Optimization design method for step stress accelerated degradation test based on Bayesian theory
An accelerated degradation test and Bayesian theory technology, applied in special data processing applications, calculations, electrical digital data processing, etc., can solve problems such as loss of optimization and far-reaching optimal solutions
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[0137] Based on Bayesian theory, the optimal design of a superluminescent diode (SLD) was carried out by step stress accelerated degradation test (SSADT), the steps are as follows:
[0138] Step 1. Determine the product performance degradation model and acceleration model, and then give the prior distribution of model parameters based on historical data.
[0139] First, the model and assumptions are given, as follows,
[0140] (1) Assumption:
[0141] A1: The degradation trend is monotonous and irreversible;
[0142] A2: The degradation failure mechanism does not change with stress;
[0143] A3: At normal stress level s 0 and k accelerated stress levels s 1 2 k Next, the performance degradation process Y l Obey the drift Brownian motion, the drift coefficient d(s l )>0, diffusion coefficient σ l >0, l=1, ..., k:
[0144] Y l (t) = σ l B(t)+d(s l )·t+y 0 (18)
[0145] A4: Diffusion coefficient σ l Does not change with force value, i.e., σ 0 = σ ...
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