Spatially resolved magneto-optic Kerr effect measurement device

A magneto-optical Kerr effect and measurement device technology, applied in the field of optical technology measurement, can solve the problems of Kerr signal measurement, limiting the use range and measurement efficiency of the magneto-optical Kerr effect, unable to achieve accurate measurement of regional static magnetic domains, and the like, To achieve the effect of accurate measurement

Inactive Publication Date: 2016-08-24
NANJING UNIV
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Problems solved by technology

[0003] At present, the magneto-optical Kerr effect measurement devices all use a fixed sample stage, which can only study the magnetic order, magnetic anisotropy and magnetic domains of the fixed area of ​​the material, and cannot realize the matrix scanning method under a fixed magnetic f

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  • Spatially resolved magneto-optic Kerr effect measurement device
  • Spatially resolved magneto-optic Kerr effect measurement device

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Embodiment Construction

[0018] figure 1 Middle marks: 1 is semiconductor laser, 2 is attenuator, 3 is beam expander, 4 is chopper, 5 is Glan Taylor prism, 6 is beam splitter, 7 is cube beam splitter, 8 is beam splitter , 9 is a microscope objective lens, 10 is a film sample, 11 is an electromagnet, 12 is a three-dimensional piezoelectric sample stage, 13 is a Glan Taylor prism, 14 is a convex lens, 15 is a white light source, 16 is a half-wave plate, 17 is a Glan Taylor prism, 18 is a reflective prism, 19 is a Glan Taylor prism, 20 is a convex lens, 21 is a three-dimensional piezoelectric sample stage controller, 22 is a lock-in amplifier, 23 is a photoelectric balance detector, 24 is a CCD, 25 is a current source controller, and 26 is a computer; figure 2 The middle marks: 1 is a half-wave plate, 2 is a Glan-Taylor prism, 3 is a reflective prism, and 4 is a photoelectric balance detector.

[0019] The invention discloses a space resolution magneto-optic Kerr effect measuring device, which compris...

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Abstract

A spatially resolved magneto-optic Kerr effect measurement device comprises an optical path system, a three-dimensional piezoelectric sample stage, and a current source control unit. The system can carry out poloidal or longitudinal Kerr signal scanning measurement of a single point quickly under a changing magnetic field, and can carry out Kerr signal measurement of the points in a region in a mode of matrix scanning under a fixed magnetic field. With the spatially resolved magneto-optic Kerr effect measurement device, the static magnetic domain and dynamic magnetic domain of a region can be measured precisely. Moreover, the magnetic domain structure of a whole region to be measured can be observed under a fixed magnetic field.

Description

Technical field: [0001] The invention belongs to the field of optical technology measurement, and specifically relates to a space-resolving magneto-optical Kerr effect measurement device. Its main purpose is to measure the hysteresis loop and obtain the magnetic domain distribution on the surface of the sample. At the same time, the system has the function of observing the magnetic domain structure . Background technique: [0002] The surface magnetism of materials and the magnetism of ultra-thin films composed of several atomic layers and multilayer films composed of different atoms are relatively important research hotspots in the field of magnetic storage today. It has important applications in the study of magnetic order, magnetic anisotropy, interlayer coupling and phase transition behavior of magnetic ultrathin films. [0003] At present, the magneto-optical Kerr effect measurement devices all use a fixed sample stage, which can only study the magnetic order, magnetic...

Claims

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Application Information

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IPC IPC(8): G01R33/12G01R33/14
CPCG01R33/12G01R33/14
Inventor 徐永兵刘墨玉阮学忠吴竞黎遥刘波
Owner NANJING UNIV
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