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780 results about "Scan time" patented technology

Scan Time (SCT) The total scan time is the time required to collect all data needed to generate the programmed images. The scan time is related to the used pulse sequence and dependent on the assemble of parameters like e.g., repetition time (TR), Matrix, number of signal averages (NSA), TSE- or EPI factor and flip angle.

Multi channel Raman spectroscopy system and method

A spectrometer that provides the ability to combine the advantages of high resolution, compactness, ruggedness, and low-power consumption of Fabry-Perot (FP) tunable filter spectrometer, with the multi-channel multiplexing advantage of FT and/or grating/detector array. The key concept is to design and operate a tunable FP filter in a multiple-order condition. This filter is then followed by a “low-resolution” fixed grating, which disperses the filtered n-order signal into a preferably matched N-element detector array for parallel detection. The spectral resolution in this system is determined by the FP filter, which can be designed to have very high resolution. The N-order parallel detection scheme reduces the total integration or scan time by a factor of N to achieve the same signal to noise ratio (SNR) at the same resolution as the single channel tunable filter method. This design is also very flexible, allowing spectrometer systems with appropriate order N to thereby optimize the system performance for spectral resolution and scan integration time. In addition to the significant reduction in scan integration time, there are two other advantages to this approach. The first, because the FP tunable filter is designed and operated under n-orders, the fabrication tolerances of the FP filter cavity and operating conditions are significantly loosened.
Owner:AXSUN TECH

System and method for measuring radio-frequency signal high-speed sweeping frequency spectrum based on digital local oscillator

The invention relates to a system for measuring a radio-frequency signal high-speed sweeping frequency spectrum based on a digital local oscillator. The system comprises a radio frequency conversion unit, an intermediate frequency signal conditioning unit and a digital intermediate frequency signal processing and controlling unit which are sequentially connected in series. The digital intermediate frequency signal processing and controlling unit is provided with a digital scan synchronous control circuit module and a programmable digital oscillator, wherein the digital scan synchronous control circuit module is connected with an in-phase quadrature (IQ) signal shunt processing circuit module through the programmable digital oscillator, the digital scan synchronous control circuit module is connected with a first local oscillator device, a detector, or a fast fourier transform (FFT) convertor. The invention further relates to a method which is based on the system and achieves synchronous control for the scanning in high-speed sweeping frequency spectrum measurement. Due to the fact that the system and method for measuring radio-frequency signal high-speed sweeping frequency spectrum based on the digital local oscillator are adopted, scanning time is greatly shortened, local frequency accuracy in a scanning process is improved, circuit hardware is simplified, cost is reduced, working performance is stable and reliable, and range of application is wide.
Owner:TRANSCOM INSTR
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