between Example 1 and Example 2 and Example 3 lies in that the test data in Example 2 and Example 3 are different from the test data in Example 1, as sho...

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Abstract

The invention provides a method for testing failure of an airplane antiskid brake control box under the condition of temperature cycle. According to the method, the antiskid brake working current is applied in the temperature cycle test process of the airplane antiskid brake control box. The high temperature value in the temperature cycle process is determined according to the high temperature working limit of the antiskid brake control box, the low temperature value in the temperature cycle process is determined according to the low temperature working limit of the antiskid brake control box, and the determined temperature cycle profile is suitable for testing the manufacturing defect that the antiskid brake control box is sensitive to steady change and can stimulate hidden dangers of the antiskid brake control box in the working state so as to effectively verify whether the development defect of the antiskid brake control box exists or not and provides the improvement suggestions according to the test result.

Description

technical field [0001] The invention relates to the field of electrical products of an aircraft landing gear control system, in particular to a method for testing the failure of an aircraft anti-skid brake control box during a temperature cycle. Background technique [0002] The method of initiating failure of electronic products under temperature cycling conditions is an experimental technique in the development process. [0003] The anti-skid brake control box is an electronic product in the aircraft landing gear control system. It is designed to control the brake function of the take-off line, the anti-skid function during the landing brake process, the grounding protection function during landing, and the wheel of the left and right landing gear wheels during the landing process. There are multiple functions such as space protection, and any function that does not meet the design requirements is a failure. When the components in the anti-skid brake control box break dow...

Claims

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Application Information

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IPC IPC(8): G05B23/02
Inventor 乔建军陈永强刘刚周世民彭娟张宏艳
Owner XIAN AVIATION BRAKE TECH
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