This invention discloses a defect detection method for semi-transparent multilayer film materials. It utilizes a multi-camera setup, combining a
line scan camera, a PMD area array camera, and a small-field-of-view
CCD camera, along with a
robotic arm for flipping to inspect the front and back of the product. A unified coordinate
system is established through
spatial registration, and a multi-layered composite logic filtering mechanism is employed to identify defects and reject over-detected defects. Specifically, this includes front and back
grayscale and morphology
data acquisition, spatial coordinate registration, multi-dimensional defect identification, and logical
processing for bubble deduplication, dust filtering, and
system noise filtering. Simultaneously, multi-focus CCD imaging enables layered defect determination. This invention improves the accuracy of defect detection and discrimination, achieving high-precision and high-reliability detection of defects in semi-transparent multilayer films, and is suitable for online quality inspection during the production process of semi-transparent multilayer films.