The invention relates to the technical field of sample labeling, in particular to a
quantum inspired active learning type defect detection sample labeling method which can reduce the manual labeling amount and the labeling cost. Specifically, sample representativeness and uncertainty are balanced through
unified process design, firstly, a center cluster set is obtained based on Hamiltonian operator clustering, secondly, the
quantum entanglement degree is calculated, a representative sample set is screened, residual unlabeled sample sets are processed in combination with
virtual time evolution and a Schrodinger equation, and a to-be-labeled sample set is obtained through a fusion result; a budget scene does not need to be distinguished,
sample selection can be adaptively optimized, the labeling efficiency is improved, and the problem of strategy simplification is effectively solved; in addition, samples are mapped into
quantum states through self-
supervised learning, clustering precision is optimized based on Hamiltonian operators,
quantum entanglement is utilized to quantify sample association, uncertainty is captured by means of
virtual time evolution and a Schrodinger equation, the quality of labeled samples can be improved, and the problem of representation limitation of a classical framework is solved.