347 results about "Optical beam deflection" patented technology

Fully monolithic gimbal-less micro-electro-mechanical-system (MEMS) devices with large static optical beam deflection and fabrications methods are disclosed. The devices can achieve high speed of operation for both axes. Actuators are connected to a device, or device mount by linkages that allow static two-axis rotation in addition to pistoning without the need for gimbals, or specialized isolation technologies. The device may be actuated by vertical comb-drive actuators, which are coupled by bi-axial flexures to a central micromirror or device mount. Devices may be fabricated by etching an upper layer both from the top side and from the bottom side to form beams at different levels, The beams include a plurality of lower beams, a plurality of full-thickness beams, and a plurality of upper beams, the lower, full-thickness and upper beams That form vertical combdrive actuators, suspension beams, flexures, and a device mount.

A system and method for treating target tissue including a light source for generating a beam of light, a plurality of optical fibers, a deflection device configured to selectively deflect the light beam into the input ends of the optical fibers, one optical fiber input end at a time, and a probe having a tip with the output ends of the optical fibers and configured for insertion into target tissue. The probe tip is configured to sequentially project spaced apart spots of the light beam from the output ends as the deflection device deflects the light beam into the optical fibers. One or more moving or static deflecting optics at the probe tip can be used to statically or dynamically deflect the beam exiting the optical fibers.

An optical scan device having an optical deflector reflecting a light beam from a light beam source so as to deflect the light beam and having a surface to be scanned on which information is written such that the light beam deflected by the deflector scans the surface is disclosed. Optical detectors are arranged at least in two locations, a start side of writing and an end side of writing, which locations are outside an effective writing area. A measuring part measures a scan time required by the light beam deflected by the optical deflector to scan a range between the optical detectors. A correcting part corrects each dot position of image data in the effective writing area to an arbitrary position based on a variation amount of the measured scan time.

A light beam is deflected by refraction and total internal reflection through a first prism, and projected through a first lens onto a scene that is to be scanned. The prism rotates, which varies the deflection angle and scans the beam across the scene along a scan line. Preferably, the successive side surfaces of the prism have different tilt angles relative to the rotation axis, so as to respectively deflect the beam in different deflection planes which cause successive scan lines of the beam across the scene. The emitted beam gives rise to a reflected beam from the scene, which is received through a second lens and deflected onto a photodetector through a second prism congruent to and rotating synchronously with the first prism. This apparatus is suitable as a laser scanning device for an object recognition system or a spacing distance regulation system of a motor vehicle.

A disclosed device for optically scanning a target surface includes a light source unit configured to emit a light beam; a light intensity detecting unit; a coupling unit configured to substantially collimate the emitted light beam; a beam limiting unit configured to limit the amount of the collimated light beam; a beam splitting unit configured to split the beam limited light beam and thereby to cause a first portion of the beam limited light beam to enter the light intensity detecting unit, wherein the light intensity detecting unit is configured to detect the intensity of the first portion of the beam limited light beam; and a beam deflecting unit configured to deflect a second portion of the split light beam toward the target surface. In the disclosed device, the beam limiting unit and the beam splitting unit are integrated as a single unitary structure and positioned between the coupling unit and the light deflecting unit.

An optical beam deflector in which a crosssection of an incident optical (e.g., laser) beam is divided into a first plurality of portions (micro crosssections) by an array of first lenses, a plurality of phases of the optical beam in the first micro crosssections are respectively modified by an array of first optical phase modulators so that a desired phase distribution is realized over the crosssection of the optical beam, and thereafter the crosssection of the optical beam is further divided into a plurality of second micro crosssections, and a plurality of phases of the optical beam in the second micro crosssections are respectively modified by an array of second optical phase modulators. An array of second lenses is provided corresponding to the second optical phase modulators to collect a plurality of portions of the optical beam output from the second optical phase modulators. The first and second optical phase modulators are driven by a driving unit so that the optical beam output from the array of second lenses as a whole is finally directed in a desired direction of deflection or to a desired point.

A light detection and ranging (LIDAR) apparatus is provided that includes an optical source to emit a first optical beam having a first frequency and a second optical beam having a second frequency and a dispersive element to deflect the first optical beam having the first frequency at a first angle and the second optical beam having the second frequency at a second angle.

The invention relates to a device and a method of the detection of a laser-beam deflection angle by a full digital four quadrant detector, and comprises a preposed amplifying electric circuit (12), a filtering electric circuit(13), an AD switching electric circuit(16), an offset display module(18), a four quadrant detector(1), a secondary amplifying electric circuit module(14), a variable gain amplifying electric circuit module(15) and a high speed micro processor module(17). The invention solves the problem of reduced measurement precision by using a full digital processing method; the model adopts the auto adaptation and the variable gain amplifying electric circuit to maintain the strength of signals entering an AD collecting unit by the automatic variation of the gain according to strengths of input signals; the model overcomes a reduced resolving precision caused by a reduced signal to noise ratio resulting from the variation of input light intensity. The invention overcomes the defect of a slow resolving speed caused by using a single chip for resolving by using the high speed micro processor to resolve the beam reflection angles.

