This invention discloses a method and apparatus for quality inspection of polarizers on
liquid crystal glass substrates based on
image processing, belonging to the field of
image inspection technology. The method includes: firstly, structural identification and region modeling of the
liquid crystal glass substrate under test are performed, and a detection benchmark is established; then, multi-condition images of the same detection area are acquired under different detection states, and a
reference image set and a detection image set are constructed; subsequently,
spatial registration, background decoupling, defect enhancement, and layer discrimination are performed on the images; finally, quality evaluation results and process feedback are output based on defect type, layer position, and location information. This scheme can distinguish and detect surface defects, bonding interface defects, conductive layer-related anomalies, and
liquid crystal functional anomalies, improving detection accuracy, evaluation consistency, and defect
traceability in the manufacturing process, while also adapting to the differentiated detection needs of the central optical region, edge bonding region, conductive connection region, and partition
boundary region.