15 results about "Optimal test" patented technology

The present application relates to the technical field of intelligent operation and maintenance, in particular to a rail transit low-voltage device adaptive testing and predictive diagnosis method and system. By applying electrical excitation and mechanical vibration stress to the device to be tested and collecting multi-dimensional time series data, then using a waveform analysis model to extract deep features to identify early faults, using a sequence prediction model to analyze the performance degradation trend, and based on this, dynamically generating an adaptive optimal test path through a reinforcement learning model. Finally, with the help of a domain knowledge graph, correlation reasoning is performed to generate a comprehensive diagnostic report containing fault root causes and maintenance recommendations. The present application deeply integrates artificial intelligence into the testing process, realizes the transition from passive measurement to active cognition, significantly improves the depth, efficiency and intelligence level of testing, and provides forward-looking and accurate protection for the reliability of rail transit low-voltage devices.

This disclosure provides a method and system for large-scale model-assisted logic function simulation and verification for hardware design, relating to the fields of artificial intelligence and hardware design technology. The method includes: performing logical perception analysis on hardware design specifications to generate a structured design analysis report; based on the design analysis report and design specifications, using a generator agent to initially generate a testbench, obtaining an initial test platform and a reference design under test set; simulating the initial test platform and the reference design under test set, and verifying the initial test platform using a consensus verification mechanism based on confidence levels; iteratively refining the test platform using a corrector agent based on a structured reflection report to obtain the final optimal test platform; and automatically generating a retrieval knowledge base precisely aligned with hardware semantics using a reflexive domain knowledge mining method, achieving fully automated construction of the hardware domain knowledge base. This disclosure achieves fully automated system-level hardware design testbench generation and verification.

This application discloses a linear actuator test bench, relating to the field of linear actuator testing technology. It includes a test bench body, a loading device fixed to its upper end, a test rod mounted on one side of the loading device, a weight rack fixed to the side of the loading device away from the test rod, an indicating device fixed to the upper end of the test bench body, an actuator body mounted on the upper end of the test bench body, a power supply chassis mounted on the side of the test bench body, a control platform fixed to the upper end of the power supply chassis, and an installation structure for quick assembly and disassembly of the actuator body on the upper end of the test bench. This installation structure enables rapid assembly and disassembly of the actuator body, greatly shortening clamping time, and significantly improving overall testing efficiency, especially in batch testing scenarios. Simultaneously, the automatic centering calibration function ensures that the actuator is in the optimal testing position during each test, effectively improving the accuracy and repeatability of the test results.

The present application relates to the technical field of semiconductor testing, and in particular to a wafer high-temperature test probe card trajectory dynamic optimization method and device. The method collects temperature distribution and displacement data of the probe card and wafer in real time through a multi-source perception module; a trajectory planning and control unit dynamically plans an optimal test trajectory of the probe card based on the data, with maintaining temperature uniformity as the primary goal; an execution and feedback module drives the probe card to move according to the planned trajectory and perform testing, while feeding back the actual motion state to the planning unit to form a closed-loop control, so as to compensate for deviations caused by thermal deformation in real time. The corresponding device includes the above functional modules. The present application overcomes the defects of the existing fixed trajectory test method in a high-temperature environment, i.e. temperature non-uniformity, test quality decline, and wafer and probe card damage caused by the probe card moving away from the heat source. Through intelligent dynamic optimization of the trajectory, the test accuracy, reliability and efficiency are significantly improved.

A testing method and system for electronic devices are provided. The testing method for electronic devices includes receiving multiple first test data for multiple first test cases and multiple second test data for multiple second test cases; generating multiple first local scores based on the multiple first test data; generating multiple second local scores based on the multiple second test data; generating a global score for a common test case of the multiple first test cases and the multiple second test cases; replacing at least some of the multiple first local scores with the global score to generate multiple first test scores; replacing at least some of the multiple second local scores with the global score to generate multiple second test scores; and performing a first mutation operation based on a first optimal test case corresponding to the highest score among the multiple first test scores to generate a first pre-test set.

This application relates to the field of equipment fault prediction technology, specifically to a preventive current-increase test method and apparatus for transformers before commissioning. The method includes: collecting current, voltage, and temperature data at fixed locations of each independent circuit of the transformer at various test currents; obtaining an impedance spectrum based on the current and voltage data collected at each independent circuit at various times and historical times; determining the state assessment value of each independent circuit at each time; classifying the state assessment values ​​of all independent circuits at each time and obtaining the initial state label of each circuit within each category; determining the corrected state label of each circuit at each time; fusing the initial and corrected state labels of all circuits at each time to obtain a circuit health score for the transformer at each time; constructing a fitness function based on the circuit health score, using an optimization algorithm to obtain the optimal test current, and conducting a current-increase test on the transformer. This improves the accuracy and efficiency of the current-increase test.

This application provides a performance analysis method, apparatus, electronic device, chip, and medium, relating to the field of chip design and development. The method includes: generating at least one set of test configuration schemes based on the performance requirements of the module under test and a preset performance scenario; performing performance simulation of the module under test under the preset performance scenario in parallel based on the at least one set of test configuration schemes to trigger at least one target performance event and acquire at least one performance data point through a preset performance monitoring unit; quantifying and analyzing the at least one performance data point to obtain performance analysis results under the preset performance scenario; and updating at least one set of test configuration schemes based on the performance bottleneck when the performance analysis results show a performance bottleneck, thereby determining the optimal configuration parameters of the optimal test configuration scheme based on the updated at least one set of test configuration schemes. This improves performance tuning efficiency, reduces development cycle and labor costs, and ensures that the module under test achieves optimal resource allocation while meeting performance targets.

