The application relates to a
starlight refraction information calculation method and device based on two-stage fine light
ray tracing. According to a global three-dimensional
atmospheric refraction index field, the method determines the
refraction index distribution of all atmospheric
layers in a
starlight refraction propagation path, divides a vector two-layer
atmosphere into multiple
layers, calculates the refraction index of each fine layer, and then calculates the
refraction angle change amount and the height change amount from the center of the earth of the
starlight passing through the fine layer of the first starlight path and the second starlight path. The obtained
refraction angle change amount is summed to obtain the total
refraction angle of the starlight passing through the
atmospheric layer. Compared with an empirical starlight
atmospheric refraction model, the method can accurately simulate the refraction path of the starlight passing through the global
atmospheric layer by using a two-stage fine light
ray tracing method, avoids the simplification error caused by the empirical starlight
atmospheric refraction model when simulating starlight refraction, and improves the accuracy of the starlight refraction angle and starlight refraction visual height and other refraction information.