261 results about "Test duration" patented technology

An automated system and method for passive testing of alcohol and drug abuse. The system enters a participant or subject into the system who is to be monitored during a probationary or other program for alcohol or drug abuse offenders. The system provides a drug testing home device or a drug testing kiosk device for use by the participant. The system enrolls the biometrics information of the participant into the computer system (e.g., finger print, voice, image, volatile compound organic gas level, and pH level). When the participant is to be tested in accordance with a testing schedule, the system validates these same biometrics of the participant, conducts the test, and then analyzes the test information for determining if the participant has been using alcohol or other drugs and should be subjected to a confirming urinalysis exam.

A method and system are provided for accelerated detection of soft error rates (SER) in integrated circuits (IC's) due to transient particle emission. An integrated circuit is packaged for accelerated transient particle emission by doping the underfill thereof with a transient-particle-emitting material having a predetermined emission rate. The emission rate is substantially constant over a predetermined period of time for testing. Accelerated transient-particle-emission testing is performed on the integrated circuit. Single-event upsets due to soft errors are detected, and a quantitative measurement of SER is determined.

A mixed signal integrated circuit includes a signal source to inject a test signal into the signal path of the mixed signal integrated circuit, a feedback loop and a signal comparator for determining characteristics of a resulting signal. Conveniently, the test signal may be a digital signal injected upstream of a digital to analog converter (DAC). By connecting the output to the input, the entirety of the signal path and the majority of the integrated circuit may be tested. The signal may be condition or manipulated in the feedback loop. By incorporating test signal generation and measurement into the mixed signal integrated circuit, the cost of test equipment and the test duration for each device under test may be reduced.

The invention provides a method and device for testing a client side based on a browser. The method comprises the steps of acquiring client side simulated data corresponding to a client side testing request when the client side testing request is detected; generating a client side testing result according to the client side simulated data, wherein the client side simulated data are used for simulating the data processing process of the client side; displaying the client side testing result so that the client side simulated data can be output through a display interface. According to the method and device, by means of the fact that browser developing difficulty and duration are far lower than application client side developing difficulty and duration, application client side functional procedure testing is achieved by testing the browser, the functions and interfaces relevant to the browser can be tested by calling a communication interface of the application client side under the condition that the functions and interfaces relevant to the browser are developed successfully and the application client side is not developed yet, testing duration is reduced, and testing cost is reduced.

The invention discloses a method, a client, a server and a system used for testing web site performance. The method comprises the steps of receiving test demand information, sending a plurality of web page testing requests to the server, and receiving web site testing results responding to the plurality of web page testing requests, wherein the test demand information comprises the plurality of web page test requests. By sending and processing the plurality of web page testing requests in a mass mode, the problem that in the prior art testing time is long due to the fact that manual operation is needed is solved, testing time is reduced and operation is simplified.

The invention discloses a method for automatically monitoring the BMC working state based on an ipmitool. The method specifically comprises the following steps: firstly, inputting a BMCIP address through an operator; setting a shell script; automatically installing an ipmitool; when the ipmitool can ping the BMCIP address, entering a next step; when the ipmitool cannot ping the BMCIP address, ending the whole detection process; acquiring the real time; reading an expected sensor value according to an ipmitool order, printing the sensor value on a screen for display, and meanwhile reoutputting the result to a log text in an orientation manner; returning to the step III till the monitoring is completed. Compared with the prior art, the method for automatically monitoring the BMC working state based on the ipmitool is convenient for using the script and simple to operate, the testing time can be set according to requirements without artificial interaction; the method is used for improving the testing efficiency and the testing accuracy in relevant testing of BMC study and development periods and is high in practicability, wide in application range and easy to popularize, the labor and the time are saved, and the working efficiency is improved.

The invention discloses a payment app test method and device thereof. The method comprises the steps of receiving the test environment information corresponding to the payment channel of the payment app to be tested, receiving the test command; conducting the use cases of the payment test corresponding to the payment channel to be tested, emulating an app user to use the account information to run through all the operable steps of the payment app to be tested; check if the current payment results coincides with the benchmark results corresponding to the use cases, determining if malfunction exists in the payment app to be tested. The present technical scheme can automatically test if the payment channel to be tested has malfunction or not, thereby saving the testers from the manual test of the payment channel and reducing the cost of human resources. At the same time the automatic test mechanism can shorten the test duration effectively and enhance the test correctness and efficiency.

