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149 results about "Linear Scan" patented technology

Linear scanning is a method to test for corrosion and metal loss on the surfaces of equipment. A linear scan is generally performed to determine the extent of corrosion on the bottom plates of storage tanks containing oil, petroleum, chemicals or any other acidic compound.

Dynamic non-uniformity correction method for linear scanned image based on image sequence analysis

The invention provides a dynamic non-uniformity correction method for a linear scanned image based on image sequence analysis. The dynamic non-uniformity correction method comprises the following steps: firstly, selecting k (k is equal to 1, 2,..., and belongs to Z) images for the existing image to be corrected, and setting an ideal desired value q; then, calculating the average value of pixel values on each row of the k images to acquire a mean vector; and finally, using a ratio of the mean vector to the set ideal desired value as a correction coefficient to correct the images, so that a novel image which is uniform in background, clear in defect contour and convenient to position a subsequent defect target is acquired. The method can effectively overcome influences of changes of such factors as parameters including material specification, thickness and the like of the detected object, detection angle, plate type consistency and light source illumination attenuation, so as to dynamically acquire in real time an ideal image which is uniform in grey distribution, high in definition and remarkably enhanced in the detected object, thus greatly simplifying subsequent image processing difficulty and effectively improving the real-time performance of the integral system.
Owner:苏州有色金属研究院有限公司

Agile imaging satellite linear scan strip pre-generating method based on point target and satellite three-axis gesture rapid determining method

The invention provides an agile imaging satellite linear scan strip pre-generating method based on a point target and a satellite three-axis gesture rapid determining method, relates to the field of spacecraft imaging mission planning, and aims to solve the problems that related linear push scanning strip generating methods do not exist in the area of satellite imaging planning in the prior art, push scanning imaging mode realized by agile satellite can not be considered in target planning caused by ignorance of satellite yaw motor performance in an existing satellite gesture determining method with two-axis gesture calculation, and thereby target planning performance is lowered. Geodetic longitude and latitude of each target point to be observed are converted into plane right angle coordinates through screening point target, calculation is optimized, linear scan strips are obtained, and then new target points corresponding to the target points to be observed are determined through the obtained linear scan strips. Corresponding geodetic coordinates of each new target point are calculated, parameters of satellite three-axis gesture are calculated, and the satellite three-axis gesture is determined. The agile imaging satellite linear scan strip pre-generating method based on the point target and the satellite three-axis gesture rapid determining method are suitable for satellite imaging target planning.
Owner:HARBIN INST OF TECH

Linear laser phase-shift interference triangular micro-displacement measuring device and method

A linear laser phase-shift interference triangular micro-displacement measuring device and method belong to the technical field of ultra-precision measurement. According to the invention, a phase-shift interference technology and a laser triangulation technology are combined to realize wide-range and high-precision micro-displacement measurement. According to the phase-shift interference principleand the laser triangulation principle, a light source output is changed into a linear parallel beam by adopting shape beam expansion, and four linear interference beams with 90-degree phase shifts insequence are obtained synchronously by grating beam splitting and a four-quadrant analyzer group. Meanwhile, a linear laser triangulation system obtains rough displacement measurement data by partialdiffuse reflection light. When the maximum error of linear laser triangulation measurement is less than 1/4 of an interference signal period, an accurate displacement value can be obtained by certainsolution. The measuring accuracy is high, the measuring range is wide, linear scan measuring can be realized, and the measuring device and method are suitable for measuring the step height, the filmthickness, the displacement/position of a moving part and the like in a microstructure device.
Owner:HARBIN INST OF TECH
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