Device for studying relationship between stress and magnetic memory effect
A magnetic memory and effect technology, which is applied in the direction of force measurement by measuring the change of magnetic properties of materials caused by applied stress, can solve the problems of easy interference and indirect detection in the detection scheme of magnetic sensitive components, and avoid measurement system errors. Effect
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Embodiment 1
[0022] figure 1 The structure of the device for studying the relationship between the stress and the magnetic memory effect provided by the embodiment of the present invention is shown, and only the parts related to the embodiment of the present invention are shown for convenience of description.
[0023] The device for studying the relationship between stress and magnetic memory effect provided by this embodiment includes a fixed table 1 made of non-magnetic metal material, on which a ferromagnetic device 2 to be tested is installed, and the fixed table can be used for all The ferromagnetic device 2 to be tested is stretched and compressed, and the device also includes a laser emitter 3 , a polarizer 4 , a first focusing lens 51 and a second focusing lens 52 , an analyzer 6 and a photosensitive element 7 . The laser emitter 3 emits laser light and passes through the polarizer 4 to become a linearly polarized laser. The polarization angle of the polarizer is adjustable. After ...
Embodiment 2
[0025] figure 2 The structure of the device for studying the relationship between the stress and the magnetic memory effect provided by the embodiment of the present invention is shown, and only the parts related to the embodiment of the present invention are shown for convenience of description.
[0026] The device for studying the relationship between stress and magnetic memory effect provided by this embodiment includes a fixed table 1 made of non-magnetic metal material, on which a ferromagnetic device 2 to be tested is installed, and the fixed table can be used for all The ferromagnetic device 2 to be tested is stretched and compressed, and the device also includes a laser emitter 3 , a polarizer 4 , a focusing lens 53 , an analyzer 6 and a photosensitive element 7 . The focusing lens 53 is located directly above the ferromagnetic device 2 to be tested, and the device also includes a reflector 8, which is arranged in front of the optical path of the analyzer 6, and the l...
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