The invention relates to the technical field of
image processing, in particular to a circuit board defect detection
system and method. According to the method, a plurality of detection sub-regions are obtained through division, and
spectral image parameters, circuit board
design information and process execution historical data are obtained based on circuit board feature information of each region; further obtaining
pixel intensity ratio anomaly, function influence degree and historical defect frequency factors, and performing
coupling analysis to obtain circuit board region evaluation information to realize region importance grading; the resource waste caused by full-region non-difference detection is avoided, the calculation load is greatly reduced, the detection
delay is shortened, and the real-time requirement of high-speed production is met; according to the method, lightweight
feature extraction is carried out on multispectral imaging information to obtain a fused
multispectral image, the defect
detection rate of a core area is guaranteed, the process of a non-core area is simplified through lightweight
processing and low-standard detection, the
dynamic balance of detection precision and efficiency is improved, and the overall detection quality is improved.