A pre-deflector optical system includes an isolator arranged on an optical path of a light beam from a light source. The isolator has a first surface with different light transmittances depending on a polarization state of an incident light beam on a first side close to the light source and a second surface imparting an optical phase difference of a ¼ wavelength to the incident light beam on a second side. A deflector deflects the light beam passed through the pre-deflector optical system. A rotation mechanism rotates the isolator around its optical axis. A holding member holds the light source and the isolator in a predetermined positional relationship.

A hybrid integration process for fabrication of an optical cross-connect switching apparatus. The switching element is based on the deflection of light beam in electro-optic materials by applying electric field across electrodes of an appropriate configuration. The integration process includes fabrication of a substrate (e.g. silicon substrate) with 2D imaging optics from polymeric materials (or silica), fabrication of the light deflecting element, and assembly of the deflecting element on the substrate with imaging optics. The fabrication of the light deflecting element includes fabrication of a LN (lithium niobate) block. The LN block assembled in an optical switching apparatus includes a two-dimensional waveguide formed on a surface of the LN block and an electrode on a surface of the LN block.

Combination of polarized laser source, polarized beam splitter mirror and quarter Lambda wave plate is adopted in the 2D photoelectric autocollimation tube, which uses characteristic of polarization to avoid that measuring light beam feeds back laser source so as to prevent further angle drift of the measuring light. Obtaining measurement signal of 2D variance in small angle, beam splitter type target detector also obtains angle drift component of separated and fed back light beam. The said component is identical to inherent component of laser source. Monitoring device monitors quantity of angle drift. Based on quantity of angle drift obtained, computer control 2D optical beam deflection device in real time to adjust the measuring light beam according to direction opposite to quantity of angle drift. The invention restrains and eliminates quantity of angle drift coupled in measuring light beam in propagation path of the measuring light beam.

An optical scanning method and system and method for correcting optical aberrations introduced into the system by a beam deflector are provided. The optical scanning method and system utilize a tilt-corrected, off-axis beam deflector. The scanning system includes an off-axis acousto-optic beam deflector with a walk-off angle operated at high speed and post-scan optics used to focus the scanned beam. A tilted in-scan focus plane resulting from beam width variation through the scan and the cylindrical lens effect is corrected with one or more tilted lens elements within the post-scan optical train.

A process for measuring strain is provided that includes placing a sample of a material into a TEM as a sample. The TEM is energized to create a small electron beam with an incident angle to the sample. Electrical signals are generated that control multiple beam deflection coils and image deflection coils of the TEM. The beam deflection control signals cause the angle of the incident beam to change in a cyclic time-dependent manner. A first diffraction pattern from the sample material that shows dynamical diffraction effects is observed and then one or more of the beam deflection coil control signals are adjusted to reduce the dynamical diffraction effects. One or more of the image deflection coil control signals are then adjusted to remove any motion of the diffraction pattern. A diffraction pattern is then collected from a strained area of the material after the adjusting step, and the strain is then determined from a numerical analysis of the strained diffraction pattern compared to a reference diffraction pattern from an unstained area of the material.

An illumination system for illuminating a mask in a microlithographic exposure apparatus has an optical axis and a pupil surface. The system can include an array of reflective or transparent beam deflection elements such as mirrors. Each deflection element can be adapted to deflect an impinging light ray by a deflection angle that is variable in response to a control signal. The beam deflection elements can be arranged in a first plane. The system can further include an optical raster element, which includes a plurality of microlenses and/or diffractive structures. The beam deflection elements), which can be arranged in a first plane, and the optical raster element, which can be arranged in a second plane, can commonly produce a two-dimensional far field intensity distribution. An opticalimaging system can optically conjugate the first plane to the second plane.

An optical scanning device includes a plurality of light sources configured to emit a plurality of light beams, respectively; an optical deflector having a deflection-reflection surface that deflects and reflects the light beams, each of the light beams being incident on the deflection-reflection surface at an oblique incident angle, the oblique incident angles of the light beams being different from one another; and a flat glass arranged to be tilted at a tilt angle with respect to the deflection-reflection surface in a sub-scanning direction, the light beams being incident on the deflection-reflection surface via the flat glass, the tilt angle being smaller than a largest one of the oblique incident angles of the light beams. The light beams deflected and reflected by the deflection-reflection surface are incident on a plurality of scanned surfaces via the flat glass, respectively.

A multi-beam scanning apparatus includes a light source having first and second light source sections that hold a pair of semi-conductor laser diodes and coupling lenses that couple four beams irradiated from the pair of semi-conductor laser diodes with a base member. A light beam deviating device may be provided so as to deviate the four beams. A scan imaging device is also provided so as to scan a scan receiving surface with beam spots of the beams deviated by the light beam deviating device. A beam pitch-detecting device is also provided so as to detect a beam pitch of the respective beams formed on the scan-receiving surface. A beam pitch correcting device is provided in order to correct the beam pitch by causing relative deviation of a light axis among the respective beams on a sub scanning direction cross sectional plane.