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437 results about "Rapid imaging" patented technology

Non-linear structure light illumination microscopic imaging method and system

The invention discloses a non-linear structure light illumination microscopic imaging method which comprises the following steps: 1) loading a computed hologram on a digital microscopic array; 2) generating a first spatial structure light field which meets sine distribution and is used for activating fluorescent protein, and radiating the first spatial structure light field to the surface of a sample, so as to convert a part of protein to be in an illuminated state from a dark state; 3) radiating the sample in a second spatial structure light field so as to enable fluorescent protein in the bright state to emit fluorescent light, collecting the fluorescent light, and imaging in a photoelectric detector; 4) repeating the step 2) and the step 3), acquiring a plurality of spatial frequencies, acquiring a plurality of initial phases in each direction to obtain a plurality of original images, and reestablishing a super-resolution image according to a GPU acceleration algorithm. The invention further discloses a non-linear structure light illumination microscopic imaging system. The non-linear structure light illumination microscopic imaging method has the advantages of relatively high system imaging resolution, high fluorescent drifting resistance, low phototoxicity and rapid imaging.
Owner:SUZHOU INST OF BIOMEDICAL ENG & TECH CHINESE ACADEMY OF SCI

Rapid imaging detection method for gear appearance defect

The invention relates to a rapid imaging detection method for gear appearance defects. The rapid imaging detection method comprises two stages including a pre-processing stage and an online detection stage. The pre-processing stage comprises three procedures including automatically setting a target region, generating a coarse detection template and generating a fine detection template. The online detection stage comprises the steps of: J1) acquiring an image; J2) preprocessing and extracting features; J3) carrying out area difference value calculation on the image to be detected and an image of the coarse detection template for coarse detection judgment; J4) registering the image to be detected and an image of the fine detection template so that gear tooth directions of the two images are coincided; J5) and carrying out exclusive-or operation on the image to be detected and the image of the fine detection template to obtain a differential image, and acquiring defect region area in the differential image for fine detection judgment. The rapid imaging detection method for gear appearance defects acquires images by utilizing machine vision, performs coarse and fine judgment by utilizing template matching and image exclusive-or operation, and is high in detection precision and fast in speed.
Owner:WEIFANG UNIVERSITY

Terahertz wave fast imaging scanner

The invention relates to an imaging device for performing large field of view and fast scanning on terahertz waves by using a fast scanning device. The terahertz wave fast imaging scanner is used for scanning objects to be scanned, and comprises a frame scanning lens group, a row scanning lens group, a concave mirror and a terahertz wave detector. The frame scanning lens group is positioned behind the objects to be scanned and is used for longitudinally scanning the objects to be scanned; the row scanning lens group is arranged on a light path behind the frame scanning lens group and is used for transversely scanning the objects to be scanned; the concave mirror is positioned on the light path behind the row scanning lens group and is used for converging the terahertz waves; and the terahertz wave detector is positioned on the light path behind the concave mirror and is used for receiving scanning signals. Due to the adoption of the imaging mode of single point light machine scanning, the terahertz wave fast imaging scanner can realize fast imaging of the field of view, and make the whole imaging system have small volume, low cost and relatively easy manufacture and debugging. The terahertz wave fast imaging scanner can be applied to passive imaging modes, and also can be applied to active imaging modes.
Owner:CAPITAL NORMAL UNIVERSITY +1

Tera-hertz two-dimensional area array scanning imaging method and imaging system for implementing same

