The invention provides a method and a
system for expanding a
chip test sorting value. The method includes: generating, by a
test program, a test result containing a result sorting value; generating coding sorting information and a
control signal according to the result sorting value; and controlling interface hardware arranged between the test
machine and the probe
station by using the
control signal, switching the transmission mode of the communication
bus, and sending the coding sorting information to the probe
station through the communication
bus. The
system comprises a test
machine, a probe
station and interface hardware. The interface hardware is additionally arranged between the test
machine and the probe station, and the
test program dynamically generates the
control signal according to the size of the sorting value to switch the transmission mode of the communication
bus, so that the transmission mode of the communication bus is switched on the premise of not changing the main body hardware of the existing test
system. An original limited-width communication bus is utilized to transmit sorting values beyond its original representation range. The technical problem that the number of sorting values of an existing testing system is limited is solved, and the testing system has the advantages of being low in cost, convenient to transform and backward compatible.