In an approach to reducing regression test duration, one or more computer processors receive a first code change. The one or more computer processors retrieve one or more historic code changes relevant to the first code change. The one or more computer processors determine whether one or more failed test cases are relevant to the one or more historic code changes, where the one or more relevant failed test cases and the one or more historic code changes are stored in a table of test history. In response to determining the one or more historic code changes are relevant to one or more failed test cases, the one or more computer processors retrieve the one or more relevant failed test cases from the table of test history.

A laboratory test for general tire durability can produce results comparable to the GM-ATE road test. A passenger tire is mounted in a test machine and run at approximately 50 mph (80 kph), at maximum rated inflation pressure, with at least 100% maximum rated radial load, with approximately 25% of the test duration being performed with lateral force comprised of approximately equal portions of right and left steering, the remainder of the test being performed without lateral force (straight portions). A test segment comprises repeating a loading cycle a plurality of times until approximately 5000 miles have accumulated, and multiple test segments are performed until 16,000 miles have been accumulated. The test is paused and the tire is visually inspected several times during the test segments, including at the end of the test.

The invention provides a CAN bus load rate testing method, device and system. The method comprises the steps that the change rule of a signal level of a CAN bus within the testing time quantum is acquired; the duration time of a single message transmitted within the testing time quantum and the number of messages transmitted within the testing time quantum are determined according to the change rule; the total duration time of all the messages within the testing time quantum is determined according to the number of messages and the duration time; the load rate of the CAN bus is determined according to the total duration time and the testing time quantum. By means of the technical scheme, the problems that implementation is complex and cost is high in a load rate testing scheme of the CAN bus in the related technologies are solved, and the complexity degree and cost of CAN bus load rate testing are reduced.

The invention belongs to the field of integrated circuit design, particularly relates to a method capable of carrying out self test on a chip without depending on an external device in the condition of live working and performing self repair according to a test result. The self test of the method can be applied to all structures and parts in the chip; and the self repair of the method can be applied to all structures and parts with backup units. The self-test and self-repair course based on the method comprises two stages: a first stage is test and repair stage, wherein the self test is carried out firstly, and a failure unit is replaced by a backup unit according to a test result; and a second stage is the retest stage, wherein if no error is tested, the on-wafer self-test and self-repair is finished, and otherwise an unrepairable signal is produced for external detection. The invention realizes on-wafer self repair with lower cost and replaces a failure part with the backup unit, thereby improving the yield rate and the reliability of the chip, and effectively reducing the testing time and the testing cost.

The invention discloses are aggregation link load sharing method and device. The method includes: configuring various load sharing algorithms in a network device; starting the network device to test each self-configured load sharing algorithm for a preset duration; sharing ingress port flow to member ports in an aggregation link group by the current load sharing algorithm for testing within the test duration, calculating bandwidth of the member ports in the aggregation link group after testing, and calculating and recording differences between maximum bandwidth and minimum bandwidth of the member ports; and when testing by the load sharing algorithms is complete, selecting the load sharing algorithm corresponding to the minimum difference as the finally used load sharing algorithm. By the use of the method and device, load sharing efficiency of the aggregation links is improved.

The invention discloses a reliability assessment method and device based on hybrid testing, belonging to the field of software reliability engineering. The method comprises the steps of: obtaining a defect failure rate distribution function and a density function through determining defect failure rate distribution of tested software; determining the density function of an order defect failure rate, an order defect failure rate expected value and a software failure rate expected value according to the order statistics; and hybrid-testing the tested software, and determining a distribution parameter according to a hybrid test result data. The invention overcomes the defects of more testing examples, neglecting of internal information, long testing time, large resource consumption and the like of the traditional reliability test by fully utilizing and combining the advantages of run tests and pertinence tests, thereby shortening the time of the software reliability tests, increasing thesoftware defect exposing speed and the progress of the software reliability tests, and greatly reducing the test cost and the resource consumption.

The invention relates to a fatigue testing machine which comprises a machine base, a valve sheet fixing mechanism, a punching mechanism, a punch driving mechanism and a driving mechanism regulating device, wherein the valve sheet fixing mechanism is arranged on the machine base and is used for fixing a valve sheet; the punching mechanism comprises a punch which has elasticity recovery and is used for exerting pressure on the tongue of the valve sheet by the bottom end; the number of the punch corresponds to the number of the tongue on the valve sheet which is arranged on the valve sheet fixing mechanism; the punch driving mechanism comprises a power device, a driving shaft and a driving wheel; the driving shaft is driven to rotate by the power device; the driving wheel is fixedly connected at the bottom end of the driving shaft; a plurality of cams are arranged on the bottom end of the driving wheel; and the bottom ends of the cams are lower than the top end of the punch. The fatigue testing machine disclosed by the invention has the advantages that the fatigue test on the service lives of the air suction and exhaust valve sheets of a refrigeration compressor is simple and convenient, the test duration is greatly shortened, experiment cost is reduced, and meanwhile development cycle of a new product is shortened and power consumption is reduced.

