128 results about "Refraction angle" patented technology

The invention discloses a glass lens surface scratch detection method and system, relates to the technical field of precision optical detection, and aims to solve the problems of scratch false detection, leak detection and poor algorithm adaptability caused by interference fringes, noise coupling and poor form adaptability in a high-reflection / complex coating process scene in the prior art. According to the scheme, an orthogonal polarization state composite light field is generated based on a multi-angle polarization light source array and a near-infrared compensation light source, and candidate regions are extracted through dynamic threshold segmentation and a direction gradient tensor matrix; gaussian pyramid multi-scale feature fusion and refraction angle consistency verification are utilized to eliminate artifact interference; constructing a direction constraint convolution kernel group to decompose scratches and background textures, and dynamically allocating computing resources in combination with a cascade network; feeding back closed-loop calibration light source wavelength and convolution kernel parameters in real time through coating parameters; according to the method, the precision and robustness of high-reflectivity surface scratch detection are remarkably improved, and meanwhile, the requirements for high-resolution image processing and real-time performance in a high-speed production line are balanced.

The invention relates to the technical field of underwater facility measurement, and provides an underwater facility defect geometric feature measurement method and system, a medium and equipment, and the method comprises the steps: calculating the actual sound velocity based on the water temperature, water pressure and salinity, correcting a sonar point cloud, calculating the sound velocity change rate, and adjusting the size of a filtering window, performing smooth filtering on the corrected sonar point cloud; for the surface image, calculating an image dark channel, after smoothing the dark channel image through scattering filtering, calculating transmissivity, fusing a scattering coefficient, removing surface image scattered light, and correcting the scattering coefficient through turbidity; based on the salinity and the water temperature, the underwater refraction angle of the laser is calculated, and the three-dimensional scanning point cloud is corrected; registering and fusing the point clouds to generate a facility surface point cloud model; based on the surface image, texture information of the facility surface is extracted, after the texture information is mapped to the facility surface point cloud model, a defect area is segmented, and geometric feature parameter extraction is carried out. And the detection reliability in a complex water area environment is improved.

The invention provides an integrated navigation method combining starlight refraction positioning with inertial navigation in a near space, and belongs to the technical field of starlight refraction navigation positioning. The method comprises the following steps: firstly, determining a state model of starlight refraction positioning in a near space by taking an error equation of an inertial navigation system of a near space aircraft as a state equation; designing a near space starlight refraction positioning algorithm, identifying a refraction star by using a star sensor on the aircraft, acquiring a refraction angle as a measurement, and establishing a measurement model of starlight refraction positioning in a near space; and obtaining the optimal estimation value of the system state variable by using an extended Kalman filter (EKF) method. The method has the advantages of being suitable for near space, high in reliability, high in autonomy and the like, and can be finally used for pure astronomical positioning and astronomical / inertial integrated navigation.

The invention provides a novel GNSS-IR elevation angle deviation correction method and system, and relates to the technical field of data processing, and the method comprises the steps: building a novel elevation angle deviation correction method taking electron density as a reference through a refraction angle relation; generating an SNR file, wherein the SNR file contains pseudo-random noise codes, azimuth angles, elevation angles and S1C observation value data of about 15000 epochs in one day; acquiring a satellite zenith distance and a position of an ionosphere puncture point by using a Krounberg model, and inputting the satellite zenith distance and the position of the ionosphere puncture point into a Nequick-G model to calculate and obtain electron density; the electron density and the satellite zenith distance are used as input parameters to be input into the novel elevation angle deviation correction method to obtain angle errors, the elevation angle is corrected, and the sea surface height is calculated according to the corrected elevation angle. The precision and reliability of sea surface height measurement are improved.

