Patents
Literature
Patsnap Copilot is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Patsnap Copilot

823 results about "Line scan" patented technology

LINE SCAN. Line scan cameras contain a single row of pixels used to capture data very quickly. As the object moves past the camera, a complete image can be reconstructed in software line by line. Line scan systems are best employed in high-speed processing or fast-moving conveyor line applications.

Arrangement and method for inspection of surface quality

The invention relates to a method for automatic inspection of the surface 20 of a moving object, in which a region on the object's surface is illuminated from at least two different illumination directions 13-15. The object's illuminated surface region is imaged with a camera to provide image information for analysis. The light sources in the different illumination directions 13-15 are pulsed to illuminate the object's surface region at different times, the pulsing frequency being >1 kHz The object's illuminated surface region is imaged as lines with a line scan camera 21 in sync with the above pulsing. The invention also relates to an arrangement for inspecting the surface 20 of a moving object, the arrangement comprising at least two light sources 10-12 in at least two different illumination directions 13-15 for illuminating the surface region of the object under inspection; a camera for imaging the object's surface region; and an image analyzer for analyzing the image information acquired from the object's surface 20 by imaging. The light sources 10-12 illuminate the object's surface 20 from the different illumination directions 13-15 at different times, and the camera is a line scan camera 21. The arrangement further comprises a timing controller 18 for synchronous pulsing of the light sources 10-12 and the at least one line scan camera 21, the pulsing frequency of the light sources 10-12 being >1 kHz.
Owner:THERMO RADIOMETRIE +1

Line scan sequential lateral solidification of thin films

A polycrystalline film is prepared by (a) providing a substrate having a thin film disposed thereon, said film capable of laser-induced melting, (b) generating a sequence of laser pulses having a fluence that is sufficient to melt the film throughout its thickness in an irradiated region, each pulse forming a line beam having a predetermined length and width, said width sufficient to prevent nucleation of solids in a portion of the thin film that is irradiated by the laser pulse, (c) irradiating a first region of the film with a first laser pulse to form a first molten zone, said first molten zone demonstrating a variation in width along its length to thereby define a maximum width (Wmax) and a minimum width (Wmin), wherein the first molten zone crystallizes upon cooling to form one or more laterally grown crystals, (d) laterally moving the film in the direction of lateral growth a distance that is greater than about one-half Wmax and less than Wmin; and (e) irradiating a second region of the film with a second laser pulse to form a second molten zone having a shape that is substantially the same as the shape of the first molten zone, wherein the second molten zone crystallizes upon cooling to form one or more laterally grown crystals that are elongations of the one or more crystals in the first region.
Owner:THE TRUSTEES OF COLUMBIA UNIV IN THE CITY OF NEW YORK

Method for measuring volume of large irregular bulk grain pile based on dynamic three-dimensional laser scanning

InactiveCN102721367AHigh precisionAccurate point cloud dataUsing optical meansScannerPoint cloud
The invention relates to a method for measuring the volume of a large irregular bulk grain pile based on dynamic three-dimensional laser scanning. The method comprises the following steps of: arranging a guide rail in the middle of the top of a barn along the width direction, wherein the guide rail is provided with a slide block controlled by a stepping motor, and a laser radar scanner is installed on the slide block; moving the slide block from one end to the other end of the top of the barn at a constant speed to drive the laser radar scanner by the slide block to finish scanning on the surface of the whole bulk grain pile, wherein the laser radar device is a one-dimensional scanning device to realize linear scanning and returning coordinate data, and the master control computer is used for transmitting pulses to the stepping motor and processing the signal; acquiring point cloud data of the surface of the bulk grain pile through the master control computer, determining the distribution density of scanned points for calculating the volume according to an allowed error value of the grain pile measured by the user, and calculating the weight of the grain pile according to the grain density provided by the user; and generating a point cloud graphic matrix attached with coordinates through scanning space morphology by guide rail moving type three-dimensional laser, performing surface fitting to form an irregular bulk grain pile appearance, and thus obtaining the volume of the irregular bulk grain pile. The volume of the large irregular bulk grain pile can be rapidly and effectively measured at high precision, and remote monitoring can be realized; and moreover, the method is low in cost and easy to implement.
Owner:MENG FAN'GANG