A test method for the detection of redundant tests and inefficient tests (RITs) used for testing integrated circuits (ICs) and a subsequent optimization of test complexity and test time duration. Empirical data from an execution of all tests of interest in a test plan, flow or suite of tests is collected. The empirical data is collected without stopping at errors. This empirical data is then used to determine the identity of one or more redundant and/or inefficient tests in the test plan. In order to reduce testing time and optimize the test flow, one of more of the following occurs. Redundant tests may be selectively removed, inefficient tests may be re-ordered to allow more efficient tests to be executed earlier in the test flow of the ICs, or some combination of this. RIT information is thus used to optimize the test flow, resulting in a reduction in test complexity and in test duration.

This invention relates to a method for testing RFID chips with digital signal and RF signal emit/identification circuit including that a digital signal generator of a test system generates a digital signal to generate a RF signal in conformity with the ISO standard by the RF signal emit/identification circuit, when the chip receives the said signal, it generates a return signal to be captured by the identification part of the RF signal emit/identification circuit and converted into a digital signal to be sent to the test system for judgment and comparison finally, thus reducing test cost and saving time.

The invention discloses a method for testing and calibrating an ADC chip reference voltage. A test circuit is used to provide an accurate standard reference voltage signal Vstd, and the signal is input to a comparator inside the chip IC. Vstd is compared, and the voltage comparison result is input to the calibration value generation module. The function of the calibration value generation module is to obtain the voltage calibration parameter trim_para according to the magnitude of the deviation between Vref and Vstd, and the reference voltage generation circuit outputs it according to the voltage calibration parameter trim_para Adjust the reference voltage value. The present invention does not require external test equipment with voltage measuring instruments or voltage comparator resources; during the test process, it is not necessary to write the voltage correction parameters into the IC through the test communication pin, but the internal self-calibration of the reference voltage is realized by the IC, Relatively save testing time.

A method for a vehicle, comprising: initiating an engine-off natural vacuum test based on an ambient temperature change potential over a testing duration. The ambient temperature change potential may be based on historic weather data and further based on forecast weather data. In this way, the engine-off natural vacuum test may be executed only when conditions favor an in-tank temperature change significant enough to cause a threshold change in fuel tank pressure, thus reducing the number of aborted tests and increasing the test's overall performance metrics.

Embodiments of the invention provide a method of determining a storage lifetime of a wafer in a storage environment, the storage environment corresponding to an environment having a first value of temperature and a first value of relative humidity, the wafer having a pre-test value of a first contamination parameter, including the steps of: subjecting the wafer to a test environment for a test period, the test environment includes an environment having a second value of temperature and a second value of relative humidity; subsequently, inspecting the wafer thereby to determine a post-test value of a second contamination parameter, wherein the second value of relative humidity is greater than 30% and the second value of wafer temperature is greater than 30° C.

The invention provides a testing method for interchanger transmission signal performance and a testing system, and belongs to the technical field of the interchanger test. The testing method comprises the steps: setting test duration, capture package file size, and network card corresponding relationship; configuring the IP address of network card 2 and a camera and a port 2 of the interchanger in the same network segment; configuring an in-direction flow mirror image of an interchanger port 3 to a port 1 connected with the network card 1; starting a timer, sending a command to the network card 1 and the network card 2, performing the continuous capture package by the network card 1 and the network card 2 and storing; and comparing the files one by one captured by the network card 1 and the network card 2 and recording the differences. The invention further provides the testing system for realizing the testing method. The configuration, capture package and comparison of the network cards and the interchanger are automatically completed, a tester only needs to construct the environment according to the network diagram, and open the device to test. The operation is simple, the judgment result is reliable, the test time can be freely set, and the test efficiency is improved.

The invention relates to a power supply service life detection method and a power supply service life detection system. The method comprises the steps of obtaining the effective test duration of each power supply in a high-temperature test and calculating total test time of all power supplies to be tested, wherein the high-temperature test is a test of operation of a plurality of power supplies with the same model at preset high temperature; when faulted power supplies occur during the test, obtaining the number of the faulted power supplies during the test and obtaining average fault interval time according to a ratio of the total test duration to the number of the faulted power supplies; calculating temperature acceleration coefficient, searching a confidence factor from a preset confidence factor table, and multiplying the confidence factor and the acceleration coefficient by the average fault interval time to obtain the service life of the power supplies to be tested. By adopting the scheme provided by the invention, the accuracy of determination of power supply service life is improved.