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Phase delay measuring apparatus and method

A phase delay and detector technology, applied in the field of measurement, can solve problems such as difficulty in meeting requirements and low measurement accuracy, and achieve the effect of improving the accuracy of measurement

Inactive Publication Date: 2014-02-26
NAT INST OF METROLOGY CHINA
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

However, the measurement accuracy of these methods is low, and it is difficult to meet the needs

Method used

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  • Phase delay measuring apparatus and method

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Embodiment Construction

[0020] The specific embodiments of the present invention will be further described below in conjunction with the drawings and embodiments. The following embodiments are only used to illustrate the technical solutions of the present invention more clearly, and cannot be used to limit the protection scope of the present invention.

[0021] The first embodiment of the present invention provides a phase delay measurement device, such as figure 1 Shown, including:

[0022] Monochromatic polarization light source, beam splitter 1, first detector 2, second detector 3, first turntable 4, Glan-Taylor prism 5. The first turntable 4 is used to carry the sample to be tested 6 to rotate along the horizontal axis, and After the monochromatic polarized light is split by the beam splitter, one of the beams illuminates the first detector 2, and the other beam illuminates the Glan-Taylor prism 5 through the sample 6 to be tested, and then passes through the Glan-Taylor prism 5. The prism 5 then ir...

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Abstract

The invention provides a phase delay measuring apparatus and a phase delay measuring method. The apparatus comprises a beam splitting meter, a first detector, a second detector, a first rotary table and a Glan-Taylor prism. The first rotary table is used for bearing a to-be-measured sample and enabling the sample to rotate along a horizontal axis; monochromatic polarized light undergoes beam splitting by the beam splitting meter, then one light beam I irradiates onto the first detector, and the other light beam II irradiates onto the Glan-Taylor prism and then irradiates onto the second detector after passing through the Glan-Taylor prism. The phase delay measuring apparatus and the phase delay measuring method provided by the invention have measurement accuracy independent on the characteristics of a material and can greatly improve measurement precision.

Description

Technical field [0001] The present invention relates to the field of measurement technology, in particular to a phase delay measurement device and method. Background technique [0002] With the rapid development of materials science, high requirements are put forward for the measurement of the phase delay characteristics of optical materials. [0003] The currently known phase delay measurement methods mainly include: resonator method, phase compensation method, spectral scanning measurement method, polarization modulation method, optical beat method, moiré deflection method, compensation method, dual optical path phase comparison method and light intensity Law etc. However, the measurement accuracy of these methods is low, and it is difficult to meet the demand. Summary of the invention [0004] The present invention provides a phase delay measurement device and method, the accuracy of the measurement can be independent of the characteristics of the material itself, and the accur...

Claims

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Application Information

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IPC IPC(8): G01N21/41
Inventor 冯国进
Owner NAT INST OF METROLOGY CHINA
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