The invention relates to a near space non-uniform atmospheric refraction angle calculation method, which comprises the following steps: acquiring a deflection angle of light in the atmosphere, and obtaining a refraction angle model; determining atmospheric density change, obtaining a Boltzmann statistical model, and further obtaining a Boltzmann energy distribution model; determining molecular kinetic energy and potential energy, substituting the molecular kinetic energy and potential energy into a Boltzmann energy distribution model to obtain the atmospheric molecular number density away from the geocenter, and determining the change rule of the atmospheric molecular number density along with the altitude and the atmospheric temperature according to the atmospheric molecular number density away from the geocenter; acquiring a transmission path from the observation height to the top of the atmospheric layer, and acquiring the atmospheric temperature and atmospheric pressure at the observation height by combining the change rule of the atmospheric molecular number density along with the altitude and the atmospheric temperature; and inputting the atmospheric temperature and the atmospheric pressure at the observation height into an Elden refractive index model to obtain a refractive index value under a corresponding radiation condition, and inputting the refractive index value into a refraction angle model to obtain a refraction angle.

The invention provides a switch cabinet condensation monitoring method and device, electronic equipment and a storage medium, and relates to the technical field of power monitoring. Laser is used for scanning a condensation monitoring area at the top of a switch cabinet; wherein the laser can generate different types of optical signals according to the surface state of the condensation monitoring area, receive the optical signals, collect light intensity information of the optical signals and judge whether the condensation monitoring area is condensed or not; detecting the first receiving time of the specular reflection light, the second receiving time of the refracted light, the incident angle of the specular reflection light and the refraction angle of the refracted light, and determining the thickness of the water drop; operation and maintenance responses of different priorities are carried out according to whether the condensation monitoring area is condensed or not and the water drop thickness. Therefore, by collecting the light intensity of the reflected light and calculating the thickness of the water drops, the condensation occurrence condition in the switch cabinet is accurately reflected, the condensation monitoring accuracy is improved, and meanwhile, the device and the method are also used for comprehensive early warning and assisting efficient maintenance work.

The invention provides a method and equipment for determining uncertainty of wafer film thickness measurement. The method is applied to the technical field of high-precision measurement. The method comprises the following steps: acquiring an uncertainty component of wafer film thickness measurement by a wafer film thickness measurement device; the uncertainty component comprises a wavelength measurement uncertainty # imgabs0 #, a refractive index measurement uncertainty # imgabs1 #, a refraction angle measurement uncertainty # imgabs2 #, a voltage measurement uncertainty # imgabs3 # and an uncertainty # imgabs4 # caused by calibration coefficient deviation of a standard wafer; and determining the uncertainty of the synthesis standard by using the uncertainty # imgabs5 #, the uncertainty # imgabs6 #, the uncertainty # imgabs7 #, the uncertainty # imgabs8 # and the uncertainty # imgabs9 #. According to the invention, the accuracy of the voltage signal in the wafer film thickness measurement process is improved, and the accurate control of the polishing process end point is further realized.

Provided are a method and apparatus for adjusting a sidewall structure of a cylindrical light guide column, where the method includes: acquiring a size parameter of a light guide column; calculating, based on the law of refraction, a total internal reflection angle of the light guide column according to a light guide column refractive index and an air refractive index, and calculating, in conjunction with an incidence angle of an incident light, a refraction angle of a refracted light; acquiring a first inclination angle range of a sidewall of the light guide column according to the refraction angle and the total internal reflection angle; and adjusting the sidewall of the light guide column according to the first inclination angle range to form a first inclination surface to enable the refracted light to be totally reflected on the first inclination surface.

A vehicle assembly including a radar sensor configured to emit radar waves over a range of wavelengths with an arrangement of layers placed opposite the radar sensor, including a first subset of layers configured to perform an optical function, each layer having a refractive index and a thickness, and a second subset of layers configured to provide protection for the first set of layers, each layer having a refractive index and a thickness. The total thickness of the second subset of layers is dimensioned so that the total thickness of the arrangement of layers is equal to m times a wavelength of the range divided by twice the equivalent refractive index of the first subset of layers and of the second subset of layers, times the cosine of a refracted angle corresponding to the angle of incidence of the radar waves, where m is an integer.

