ADC chip reference voltage testing and calibration method

A technology of reference voltage and calibration method, which is applied in the field of calibration, can solve the problems of low test efficiency and limited test resources, and achieve the effects of improving test efficiency, low test resource requirements, and saving test time

Inactive Publication Date: 2016-07-27
SHENZHEN BOJUXING IND DEV
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Problems solved by technology

However, due to the limited test resources on the test equipment, considering the reasons of the first and second points...

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  • ADC chip reference voltage testing and calibration method

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Embodiment Construction

[0010] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0011] see figure 1 , in an embodiment of the present invention, a method for testing and calibrating an ADC chip reference voltage uses a test circuit to provide an accurate standard reference voltage signal Vstd, which is input to a comparator inside the chip IC, and the comparator compares the ADC voltage to be calibrated Vref and The standard reference voltage Vstd is compared, and the voltage comparison result is input to the calibration value generation ...

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Abstract

The invention discloses a method for testing and calibrating an ADC chip reference voltage. A test circuit is used to provide an accurate standard reference voltage signal Vstd, and the signal is input to a comparator inside the chip IC. Vstd is compared, and the voltage comparison result is input to the calibration value generation module. The function of the calibration value generation module is to obtain the voltage calibration parameter trim_para according to the magnitude of the deviation between Vref and Vstd, and the reference voltage generation circuit outputs it according to the voltage calibration parameter trim_para Adjust the reference voltage value. The present invention does not require external test equipment with voltage measuring instruments or voltage comparator resources; during the test process, it is not necessary to write the voltage correction parameters into the IC through the test communication pin, but the internal self-calibration of the reference voltage is realized by the IC, Relatively save testing time.

Description

technical field [0001] The invention relates to a calibration method, in particular to an ADC chip reference voltage test calibration method. Background technique [0002] In the integrated circuit (Integrated Circuit, referred to as IC) industry, IC testing costs account for a very important part of the total cost of IC production, and the proportion of testing costs in the total cost of circuits and systems continues to rise. The cost of testing is directly proportional to the time it takes to test. In IC production design, how to reduce the test cost of IC has become an important topic nowadays. Due to the deviation in chip manufacturing, there is a certain deviation between the reference voltage and the required standard voltage value in each ADC chip on the wafer. And only when the precision of the reference voltage of the ADC is high enough, the precision of the ADC can be guaranteed. Therefore, in the production test of high-precision ADC chips, the reference volta...

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Application Information

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IPC IPC(8): H03M1/10
CPCH03M1/10
Inventor 万上宏叶媲舟黎冰涂柏生
Owner SHENZHEN BOJUXING IND DEV
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