The invention relates to the field of material surface magnetism measurement. A high-frequency magnetic spectrograph comprises a pulse laser, a time delayer, a 1 / 4 wave plate, a concave lens, a firstconvex lens, a plane mirror, a polaroid, a beam splitter, a second convex lens, a lens table, a first atomic force microscope, a first probe, a lens seat, an objective lens, a sample, a wave guide, asample table, a signal generator, an oscilloscope, a detector, a bias three-way valve, a first amplifier, a frequency mixer, a second amplifier, an analog-digital converter, a computer, a second atomic force microscope, a second probe and a phase sensitive detector. A single nanometer structure can be measured; the measurement on the magnetization dynamic state of the sample surface has the spaceresolution ratio of the submicron grade; the magnetization information on the nanometer scale sample surface is obtained by using a high-precision positioning device; two different atomic force microscope needle points are used for respectively performing contact mode atomic force microscope scanning and near field time resolution Magneto-Optical Kerr effect experiments; a frequency domain methodis used for detecting the GHz frequency band magnetization dynamic states on the surface of the sample.