The present application provides a switchgear condensation monitoring method, device, electronic device, and storage medium, relating to the field of power monitoring technology. The method utilizes a laser to scan the condensation monitoring area on the top of the switchgear. The laser generates different types of optical signals based on the surface state of the condensation monitoring area, receives the optical signals, and collects light intensity information of the optical signals to determine whether condensation is present in the condensation monitoring area. The method also detects the first reception time of mirror-reflected light and the second reception time of refracted light, as well as the incident angle of the mirror-reflected light and the refraction angle of the refracted light, and determines the thickness of water droplets. Operation and maintenance responses are then prioritized based on whether condensation is present in the condensation monitoring area and the thickness of the water droplets. Thus, by collecting the intensity of reflected light and calculating the thickness of water droplets, the condensation situation inside the switchgear can be accurately reflected, improving the accuracy of condensation monitoring while also providing comprehensive early warnings and facilitating efficient maintenance.

The present invention provides a method and device for determining the uncertainty of wafer film thickness measurement. The method is applied to the field of high-precision measurement technology. The method comprises: obtaining uncertainty components of wafer film thickness measurement by a wafer film thickness measurement device; the uncertainty components include wavelength measurement uncertainty, refractive index measurement uncertainty, refraction angle measurement uncertainty, voltage measurement uncertainty, and uncertainty caused by calibration coefficient deviation of a standard wafer; and determining a synthetic standard uncertainty using uncertainties,,,,. The present invention improves the accuracy of voltage signals in the wafer film thickness measurement process, and further realizes precise control of the polishing process endpoint.

An assembling space is formed in a body of the projection lamp, a driving assembly and a fixing base are arranged in the assembling space of the body, the driving assembly is connected with a lens assembly, a plurality of optical refraction structures which are adjacently arranged are formed on the inner wall of the lens assembly, and the fixing base can stretch into the lens assembly. A light-emitting element is arranged in the lens assembly, the light-emitting element can emit light rays and irradiate the light rays into the lens assembly, the light rays can be refracted through the optical refraction structures distributed on the inner wall of the lens assembly, and the lens assembly can be driven to rotate around the light-emitting element. Therefore, the relative angle between each optical refraction structure and the light-emitting element is continuously changed, and the refraction angle of the light is also changed, so that a plurality of strip-shaped light beams can be projected, and the light and shadow effect of infinite circulation movement can be achieved.

An apparatus for manufacturing a radial or azimuthal polarization conversion component includes a reflector having a truncated cone shape. The reflector has a top portion, a bottom portion, and a circumferential portion connected between the top portion and the bottom portion. When a light beam is incident vertically from above, a part of the light beam vertically passes through the top portion to the bottom portion, a part of the light beam enters the circumferential portion at an incident angle and forms a reflected light beam to enter the bottom portion at an incident angle, the reflected light enters the holographic recording material at a refraction angle to generate an exposure range.

The invention discloses a printing device and method adopting low-quality laser beams, and belongs to the field of 3D printing. The device comprises a concave lens set, a laser energy adjusting lens and a convex lens set which are arranged in front of a focusing lens and a galvanometer unit; the concave lens group is used for diffusing aligned laser beams, one surface of the laser energy adjusting lens is a first smooth surface, the other surface of the laser energy adjusting lens comprises a second smooth surface in the center and a third smooth surface arranged on the outer ring of the second smooth surface, and the curvature of the second smooth surface is different from that of the third smooth surface. The second smooth surface and the third smooth surface are used for dividing the laser beam into a central light beam and an auxiliary heating light beam; and the convex lens group is used for converging the central light beam and changing the refraction angle of the auxiliary heating light beam, and changing the energy ratio of the central light beam to the auxiliary heating light beam by adjusting the position of the laser energy adjusting lens. For low-quality laser, a center laser beam meeting the printing requirement can be obtained through adjustment.

The invention discloses a fish growth state monitoring method and system based on underwater image recognition, and relates to the technical field of fish growth state monitoring, and the method comprises the following steps: setting a temperature sensing region around the optical axis direction of a camera device, and carrying out the real-time collection of the temperature change of a local water body in an underwater environment, acquiring temperature gradient data corresponding to the light propagation path, and generating temperature layered mapping according to the temperature gradient data; and on the basis of temperature hierarchical mapping, constructing a refraction track sequence on the light propagation path, and adjusting the refraction angle weight according to the temperature difference of each hierarchical region to form the light propagation path. According to the invention, through combination of temperature sensing and light field compensation, continuous tracking and space geometry reconstruction of a light propagation path are realized, and the image contour is kept clear and stable. Based on the dynamic smoothing processing of a time sequence stable chain and a form balance area, the fish body form is kept uniform in time and space, false growth transition is avoided, and the stability and accuracy of a monitoring result are improved.

