Light-scattering device and method for measuring diameter and length of short carbon nano-tube

A carbon nanotube and light scattering technology, applied in the field of measurement, can solve the problems of expensive carbon nanotube detection equipment and large limitations, and achieve the effect of fast measurement speed, low cost and low operation requirements

Inactive Publication Date: 2012-06-20
UNIV OF SHANGHAI FOR SCI & TECH
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Problems solved by technology

[0009] The present invention is aimed at the problem that the current carbon nanotube detection equipment is expensive and has large limitations, and proposes a light scattering device and method fo

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  • Light-scattering device and method for measuring diameter and length of short carbon nano-tube
  • Light-scattering device and method for measuring diameter and length of short carbon nano-tube
  • Light-scattering device and method for measuring diameter and length of short carbon nano-tube

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Embodiment Construction

[0025] A light scattering method for measuring the diameter and length of short carbon nanotubes, comprising the steps of:

[0026] 1) if figure 1 As shown, a helium-neon laser 1 is used as a light source, which becomes linearly polarized laser light in a vertical direction through a Green-Taylor prism 2;

[0027] 2) The incident linearly polarized laser light is reflected by the plane mirror 3, focused by the lens 4, and irradiated on the particle sample in the sample cell 5, and the scattered light in the 90-degree direction generated by the sample particles irradiated by the laser beam enters the small hole 6 and the small hole in turn 7;

[0028] 3) The Wollaston prism 8 decomposes the scattered light into vertically polarized scattered light and horizontally polarized scattered light;

[0029] 4) The photomultiplier tube 9 and the photomultiplier tube 10 detect the polarized scattered light in two directions respectively, and convert the measured optical signal into a ...

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Abstract

The invention relates to light-scattering device and method for measuring the diameter and length of a short carbon nano-tube, wherein the method for measuring the diameter and length of a short carbon nano-tube comprises the following steps: the light emitted by a helium-neon laser becomes a linearly-polarized laser in a vertical direction via Glan-Taylor prism; an incident linearly-polarized laser irradiates on particle samples in a sample cell after being reflected by a plane mirror and focused by a lens, the scattered light in a 90-degree direction generated by the sample particles irradiated by the laser beam orderly enters in two faced pores; the scattered light is decomposed into a polarized scattered light in the vertical direction and a polarized scattered light in a horizontal direction via Wollaston prism; and the polarized scattered lights in the two directions are detected by two photomultipliers respectively, and the measured light signal is converted to a TTL (transistor-transistor logic) pulse voltage signal and conveyed in a mathematic correlator to obtain the measured diameter and length. Relative to the most general microscope measuring method at present, the method for measuring the diameter and length of a short carbon nano-tube is a non-contact measuring method, as well as is fast in measuring speed, low in cost and low in operational requirements. Relative to Raman spectrometry, the method for measuring the diameter and length of a short carbon nano-tube can measure diameter and length simultaneously, and is suitable for measurement for multi-wall carbon nano-tube.

Description

technical field [0001] The invention relates to a measurement technology, in particular to a light scattering device and method for measuring the diameter and length of short carbon nanotubes. Background technique [0002] Since the discovery of carbon nanotubes in 1991, their superior mechanical, electrical, and thermal properties have made them rapidly become a research hotspot in nanomaterials. [0003] At present, the diameter and length of carbon nanotubes are mainly measured by microscopy methods, including scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), and scanning tunneling microscopy (STM). The characteristics of this type of method are very intuitive and accurate, but there are problems such as expensive equipment, high operation requirements, and long measurement time, and due to the limited field of view of the microscope, it is impossible to perform statistics on the distribution of samples. [0004] C...

Claims

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Application Information

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IPC IPC(8): G01B11/02G01B11/08
Inventor 杨晖郑刚戴曙光
Owner UNIV OF SHANGHAI FOR SCI & TECH
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