2 results about "Glan–Taylor prism" patented technology

This application relates to the field of optical polarization measurement technology, specifically to a wide-spectrum, high-bandwidth static spectral modulation Stokes polarization measurement device, comprising a polarization modulation module, a spectral sampling module, and a high extinction ratio polarizer. The polarization modulation module includes a phase retarder and a linear polarizer; the spectral sampling module has sub-nanometer spectral resolution; the high extinction ratio polarizer includes a halogen tungsten lamp and a Glan Taylor prism for generating high-purity linearly polarized light; the obtained demodulation factor and the modulation spectrum acquired by the spectral sampling module are used to invert the Stokes parameters using zero-heterodyne coherent demodulation technology. This application employs a phase retarder with high birefringence, which, for the same thickness, produces an optical path difference tens of times greater than that of quartz, increasing the Stokes polarization measurement bandwidth by a factor of the response and improving the measurement accuracy of polarization spectral parameters. Simultaneously, the zero-heterodyne coherent demodulation method is used to eliminate the dispersion interference of the phase retarder through calibration.

This invention relates to a method and apparatus for testing the polarization deflection angle of a semiconductor laser, belonging to the field of semiconductor laser performance testing technology. It solves the technical problems of low efficiency and cumbersome calculations in testing the polarization deflection angle of semiconductor lasers. The testing method includes the following steps: installing and starting the semiconductor laser; testing the power of the light emitted after passing through the Glan-Taylor prism PBS and the power of the light emitted without passing through the Glan-Taylor prism PBS; adjusting the fixture to a fixed angle and testing the power of the light emitted through and without passing through the Glan-Taylor prism PBS; and calculating the polarization deflection angle of the semiconductor laser based on the power of the emitted light at different angles. The testing apparatus includes a fixture, a convex lens, a Glan-Taylor prism PBS, and an optical power meter. The laser sequentially enters the convex lens and the Glan-Taylor prism PBS, and the optical power meter is used to test the power of the light emitted after and without passing through the Glan-Taylor prism PBS.