22 results about "Rectilinear Scan" patented technology

The application provides a splicing printing correction method, an electronic device and a medium. The splicing printing correction method comprises the following steps: controlling a first laser and a second laser to respectively scan along a first straight line in a splicing area to form a first scanning point and a second scanning point; establishing a coordinate system based on the splicing area, so that the first scanning point and the second scanning point are located in the coordinate system; obtaining a first coordinate value of the first scanning point and a second coordinate value of the second scanning point; detecting whether the first coordinate value and the second coordinate value satisfy a preset offset value, and obtaining a correction result between the first laser and the second laser according to the detection information. The application can quickly complete splicing correction, ensure the accuracy of debugging, and improve the printing accuracy and quality.

The application discloses a kind of based on multiple probe straight line scanning wafer diameter measuring device, including horizontal motion slide rail module, object table module, confocal detection module and control and calculation module.The device is mainly realized high-precision measurement by two stages: in calibration mode, control slide rail drives the to-be-measured wafer to carry out multiple position-adjustable translation movements, the reflected light intensity data and position coordinates of two side confocal probes are collected, multiple sets of chord length data are determined, and the accurate installation distance parameters of the probe are calculated based on this through iterative optimization algorithm;In measurement mode, then control slide rail drives the to-be-measured wafer to pass through probe detection area single time, according to the installation distance parameters obtained by calibration and the chord length measured in real time, the diameter of the to-be-measured wafer is directly calculated by geometric relation.The application significantly improves the precision, repeatability and operation efficiency of wafer diameter measurement.

Embodiments of this application provide a linear scanning CT imaging system and imaging method. The linear scanning CT imaging system includes: a support frame; a transport device mounted on the support frame, the transport device including a drive mechanism, a transmission mechanism, and a circular transport path, the drive mechanism being configured to drive the transmission mechanism to move along the circular transport path, and multiple local linear paths in the circular transport path forming multiple linear scanning segments; at least one carrier mounted on the transmission mechanism, configured to carry at least one scanned object, the carrier being able to follow the transmission mechanism to move along the circular transport path to pass through multiple linear scanning segments; multiple scanning devices, respectively disposed in the multiple linear scanning segments, with multiple X-ray sources in the multiple linear scanning segments emitting multiple X-ray beams from multiple angles relative to the scanned object; and an imaging device for generating a computed tomographic image of the scanned object based on multiple projection data detected by various detectors in the multiple linear scanning segments.

The invention provides a method and a device for measuring the transverse spatial resolution of a confocal Raman microscope, and relates to the technical field of optical measurement and micro-spectrum. The method comprises the following steps: positioning a linear edge area on a single-layer graphene sample by using a confocal Raman microscope, and preparing the single-layer graphene sample on a silicon oxide substrate; determining a linear scanning path and a scanning step length from the exposed area of the substrate to the sample area in the positioned area of the linear edge along the direction vertical to the linear edge by using a confocal Raman microscope; in the moving process of the single-layer graphene sample, determining a plurality of scanning points on the linear scanning path based on the scanning step length, and collecting a Raman spectrum signal of each scanning point; and determining the transverse spatial resolution of the confocal Raman microscope based on the Raman spectrum of each scanning point. By adopting the method provided by the invention, the accuracy of the transverse spatial resolution of the confocal Raman microscope can be improved.

The application provides a method and device for measuring lateral spatial resolution of a confocal Raman microscope, and relates to the field of optical measurement and microscopic spectroscopy technology. The method comprises the following steps: positioning a region of a straight edge on a single-layer graphene sample by using a confocal Raman microscope, wherein the single-layer graphene sample is prepared on a silicon oxide substrate; determining a straight scanning path and a scanning step in a direction perpendicular to the straight edge from a bare region of the substrate to a sample region in the region of the straight edge which has been positioned by using the confocal Raman microscope; determining a plurality of scanning points on the straight scanning path based on the scanning step in the process of moving the single-layer graphene sample, and collecting Raman spectrum signals of the scanning points; and measuring the lateral spatial resolution of the confocal Raman microscope based on the Raman spectrum of each scanning point. By using the method provided in the application, the accuracy of the lateral spatial resolution of the confocal Raman microscope can be improved.

