InSAR technology-based linear scanning near-field RCS test clutter suppression method
A linear scanning and clutter suppression technology, applied in the field of signal feature control and electromagnetic scattering measurement, can solve the problems of high time cost and large limitations of testing, and achieve the effect of suppressing site stray echoes and improving test accuracy.
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[0037] Exemplary embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The description of the exemplary embodiments is for the purpose of illustration only, and in no way limits the invention and its application or usage.
[0038] Such as figure 1 As shown, the present invention is based on the linear scan near-field radar cross-section (Radar Cross-Section, RCS) of InSAR technology to test the clutter suppression method, comprising the steps:
[0039] S1. Scan the target in a straight line under two height conditions to obtain two two-dimensional images of the target;
[0040] S2. Determine the height of each scattering source of the target according to the height difference Δh of the two linear scans and the phase difference Δφ of the two two-dimensional images;
[0041] S3. Based on the height of each scattering source of the target, the target is filtered in the height direction, and the filtered scattering so...
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