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172 results about "Kerr effect" patented technology

The Kerr effect, also called the quadratic electro-optic (QEO) effect, is a change in the refractive index of a material in response to an applied electric field. The Kerr effect is distinct from the Pockels effect in that the induced index change is directly proportional to the square of the electric field instead of varying linearly with it. All materials show a Kerr effect, but certain liquids display it more strongly than others. The Kerr effect was discovered in 1875 by John Kerr, a Scottish physicist.

System for measuring linear and non-linear magneto-optical Kerr rotation

InactiveCN101776575ASimultaneous adjustment of the magnetic field strengthSimultaneously adjust the temperatureMaterial analysis by optical meansCollection systemOptoelectronics
The invention discloses a system for measuring linear and non-linear magneto-optical Kerr rotation, which comprises an ultra-short pulse laser, a helium-based closed-cycle refrigerator, an electromagnet, a laser-pumping optical path, a laser-detection optical path, a linear Kerr signal collection optical path, a non-linear Kerr signal collection optical path, a lock-in amplifier signal collection system and a laser spot monitoring system, wherein the helium-based closed-cycle refrigerator is provided with optical windows and used for controlling the temperature of a sample; the size of the air gap and the magnitude of the magnetic field of the electromagnet are adjustable; the laser-pumping optical path is used for leading in the laser inputted by the ultra-short pulse laser and focusing the laser on the surface of the sample inside the refrigerating head, so as to excite the sample; the polarization plane of the laser-detection optical path rotates after a beam of laser outputted by the ultra-short pulse laser is reflected by the sample; the linear Kerr signal collection optical path is used for collecting the base-frequency signal of the detection laser; the non-linear Kerr signal collection optical path is used for receiving the frequency-doubled signal of the detection laser; the lock-in amplifier signal collection system is used for filtering and amplifying the signals and transmitting the signals to a computer for processing; and the laser spot monitoring system is used for accurately controlling the overlap ratio of the pumped beam laser spot and the detected beam laser sport. The system provided by the invention for measuring the linear and non-linear magneto-optical Kerr rotation is capable of simultaneously adjusting the temperature and the intensity of the magnetic field applied to the sample and achieving the measurement of the linear and non-linear magneto-optical Kerr effect on a temperature-variable steady-state basis or a time-resolved dynamic basis.
Owner:INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI

Spectrum magneto-optical ellipsometry analysis device of rotary compensator as well as application thereof

The invention discloses a spectrum magneto-optical ellipsometry analysis device of a rotary compensator as well as application thereof. The spectrum magneto-optical ellipsometry analysis device comprises a light source module, a light path module, a magnetic field module, a sample table, a motor control module and a detection and analysis module, the light path module comprises a collimating lens,a polarizer, a compensator and a polarization analyzer, the detection and analysis module comprises a computer and a detector, the collimating lens, the polarizer, the compensator, the sample table,the polarization analyzer and the detector are sequentially arranged along a light path direction, the polarizer and the compensator are located in an incidence light path, the polarization analyzer is located in an emergence light path, and the incidence light path and the emergence light path are located at the two sides of the sample table and respectively keep an included angle Phi with normalof the sample table. The device disclosed by the invention can represent optical and magnetic parameters of a magnetic film material under longitudinal or poloidal magneto-optical Kerr effect, can obtain thickness, optical parameters and magnetic parameters of a magnetic film sample during one test and is relatively high in automation degree.
Owner:SHANDONG UNIV

MEMS (Micro Electro Mechanical System) scanning type laser heterodyne interferometer and method thereof in measuring glass stress

The invention relates to an MEMS (Micro Electro Mechanical System) scanning type laser heterodyne interferometer and a method thereof in measuring glass stress, relating to an interferometer and a method thereof in measuring the glass stress and aiming at solving the problem of limitation of the measurement of the glass stress on infrared materials. Light emitted by a laser passes through an acoustooptic frequency shifter to become 1-grade light with the frequency of f and 0-grade light with the frequency of f', the 1-grade light is signal light, the 0-grade light is local oscillating light, the 1-grade light passes through a lambda / 2 wave plate to enter a polarization beam splitter prism and then transmitted through a part, scans a sample through an MEMS vibrating mirror 7 and then reflected by a reflecting mirror to return according to an original optical path; light beams pass through the part again and then reflected into horizontal components by the polarization beam splitter prism, carry out frequency beat with the 0-grade light and respectively form the angles of 0 degree and 45 degrees with the polarization direction of incident light through a changed part; a signal processing system processes two currents detected by a detector to obtain the glass stress of the sample; and the part is a lambda / 4 wave plate or a Kerr effect crystal adding an electrode in a direction at 45 degrees. The MEMS scanning type laser heterodyne interferometer disclosed by the invention is used for measuring the glass stress.
Owner:HARBIN INST OF TECH

System and method for measuring in-situ surface magneto-optic Kerr effect

The invention discloses a system for measuring the in-situ surface magneto-optic Kerr effect during the preparation of a ferromagnetic film, which comprises a molecular beam epitaxy system, a magneticfield control system with a special light path, a surface magneto-optic Kerr effect test system and a ferromagnetic film sample, wherein the magnetic field control system with the special light pathis butted with a substrate observation window of a molecular beam epitaxy system growth chamber; the surface magneto-optic Kerr effect test system can ensure that incident laser is irradiated on the surface of the ferromagnetic film sample positioned on a growth position operator through the special light path of the magnetic field control system by debugging; and reflected laser on the surface ofthe ferromagnetic film sample can be fed back to a signal receiver through the special light path of the magnetic field control system. The invention also discloses a method for measuring the in-situsurface magneto-optic Kerr effect during the preparation of the ferromagnetic film. The system and the method have the advantages of simplicity, convenience and easy operation, and can realize the measurement of the in-situ surface magneto-optic Kerr effect without deconstruction and influence.
Owner:INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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