A tiled printing correction method, an electronic device, and a medium. The tiled printing correction method comprises: separately controlling a first laser and a second laser to scan along a first straight line in a tiling area, so as to form first scanning point positions and second scanning point positions; on the basis of the tiling area, establishing a coordinate system, so as to enable all the first scanning point positions and the second scanning point positions to be located within the coordinate system; acquiring first coordinate values of the first scanning point positions and second coordinate values of the second scanning point positions; and detecting whether the first coordinate values and the second coordinate values satisfy a preset offset value, and according to the detection information, obtaining a correction result between the first laser and the second laser.

Embodiments of the present application provide a linear scanning CT imaging system and an imaging method. The linear scanning CT imaging system comprises a plurality of support frames, a plurality of conveying devices respectively installed on the plurality of support frames, each conveying device comprising a driving mechanism, a transmission mechanism and an annular conveying path, the driving mechanism being configured to drive the transmission mechanism to move along the annular conveying path, the plurality of annular conveying paths forming a plurality of linear scanning sections through local linear paths, a plurality of bearing seats configured to carry at least one scanning object, a plurality of sets of scanning devices respectively arranged in the plurality of linear scanning sections, each set of scanning devices comprising at least one ray source and at least one detector, the ray source emitting a ray beam, and the detector detecting projection data formed after the ray beam passes through the scanning object, and an imaging device configured to generate a computed tomography image of the scanning object according to a plurality of projection data detected by each detector of the plurality of linear scanning sections.

Embodiments of the present application provide a linear scanning CT imaging system and an imaging method. The linear scanning CT imaging system comprises a first support frame and a second support frame, a first conveying device mounted on the first support frame, comprising a first driving mechanism, a first conveying mechanism and a first linear scanning section, the first driving mechanism driving the first conveying mechanism to move along the first linear scanning section, a second conveying device mounted on the second support frame, comprising a second driving mechanism, a second conveying mechanism and a second linear scanning section, the second driving mechanism driving the second conveying mechanism to move along the second linear scanning section, at least one bearing seat carrying at least one scanning object, capable of being driven by the first conveying mechanism or the second conveying mechanism to move, a plurality of sets of scanning devices, each set of scanning devices comprising at least one ray source and at least one detector, and an imaging device for generating a computed tomography image of the scanning object according to a plurality of projection data detected by each detector.

The present application relates to a kind of based on spectral confocal hemispherical harmonic resonator inner and outer surface topography measurement method.The present application includes: adjusting displacement motion platform and attitude adjustment platform makes spectral confocal measuring head optical axis and hemispherical harmonic resonator rotation shaft intersection;Divide scanning measurement interval and carry out curved surface parallel plate approximation at measurement point, record the theoretical angle between plate and spectral confocal measuring head vertical plane;Spectral confocal measuring head and hemispherical harmonic resonator carry out linear scanning motion and rotation motion respectively, collect the spectral peak position data of each measurement point on the surface of hemispherical harmonic resonator;Establish inclined plate compensation model to calculate the distance position information of the inner and outer surface of hemispherical harmonic resonator at each measurement point, and generate inner and outer surface topography after converting measurement result into point cloud.The method provided by the present application can effectively reduce the measurement error introduced by curved surface, and the whole appearance of hemispherical harmonic resonator inner and outer surface can be obtained by once scanning motion, and online measurement can be realized on processing equipment after simple debugging.

The application discloses a center positioning method for a gas PE pipeline and related equipment, and the method comprises the following steps: controlling a preset radar sensor and a pipe to be measured to form a relative linear scanning motion along a preset scanning direction, the preset scanning direction intersects with the axis of the pipe to be measured, and the scanning range of the relative linear scanning motion covers the estimated center area of the pipe to be measured; during the relative linear scanning motion, the echo signal of the radar sensor is acquired, and the radial velocity corresponding to the reflection of the outer surface of the pipe is calculated based on the echo signal; and the position of the center point of the pipe to be measured is determined based on the spatial position of the radar sensor when the radial velocity is zero. The position of the center point of the pipe is determined by using the spatial position of the radar sensor when the radial velocity is zero, a center point determination mode based on the physical motion characteristics is realized, and the stability and consistency of the center positioning can be improved.

The invention provides a splicing printing correction method, electronic equipment and a medium. The splicing printing correction method comprises the following steps: respectively controlling a first laser and a second laser to scan along a first straight line in a splicing area to form a first scanning point position and a second scanning point position; establishing a coordinate system based on the splicing area, so that the first scanning point location and the second scanning point location are both located in the coordinate system; acquiring a first coordinate value of the first scanning point location and a second coordinate value of the second scanning point location; and detecting whether the first coordinate value and the second coordinate value meet a preset deviation value or not, and obtaining a correction result between the first laser and the second laser according to detection information. According to the method, splicing correction can be rapidly completed, the debugging precision is guaranteed, and the printing precision and quality are improved.

