The invention discloses a high-speed
signal testing
system and method. Comprising a
microcontroller, a programmable power supply module, a
chip to be tested and an inter-symbol interference board, the
microcontroller respectively configures the programmable power supply module and the
chip to be tested according to the first type of configuration parameters; the programmable power supply module provides adaptive power supply for the
chip to be tested according to a
voltage parameter in the parameters; the chip to be tested combines a
voltage configuration result, a binary code pattern parameter and an
equalization parameter to generate a first high-speed sending
signal, sends the first high-speed sending
signal to the inter-symbol interference board, receives a first high-speed receiving signal fed back by the inter-symbol interference board, and transmits the two signals to the
microcontroller; the inter-symbol interference board simulates
transmission loss and inter-symbol interference of a real channel, and the microcontroller calculates
bit error rate information according to the
transmission loss and the inter-symbol interference, generates a digital eye diagram and displays the digital eye diagram on a
visual interface. Through automatic configuration, non-contact testing and real channel interference
simulation, the
bit error rate and the visual digital eye diagram are output, and accurate
verification of the basic
transmission performance of the high-speed chip is assisted.