ADC chip reference voltage testing and calibration method
A technology of reference voltage and calibration method, which is applied in the field of calibration, can solve the problems of low test efficiency and limited test resources, and achieve the effects of improving test efficiency, low test resource requirements, and saving test time
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[0010] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0011] see figure 1 , in an embodiment of the present invention, a method for testing and calibrating an ADC chip reference voltage uses a test circuit to provide an accurate standard reference voltage signal Vstd, which is input to a comparator inside the chip IC, and the comparator compares the ADC voltage to be calibrated Vref and The standard reference voltage Vstd is compared, and the voltage comparison result is input to the calibration value generation ...
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