Microimaging integrated measuring device and measuring method for optical limiting property of multi-wavelength sample

Abstract

The invention discloses a microimaging integrated measuring device for an optical limiting property of a multi-wavelength sample. The microimaging integrated measuring device comprises a femtosecond laser unit, an OPA device, a coating total reflective mirror II, a diaphragm I, a diaphragm II, a Glan-Taylor prism I mounted on an electric rotary table, a Glan-Taylor prism II, a coating total reflection mirror, an illuminating light source, a beam splitter I, a coating total reflective mirror IV, a beam splitter II, a focusing lens I, an energy meter I, a focusing objective lens, a collecting objective lens, a beam splitter III, a focusing lens II, an energy meter II, a CCD and a computer. The microimaging integrated measuring device realizes measuring for the wide-spectrum optical limiting property of the sample, can observe the surface topography of the optical limiting sample, the spot size of incident laser as well as sample damage condition after laser irradiation, and has the characteristics of being automatic in measuring, flexible and convenient to regulate, wide in dynamic test range, and efficient and sensitive in response speed.

Description

technical field [0001] The invention belongs to the field of optical limiting performance measurement, and in particular relates to a measuring device and method for measuring the optical limiting performance of samples with multiple wavelengths and having the function of microscopic imaging. Background technique [0002] As lasers are used more and more widely in various fields, lasers have been integrated into all aspects of people's lives. People have gradually discovered that this kind of high-intensity light source can easily damage optical devices, especially human eyes. Therefore, preventing laser damage is not only a scientific task, but also a social public safety issue. The preparation of various optical limiting materials has always been a research hotspot for scientists, and the measurement system for materials with optical limiting performance is also being continuously improved and developed. Among them, the Z-scan method is used as a means of measuring the no...

AI Technical Summary

Problems solved by technology

At the same time, because the spot size keeps changing during the measurement process, it is impossible to measure the optical limiting performance of the material at a micro scale

In addition, due to the limitation of the light source, the traditional measurement method can only measure a single or a few wavelengths. The process of changing the wavelength is cumbersome, and the optical path needs to be readjusted.

(See Patent Application No.: CN201210487216, Publication No.: CN102937573A), this patent uses Z-scan technology for optical limiting measurement, uses two wavelengths as excitation light sources, and can only detect part of the optical limiting samples that respond within this wavelength range , and cannot measure the optical limiting performance of microscopic samples

The tiny damage on the sample surface cannot be observed after the measurement, which is not conducive to a more accurate evaluation of the optical limiting performance of the material itself

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