The invention discloses an array optical waveguide detection system and method, and the system comprises a light source which is used for transmitting a test light beam, transmitting the test light beam to a waveguide substrate, enabling the test light beam to enter an array optical waveguide through a first surface and then to be transmitted to an array spectroscope, the light is emitted to the second surface after passing through the array spectroscope; the detection assembly is used for receiving the test light beam emitted from the second surface so as to detect the parallelism of the array spectroscope; the incident angle of the test light beam emitted to the waveguide substrate is theta, theta = arcsin (n.sint), t meets: t is the refraction angle of the test light beam entering the waveguide substrate through the first surface, n is the refractive index of the waveguide substrate, and alpha is the included angle between the array spectroscope and the first surface. According to the array optical waveguide detection system, the measurement precision of the detection system can be improved.

The invention discloses an acoustic beam refraction angle adjusting device for non-parallel contact surfaces in the technical field of ultrasonic detection. The acoustic beam refraction angle adjusting device comprises a positioning and supporting structure, a rotation detection mechanism arranged on the positioning and supporting structure and a detection mechanism arranged on the rotation detection mechanism. Wherein the detection mechanism comprises a shell, a probe main body arranged in the shell, an outer frame arranged on the outer side of the probe main body, second rotating equipment arranged on the outer wall of the outer frame and third rotating equipment arranged on the outer side of the shell, and the second rotating equipment and the third rotating equipment are used for changing the incident angle of the probe main body. Therefore, the refraction angle of the acoustic beam of the probe body in the arc to-be-tested piece body is adjusted. The incident angle of the probe main body can be changed through cooperative control of the rotating equipment II and the rotating equipment III, so that the refraction angle of the acoustic beam of the probe main body in the arc to-be-detected piece is adjusted, the refraction angle of the acoustic beam in the workpiece is stable and controllable, and the adaptability and the detection precision of ultrasonic detection on the complex curved surface workpiece are improved.

The application provides a spacecraft autonomous navigation method and electronic equipment. The spacecraft autonomous navigation method comprises the following steps: determining technical indexes of an optical sensor according to navigation requirements, and determining a configuration of the optical sensor according to orbit information of the spacecraft; collecting a star map by using the optical sensor with the determined technical indexes and configuration, processing the star map, identifying a refraction star and extracting a refraction angle; and using a Kalman filtering algorithm to perform information fusion on information output by an inertial navigation system and a refraction apparent height calculated based on the refraction angle, so as to correct navigation errors and obtain corrected navigation information. The application corrects drift errors of the inertial navigation by astronomical navigation, maintains continuous navigation information by using the inertial navigation when the astronomical system is unavailable, and achieves the purpose of improving navigation accuracy.

The invention relates to the field of optical measurement, and discloses a method, system and related equipment for measuring liquid level height and liquid film thickness, and the method comprises the following steps: after a laser emitter emits at least two laser beams with different incident angles to the liquid level in a reagent bottle, obtaining the incident angle of each laser beam; based on the incident angle, determining an internal refraction angle after each laser beam irradiates the liquid film; obtaining the transverse offset of each laser beam; wherein the transverse offset is the offset between the laser emission position and the position of the preset observation point after the laser is refracted by the liquid in the reagent bottle; and calculating the height of the liquid level and the thickness of the liquid film based on each transverse offset and each internal refraction angle. Through multi-angle laser incidence and refraction change among air, the liquid film and the liquid, calculation of the liquid level height and the liquid film thickness is achieved, and the technical effects of being rapid, accurate, free of contact and capable of achieving real-time measurement are achieved.

The present invention relates to a light module (1) comprising a light source (2), a collimator (4), and a microlens array device (6), wherein the microlens array device (6) comprises a plurality of light passage ducts (14) comprising an entrance microlens (20) and an exit microlens (22), wherein each incident light ray (10) falls within an angular range of incidence (12), and each refracted light ray falls within an angular range of refraction (30), and wherein the entrance microlenses (20) are offset so as to form steps (44), wherein an angle (a) between a step (44) and a reference direction (R) lies between a first bound (36) defining the angular range of incidence (12) and a second bound (42) defining the angular range of refraction (30).