The invention discloses a calibration method suitable for a mechanical linear scanning SAR (Synthetic Aperture Radar) imaging system, which belongs to an image processing technology, and comprises the following steps: enabling a transmission parameter measured by a vector network analyzer to be equivalent to a reflection measurement parameter of a single port, and establishing a mathematical model containing a directivity error, a reflection tracking error and a source matching error; matching load calibration and short-circuit load calibration are respectively carried out by using a free space and a large-size metal flat plate, and equivalent emission parameters of the vector network analyzer are obtained; performing time domain gate gating processing and error term solving according to the equivalent emission parameters; and substituting the solved directivity error, reflection tracking error and source matching error into the mathematical model, and carrying out error calibration. The method can adapt to dynamic working characteristics of mechanical scanning, is simple and convenient to operate, and can accurately peel off system errors.

The utility model relates to a pile foundation surface defect detector which comprises a flexible track, a movable base arranged on the flexible track, a detection movable module arranged on the movable base and an infrared detection module arranged on the detection movable module. The axis direction of the detection moving module is perpendicular to the moving direction of the moving base, the infrared detection module is configured to reciprocate on the detection moving module, and detection data of the infrared detection module is used for analyzing pile foundation surface defects. According to the pile foundation surface defect detector, the pile foundation surface is automatically detected in a linear scanning mode, data generated in the mode can be directly used for analysis, and meanwhile the pile foundation surface defect detector is not prone to being affected by the surrounding environment.

A high-resolution vertical CT device and scanning method of oblique line scanning spiral track belong to the technical field of ray tomography. The device comprises a ray source, a flat panel detector, a data acquisition system, a mechanical motion system, a control system, a computing platform and a cabinet. The basic implementation steps of the scanning method are as follows: S1: the ray source beam translates along the axial oblique track with an angle γ, the flat panel detector is stationary, and a section of oblique track cone beam scanning is completed; S2: the measured object is relatively translated along the axis by a distance l, and the measured object is rotated by an angle interval Δθ; S3: a section of oblique scanning is continued in step S1; the spiral scanning composed of multiple oblique lines is formed reciprocally until the measured object is covered. The computing platform is provided with control system software and image reconstruction software. Compared with the previous CT, the present application not only has the advantages of simple and easy-to-control straight line scanning structure, but also can realize full coverage imaging of a flat long object and one-time imaging of multiple flat objects.

The present application relates to a kind of based on weighted source straight line scanning CT analytic reconstruction method, belong to micro focus computer tomography reconstruction technical field.The method includes: S1: the layout of F-mSTCT scanning mode is built;S2: in F-mSTCT scanning mode, design the weighting function for correcting redundant projection and truncated projection;S3: according to the weighting function constructed in step S2, construct W-FBP reconstruction algorithm suitable for F-mSTCT.The present application can solve the problem of truncation in STCT imaging, and overcome the shortcomings of poor imaging resolution of V-FBP algorithm under low projection number, realize the reconstruction of high-resolution image under lower ray source sampling rate, while reducing the number of projections.

The invention discloses a center positioning method and related equipment for a fuel gas PE pipeline, and the method comprises the steps: controlling a preset radar sensor and a to-be-detected pipe to form relative linear scanning motion in a preset scanning direction, and enabling the preset scanning direction to intersect with the axis of the pipe, the scanning range of the relative linear scanning motion covers the estimated central area of the to-be-detected pipe; in the relative linear scanning motion process, echo signals of the radar sensor are obtained, and the radial speed corresponding to reflection of the outer surface of the pipe is calculated based on the echo signals; and based on the spatial position of the radar sensor when the radial speed is zero, determining the central point position of the to-be-detected pipe. The position of the central point of the pipe is determined through the spatial position of the radar sensor when the radial speed is zero, a central point judgment mode based on physical motion characteristics is achieved, and stability and consistency of central positioning can be improved.