The application discloses a kind of testing method and device of silica gel protective film strength, belong to material mechanics testing technical field.The method first obtains sample size parameter and the equipment operating information of multi-station tensile testing machine, generates station matching coefficient by compatibility check and selects optimal test resource;Then the thickness distribution statistics is carried out to sample, and the gradually variable thickness section and potential stress concentration position are identified, and accordingly the standard clamping sequence is constructed;Then according to the load level dynamic configuration loading rate, load monitoring and overload early warning mechanism are established;Subsequently, tensile test is carried out and stress-strain tracking is carried out, and strength index value is extracted;Finally, the correlation between elastic recovery rate and thickness change area is analyzed, and batch strength grade is comprehensively evaluated.The application can adapt to the testing needs of different specifications of samples, effectively avoid the risk of improper clamping and loading out of control, and provide reliable technical support for batch quality inspection of silica gel protective film.

This application provides a graph-structured test route modeling system driven by driving behavior data, relating to the field of transportation technology. It includes a basic data acquisition module configured to acquire vehicle driving road information and target travel chains; a test route planning module configured to construct a road network based on key routes to obtain the final planned road network; a test route starting point and road feature acquisition module configured to extract features based on vehicle driving road information, the final planned road network, and the target travel chain to obtain road attribute features and valid starting points; and a test route planning module configured to perform weighted comprehensive scoring based on a set of candidate routes and output the candidate route with the highest weighted comprehensive score as the optimal test route. The candidate route set is generated based on valid starting points. This application solves the problem that existing route modeling techniques cannot select the optimal test route that closely matches actual driving conditions through the above system.

The application discloses a kind of methods and systems for testing task decision-making, belong to test field, method includes: according to the test logic topology described in environment configuration file, the test task is decomposed into multiple test lists;For each test list to be issued, the corresponding environment configuration file is parsed to obtain a set of resource requirements, and the maximum resource matching number supporting all resource requirements of the test list is calculated;An optimization decision model is constructed, which constrains the sum of the test strategy weights of the test list to be less than the preset upper limit, maximizes the sum of the product of the maximum matching resource number and the test strategy weight of the test list as the target, and solves the optimal test list set currently to be executed;According to the resource configuration information of each test list in the optimal test list set, the test case is executed, and the final test result is obtained.The method can maximize the use of test resources, and automatically make optimal task decision according to multi-strategy target.

The present application relates to the technical field of engine running-in test, and particularly relates to an automatic engine running-in test system, which comprises an engine bench, a dynamometer, a data acquisition subsystem, a test execution and regulation subsystem, a data processing and output subsystem and an abnormality diagnosis and alarm subsystem. The present application realizes full-process, unattended automatic test, improves test efficiency and consistency, shortens the test rhythm of a single engine, eliminates accidental errors caused by human operation, guarantees the high consistency and repeatability of the test process and results, creates the optimal test environment through intelligent boundary condition dynamic regulation, has high data quality and engine qualification rate, enhances the safety and reliability of the test process, prevents the engine from continuously running in an abnormal state, effectively avoids equipment damage and waste of test resources, and also realizes deep management and efficient use of test data, reduces operation difficulty and labor cost.

This invention discloses a data analysis-based method and system for testing the performance of all-solid-state batteries. This invention relates to the field of all-solid-state battery testing technology, addressing the problems of existing all-solid-state battery performance testing methods, such as the inability to dynamically optimize the testing scheme, susceptibility to anomaly interference, low efficiency, and poor data consistency. The method includes: a sample station confirmation end, which confirms the initial station and target test station of the all-solid-state battery. The target test station is a preset station. The confirmed initial station and target test station are transmitted to the test scheme selection end. This invention determines the optimal test scheme through station positioning, scheme screening, cycle calculation, historical data comparison, hierarchical anomaly elimination, and weighted scoring. Simultaneously, it intelligently schedules and assists in the test sequence, avoiding historical anomaly intervals and improving data consistency and repeatability; hierarchically eliminating invalid anomaly segments reduces invalid test time and improves equipment utilization and test throughput.

This invention discloses a communication interface testing method and system based on timing variation and closed-loop verification, including static analysis, timing variation, simulation execution, and closed-loop optimization. It automatically extracts all timing control counters by parsing the RTL code of the device under test (DUT) and calculates the longest execution cycle, avoiding the waste of resources by blindly setting millions of clock cycles. Furthermore, it designs a refined timing variation operator library for the communication interface, directly acting on the timing dimension of the test sequence, and systematically exploring the establishment or maintenance of time margin boundaries. This invention employs a two-stage verification process: first, static analysis determines the optimal test length; then, timing variation is used for in-depth exploration, solving problems such as difficulty in covering timing boundaries and wasted simulation resources. It efficiently uncovers timing defects with limited resources, significantly improving the quality and efficiency of chip communication interface verification.