Principals of refraction of a light ray are used to identify the location of an interface between two materials having different refractive indices. The interface may be an interface between a plasma layer and a red blood cell layer of a centrifuged container, for example. An array of light detector elements are arranged to receive light that has been refracted through different layers in a centrifuged sample. Elements of the light detector array are arranged at known locations relative to an emitter of the light so detection of light by one or more particular detector elements is indicative of the angle of refraction of the light. Vertical position of the sample is tracked and correlated with corresponding angles of refraction to determine the vertical position of the sample when a change in the angle of diffraction is detected.

The invention provides a spacecraft autonomous navigation method and electronic equipment. The autonomous navigation method for the spacecraft comprises the following steps: determining a technical index of an optical sensor according to a navigation requirement, and determining a configuration of the optical sensor according to orbit information of the spacecraft; acquiring a star map by using an optical sensor with determined technical indexes and configuration, processing the star map, identifying a refraction star and extracting a refraction angle; and carrying out information fusion on the information output by the inertial navigation system and the refraction apparent height calculated based on the refraction angle by using a Kalman filtering algorithm so as to correct the navigation error and obtain the corrected navigation information. The drifting error of the inertial navigation is corrected through the astronomical navigation, and the navigation information is kept continuous through the inertial navigation when the astronomical system is unavailable, so that the purpose of improving the navigation precision is achieved.

The invention discloses a tiled display device and a display terminal. The tiled display device comprises a bearing plate, a plurality of display daughter boards and a packaging layer, each display daughter board comprises a substrate and a plurality of light-emitting units, and a splicing seam is arranged between every two adjacent display daughter boards; the packaging layer is arranged on the side, deviating from the bearing plate, of the display sub-plates, and the packaging layer continuously covers the abutted seams between the multiple display sub-plates and the multiple substrates; the absolute value of the difference between the refractive index of the packaging layer and the refractive index of the substrate is smaller than or equal to 0.1. According to the display panel, the continuous packaging layers are arranged on the two adjacent display sub-panels, and the packaging layers cover the abutted seams, so that the absolute value of the difference value between the refractive index of the packaging layers and the refractive index of the substrate is smaller than or equal to 0.1, light rays are not refracted on the critical surfaces of the packaging layers and the substrate, or the difference between the refraction angle and the incident angle is small, and the display effect is improved. Therefore, the optical performance of the light at the abutted seam is close to that at other positions, and the visual discontinuity and the lighting effect difference of an image caused by the abutted seam are improved.

This application discloses an optical detection device, comprising: a light source, a linear polarizer, a quarter-wave plate, an optical metasurface, and a light detection unit. The linear polarizer, quarter-wave plate, and metasurface are sequentially arranged along the propagation direction of the incident light. The metasurface comprises a transparent substrate layer and a dielectric nanocolumn layer. The fast axis of the quarter-wave plate has a first angle. When the first angle is a first characteristic angle, the light emitted from the quarter-wave plate is circularly polarized light. The light detection unit detects the optical power of the light emitted from the metasurface in a second angular direction, and obtains a second characteristic angle from the maximum optical power. The refraction angle is obtained from the wavelength of the incident light, the geometric parameters of the metasurface, and the refractive index of air. When the refraction angle is equal to the second characteristic angle, the first angle is the first characteristic angle. This device does not use a modulator or spectrometer, but only requires the pre-fabrication of the metasurface, which greatly reduces the device size and achieves miniaturization and integration.

The present invention discloses a method for detecting surface defects of a lens, which relates to the technical field of lens detection and solves the problem that some relatively hidden scratches and some relatively fine air bubbles cannot be identified, resulting in incomplete detection of surface defects. The present invention determines the associated reflection angle by preferentially adopting the reflection method of the irradiated line through the relevant processing for the abnormal area, and determines whether the angle comparison is consistent based on the specific comparison between the incident angle and the reflection angle. When the reflection test is normal, the refraction analysis is performed to determine whether the refraction angle generated in each area is consistent, so as to evaluate whether there are relevant cracks and defects such as air bubbles inside the lens. The evaluation and processing method is more comprehensive and accurate, and can achieve better evaluation and processing detection effect.