This application provides a linear CT imaging system and scanning imaging method based on multiple linear scanning trajectories, relating to the fields of radiation imaging and non-destructive testing. The system includes: a transport device for moving the scanned object along a predetermined m-segment linear scanning trajectory, wherein at least two segments of the m-segment linear scanning trajectory intersect and form a first preset angle, where m is a positive integer greater than or equal to 2; n scanning segments, each including at least one X-ray source and at least one detector, the n scanning segments being arranged at intervals along the m-segment linear scanning trajectories, where n is a positive integer greater than or equal to m; wherein, on both sides of each linear scanning trajectory, at least one X-ray source and detector for that scanning segment are respectively arranged, the X-ray source emitting a X-ray beam, and the detector detecting the X-ray beam emitted by the X-ray source and passing through the scanned object. This application enables the detection of large-volume or structurally heterogeneous scanned objects.

The embodiment of the application provides a rigid workpiece bevel exposure device, which is used for improving the precision of a laser direct writing imaging device. The rigid workpiece is driven by a harmonic reducer to perform linear stepping motion, and a light source module performs linear scanning operation in the vertical direction of the linear stepping motion, without the light source module moving in the horizontal and vertical directions at the same time, thereby avoiding vertical position errors caused by multiple scanning motions and improving the precision of exposure imaging. Secondly, the scanning motion carrier and the roller driving system are both installed on the first bevel of the base, so that the feeding and discharging are both in the form of bevel feeding and discharging, thereby avoiding the rigid workpiece occupying too large horizontal space in the horizontal direction when feeding and discharging in the horizontal direction, and saving production space. Finally, the device adopts a harmonic reducer as a transmission structure, which is small in size, light in weight and simple in structure, and the backlash of the harmonic reducer is generally within 1 arc minute, so that the high-precision stepping of the rigid workpiece can be ensured, and the imaging precision is further improved.

The invention provides a linear CT imaging system and a scanning imaging method, and relates to the technical field of radiation imaging and nondestructive testing. The system comprises a linear scanning channel which is used for a scanning object to pass through and extends along a first direction; the scanning assembly comprises a ray source and a detector, the ray source and the detector are arranged on the opposite sides of the scanning channel in the second direction, the ray source is configured to emit ray beams, the detector comprises a plurality of detection units, and the detection units are configured to detect the ray beams emitted by the ray source and passing through a scanned object, projection data are generated based on the detected ray beam, and the scanning assembly and the scanning object are in relative linear motion; the system further comprises a data processing device, the data processing device is electrically connected with the detector, and the data processing device is configured to perform superposition processing on the at least two projection data generated by the at least two detection units.

The invention provides an improved high-frequency monochromator and a light splitting method thereof, and the method is characterized in that polychromatic light enters an entrance slit, is split by a spectrometer, and then is emitted through a spectrum scanning slit at a field diaphragm, a linear scanning module and an emergent optical fiber; a linear scanning module is also arranged at the position of the field diaphragm, namely the spectral imaging position, and the linear scanning module is arranged perpendicular to an imaging optical axis, linearly moves along the spectral arrangement direction after spectral splitting and scans one by one; gradually coupling the monochromatic light into the input end of the receiving optical fiber, and sequentially obtaining monochromatic light output at the output end; and the control module is used for controlling the exposure imaging sequence according to a one-frame one-color mode, namely controlling the linear scanning spectrum emergent sequence. The light path is simple in structure, and can meet the requirement of high-speed exposure in combination with a special exposure mode.

The utility model relates to photoelectric signal transmission and detection technical field, concretely relates to a large aperture optical coaxial linear scanning machine -borne laser sounding radar device, including laser emission scanning module, light collection module and optical signal acquisition module, the laser emission scanning module according to beam transfer path includes laser, galvanometer and reflector in proper order, the light collection module according to beam transfer path includes concave mirror, plano -convex lens and convex lens in proper order, the optical signal acquisition module includes polarization module, filter and detector, the utility model discloses can significantly improve the scanning speed of system and the ability of detecting weak signal through galvanometer scanning and cassegrain telescope design, effectively suppresses water surface echo intensity, promotes the characteristic intensity of water bottom echo signal, and the application range is wider.

The invention provides a linear CT imaging system with multi-space-direction imaging capability and a scanning imaging method, and relates to the technical field of image processing and radiation imaging. The system comprises a conveying device used for enabling a scanning object to move along a preset linear scanning track; each imaging unit comprises at least one radiation source and at least one detector, and the plurality of imaging units comprise a first imaging unit and a second imaging unit; a ray beam emitted by the ray source of the first imaging unit forms a first scanning main sector, a ray beam emitted by the ray source of the second imaging unit forms a second scanning main sector, and the first scanning main sector and the second scanning main sector are located in different planes.