Plane switch mode active matrix liquid crystal display device and mfg. method thereof

InactiveCN1420386APrevent vertical crosstalkDoes not reduce porosityTransistorStatic indicating devicesActive-matrix liquid-crystal displayScan line
An in-plane switching mode active matrix type liquid crystal display device includes a first substrate, a second substrate located opposing the first substrate, and a liquid crystal layer sandwiched between the first and second substrates. The first substrate includes a thin film transistor, a pixel electrode each associated to a pixel to be driven, a common electrode to which a reference voltage is applied, data lines, a scanning line, and common electrode lines. Molecular axes of liquid crystal are rotated in a plane parallel with the first substrate by an electric field substantially parallel with a plane of the first substrate to thereby display certain images. The common electrode is composed of transparent material, and are formed on a layer located closer to the liquid crystal layer than the data lines. The common electrode entirely overlaps the data lines except an area where the data lines are located in the vicinity of the scanning line. The liquid crystal display device further includes a light-impermeable layer in an area where the common electrode entirely overlaps the data lines. The light-impermeable layer is comprised of a black matrix layer having a width smaller than a width of the common electrode.
Owner:NEC LCD TECH CORP

Bright field and dark field channels, used for automotive glass inspection systems

InactiveUS20100051834A1Overcomes or mitigates one or more disadvantagesInvestigating moving sheetsOptically investigating flaws/contaminationTime delaysImage formation
An inspection system for inspecting a sheet of glass comprises an illumination module, a collimating lens system, a telecentric imaging lens system and a Time Delay Integration line-scan camera. The illumination module has a low coherence light source emitting light. The collimating lens system has a focal point on the main axis thereof on which focal point its light source is located. The collimating lens system produces a collimated sheet of light from the emitted light. This collimated sheet of light passes through the sheet of glass. The telecentric imaging lens system concentrates the sheet of light passed through the sheet of glass on an image formation plane. The Time Delay Integration line-scan camera is positioned in a general area of the image formation plane. The camera is equipped with an antiblooming device. In another embodiment, an inspection system for inspecting a sheet of glass comprises a camera and a peripheral RDF illumination module. The camera is positioned on and points toward a first side of the sheet of glass. The peripheral RDF illumination module surrounds the camera and side, outside a field of view of the camera. The RDF illumination module is operative to illuminate the field of view with its RDF emitted light. The RDF illumination module is oriented so that the sheet of glass reflects the RDF emitted light away from the camera. The camera is positioned so as to be operative to receive the RDF emitted light if a RDF detectable defect is present on the sheet of glass and to avoid the RDF emitted light if no RDF detectable defect is present on the sheet of glass.
Owner:SYNERGX TECH

Contact network geometrical parameter detection method and device

ActiveCN104567684AImprove work efficiencyOne-dimensional imaging with high precisionUsing optical meansContact networkContact line
The invention provides a contact network geometrical parameter detection method and device. The contact network geometrical parameter detection method comprises the steps of obtaining one-dimensional contact network images shot by at least two line-scan cameras fixed on the top of a vehicle, carrying out grey processing on the one-dimensional contact network images to generate a grey value and pixel coordinate relation diagram, determining the imaging position of contact lines of a contact network in the images according to the grey value and pixel coordinate relation diagram, determining the imaging angle of each contact line in the corresponding camera according to the imaging position of the contact line, and determining the geometrical parameters of the contact network according to the imaging angles and the position data of the line-scan cameras relative to the top of the vehicle. Geometrical parameter detection is carried out by utilization of the images collected by the line-scan cameras, the line-scan speed is high, a detection result is accurate, detection efficiency is high, the time for maintaining a skylight is not occupied, a reliable technical means is provided for measurement and evaluation of dynamic and static geometrical parameters of the contact network, and the working efficiency for checking and maintaining a power supply unit is improved.
Owner:CHINA ACADEMY OF RAILWAY SCI CORP LTD +2
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products