The invention relates to the technical field of hazardous article detection, and provides a small-size hazardous article terahertz wave band dielectric constant testing method and system, and the method comprises the steps: placing a to-be-tested material between two convex lenses, controlling a horn antenna of a spread spectrum module to emit an electromagnetic wave, and in any radiation angle, viewing the electromagnetic wave as a plane wave, acquiring an S parameter measured by the vector network analyzer, and performing conversion; obtaining the thickness of the to-be-measured material, and converting the thickness into equivalent thickness; obtaining an inversion dielectric constant through an inversion model; acquiring a radiation angle, an image distance and an object distance, converting an incident angle, and determining a conversion dielectric constant on the basis that the refraction angle and the incident angle meet the Snell law; the refraction angle enabling the difference between the inversion dielectric constant and the conversion dielectric constant to be minimum is searched, the dielectric constant under the corresponding radiation angle is obtained, the average dielectric constant is obtained through integration, and the method adapts to measurement of non-uniform samples and size-limited samples.

The utility model relates to the technical field of optical equipment, and discloses a reflection module, which comprises a fixing piece, a reflection piece, a magnet group, a coil group and an optical module, the reflecting piece is movably connected to the fixing piece, and the reflecting piece is provided with a reflecting surface; the magnet group is connected to the fixing piece; the coil group is connected to the reflecting piece and is arranged opposite to the magnet group; the optical module is connected to the fixing piece, the optical module is provided with an optical axis, and the optical axis and the reflecting surface intersect to form an included angle a; the control circuit board is connected to the fixing piece, and the control circuit board is electrically connected with the coil assembly; when the coil group is electrified, the magnet group drives the reflecting part to move through the coil group so as to change the included angle a; according to the utility model, the magnet group and the coil group can directly drive the reflection piece to move so as to adjust the light refraction angle of the optical module, the structure is simple, and the structural size is small.

The utility model provides a liquid refractive index real-time measuring device based on a displacement sensor, which is used for solving the problem that the liquid refractive index cannot be accurately measured in real time in the prior art and can capture and monitor the tiny change of the liquid refractive index in real time. A circular container is selected as a sample container, so that the measurement accuracy is improved; traditional refraction angle measurement is converted into laser beam transverse displacement measurement, and the innovative method not only improves the measurement precision, but also effectively avoids interference of ambient light; the instrument can provide more accurate refractive index data by accurately measuring the displacement change of the laser beam after penetrating through the liquid.

The utility model provides a glass cover plate structure capable of inhibiting internal reflection. The glass cover plate structure comprises a glass cover plate body, a bubble structure is arranged in the glass cover plate body, an anti-reflection coating is arranged on the surface of the side, facing an optical component, of the glass cover plate body, and the bubble structure is used for changing the light refraction angle in the glass cover plate body and even blocking a light projection line in the light refraction angle. The bubble structure is arranged on the glass cover plate, so that when the glass cover plate covers more than two optical components, mutual interference of light rays among the optical components is prevented through the bubble structure to influence mutual work, in addition, the light rays, reflected to the optical components, on the glass cover plate are reduced through the anti-reflection coating, and normal work of the optical components is further ensured.

The invention discloses a liquid refractive index real-time measurement method and a liquid refractive index real-time measurement device based on a displacement sensor, which are used for solving the problem that the liquid refractive index cannot be accurately measured in real time in the prior art and can capture and monitor the tiny change of the liquid refractive index in real time. Through high-speed data processing and analysis, the instrument can quickly respond to the change of the refractive index of the liquid and provide continuous and real-time measurement data; according to the technical scheme, the problem that in the prior art, a rectangular container is not obvious in light beam refraction capacity is solved, the circular container is selected as the sample container, and the measurement accuracy is improved. According to the technical scheme, traditional refraction angle measurement is converted into laser beam transverse displacement measurement, and the innovative method not only improves the measurement precision, but also effectively avoids interference of ambient light. The instrument can provide more accurate refractive index data by accurately measuring the displacement change of the laser beam after penetrating through the liquid.