Multifunctional reflection-type magneto-optic spectrum measuring system

A spectroscopic measurement and reflection technology, applied in the field of magneto-optical spectrum detection, can solve the problems of inability to measure the magneto-optical spectrum of opaque samples, inability to change the temperature and magnetic field size at the same time, and inflexible configuration schemes, so as to save equipment purchase costs and occupancy. Small space, high precision effect

Inactive Publication Date: 2010-08-18
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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Problems solved by technology

[0005] Generally, the magneto-optical spectroscopy measurement system is divided into transmission type and reflection type. The transmission type magneto-optic spectroscopy measurement system needs to have four (or two symmetrical openings) low-temperature superconducting Dewars, which are expensive and cannot measure opaque samples. magneto-optic

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  • Multifunctional reflection-type magneto-optic spectrum measuring system
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  • Multifunctional reflection-type magneto-optic spectrum measuring system

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Embodiment Construction

[0043] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0044] The multifunctional reflective magneto-optical spectrum detection system provided by the present invention utilizes OXFORD's discrete liquid helium Dewar and low-temperature superconducting magnet system, a broad-spectrum white light source, a single chromatograph, a photoelastic modulator, and several polarized optical lenses, As well as photodetectors, lock-in amplifiers and computers, a magnetic collection circular dichroism (MCD), polar magneto-optical Kerr effect, magnetic line dichroism (MLD) and magneto-optical polarization reflectance spectroscopy were built. A multi-functional reflective magneto-optical spectroscopy detection system with multiple measurement functions.

[0045]The multifunctional reflectiv...

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Abstract

The invention discloses a multifunctional reflection-type magneto-optic spectrum measuring system which uses a super-continuous white light source, a grating monochromator, a plurality of polarized lenses, a photoelastic modulator, a broad band 1/4 and 1/2 wave plate, a non-polarization beam splitter (NPBS), a single-ended differential detector and an OXFORD low-temperature superconducting magnet system to form a spectrum detection system with a flexible and variable structure. The invention can realize the measurement of reflection-type magnetic circular dichroism (MCD), polar magneto-optical Kerr effect, polarized reflection spectrum and magnetic wire magnetic linear dichroism (MLD) on the same light path. The system has high sensitivity and can be used for fields, such as basic physics research, material characteristic analysis, light polarization modulation communication and the like.

Description

technical field [0001] The invention relates to the technical field of magneto-optical spectrum detection, in particular to a multifunctional reflective magneto-optic spectrum detection system. Background technique [0002] Because many substances have Faraday effect and Kerr effect, the magneto-optic spectroscopy detection system has a wide range of applications: such as observing the optical properties of molecules in biology, the energy band research of semiconductor / metal materials, and the polarization modulation research in optical communication. Compared with the transmission measurement system, the reflective magneto-optical spectroscopy measurement system can measure opaque samples, and the configuration structure is flexible, so it is applicable to a wider range of occasions. [0003] The full name of MCD is magnetic circular dichroism, that is, under a magnetic field, the absorption rate of matter for left-handed circularly polarized light and right-handed circula...

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Application Information

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IPC IPC(8): G01J3/42G01J3/433G01J1/00
Inventor 朱科朱汇刘剑章昊徐萍李桂荣郑厚植
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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