The invention discloses a tera-hertz two-dimensional area array scanning imaging method and an imaging system for implementing the same, which relate to a tera-hertz scanning imaging method and an imaging system. The method and the system solve the problem of overlong imaging time caused by the point-by-point scanning imaging which can only process single data points in the prior art and the problem that the area array canning imaging can only image small objects in the prior art. The method comprises the following steps of: scanning and imaging a two-dimensional area array by using a tera-hertz laser, an optical system, an area array detector, a two-dimensional translation stage, a stepper motor controller, a data acquisition card and a computer; under the condition that an imaging light source is fixed, moving the a two-dimension translation stage to a proper initial position and completely scanning a target in an imaging process, wherein a certain area of the imaging object is imaged at each time, and all sub-graphs are stitched together finally. An image of the imaging target is obtained by controlling the two-dimensional translation stage and the data acquisition card and processing and storing data. The method and the system are suitable for large-size and high-speed target imaging.
Owner:HARBIN INST OF TECH

Doppler wave beam sharpening rapid imaging method of mechanical scanning radar

The invention discloses a Doppler wave beam sharpening rapid imaging method of a mechanical scanning radar, which mainly solves the problem that the prior art cannot be applied to a mechanical scanning radar. The method comprises the following steps of: firstly determining a pulse accumulation number M and a sharpening ratio N, arranging echoes after the pulse compression into a distance-direction matrix according to a receiving order; taking out two small matrixes which has directional length of 2*M and are mutually overlapped M from the matrix according to the receiving order; respectively performing the Doppler central estimation on the two small matrixes; using two Doppler centers to compute an interpolation frequency point; meanwhile, using the latter Doppler centre to perform the directional Doppler central compensation on the latter small matrix; then performing the directional FFT (Fast Fourier Transform), using the interpolation frequency point to extract a sub-image from thedata behind the FFT, splicing the sub-image according to the receiving order to obtain a large image. Compared with the traditional DBS (direct broadcasting by satellite) imaging method, the Doppler wave beam sharpening rapid imaging method has low computation, and low requirement on the radar performance, and can be applied to the traditional mechanical scanning radar DBS imaging.
Owner:XIDIAN UNIV

Wide light beam illumination three-dimensional gating imaging system of airborne laser radar

The invention relates to a broad beam illumination 3D gated imaging system of an airborne laser radar and belongs to the image communication field. In the system, flight data are transmitted to a system control mechanism, the mechanism automatically generates working time-sequence data of various parts of the mechanism, and controls the working time sequence as well as hardware and software; a laser transmits a pulse laser beam according to a laser emission command sent by the system control mechanism, a target is illuminated by an homogeneous beam expander, meanwhile, a laser pulse emission time detection mechanism transmits the detected emission time data to the system control mechanism; a large-aperture telescope receives the reflected light from the target to the illumination laser, an ICCD camera performs gated imaging on a light signal received by the large-aperture telescope according to the time sequence and the gated imaging command, and transmits the data to a signal processing mechanism; and the signal processing mechanism processes the imaging information and generates 3D image information of the target. The imaging system has the advantages of rapid imaging speed, broad detection range, high reliability of measurement data and the like.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY

Active terahertz security inspection imaging method and system

The invention, which belongs to the technical fields of security inspection equipment and image processing, discloses an active terahertz security inspection imaging method and system. The security inspection imaging system is characterized in that a data acquisition and processing system is connected with a terahertz transmitter, a terahertz linear array detector and a band-shaped beam scanning control unit respectively; a beam splitter is connected with a beam shaping optical assembly, the terahertz linear array detector and a terahertz focusing optical assembly respectively; and the band-shaped beam scanning control unit is connected with the terahertz focusing optical assembly, the band beam scanning control unit, and a tested target. In addition, according to the active terahertz security inspection imaging method, on the basis of a mode of terahertz radiation emitted by a terahertz source, one-dimensional scanning of a band-shaped beam focusing beam, and receiving by a linear array terahertz detector, irradiation and scanning of the whole target plane are completed rapidly to achieve an objective of rapid imaging and checking on a target. With the active terahertz security inspection imaging system, the imaging quality is improved. Because of the one-dimensional scanning way, the imaging time is saved; and with the array detector, the circuit system structure is simplified, the system cost is lowered, and the expenditure is reduced.
Owner:TSINGHUA UNIV +1
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