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Near-field polarized light scanning probe microscope

A scanning probe and polarized light technology, which is applied in scanning probe microscopy, scanning probe technology, measuring devices, etc., can solve the problems of insufficient research on the Kerr effect, achieve suppression of far-field background light, and improve signal-to-noise than the effect

Active Publication Date: 2016-05-18
UNIV OF SHANGHAI FOR SCI & TECH
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Problems solved by technology

Using the polarization of the incident light, the non-porous probe-type SNOM has been used to study the magnetic domains of localized magnetic films, plasmon resonance, etc., but the research on the Kerr effect on the longitudinal near-field magneto-optic surface is still insufficient. The reason is mainly due to the scattering The background signal (far-field light) of light detection is large, and the interaction between far-field light and magnetic field will also be included in the detection system

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  • Near-field polarized light scanning probe microscope

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Embodiment Construction

[0011] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0012] Such as figure 1 As shown, a near-field polarized light scanning probe microscope adopts a vertical incidence-concentrated near-field light collection method to obtain near-field light signals. The invention includes a near-field optical detection optical path.

[0013] In the near-field optical detection optical path, a beam of linearly polarized light emitted by the He-Ne laser 1 sequentially passes through the quarter-wave plate A2, the beam splitter 3, the objective lens A4, and the probe 5 to the stage to form a near-field optical generation optical path; The reflected light from the probe 5 passes through the objective lens A4, the beam splitter 3, the quarter-wave plate B7, the Granty prism 8, and the objective lens B9 in sequence, and is received by the photoelectric receiver ⑩ to the image display system.

[0014] Working principle of ...

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Abstract

The invention relates to a near-field polarized light scanning probe microscope having a near-field optics detecting optical path in which a bundle of linearly polarized lights emitted from an He-Ne laser successively pass a quarter-wave plate A, a beam splitter, an objective lens A, and a probe to an objective table to form a near-field optics generation optical path. The reflected lights reflected from the probe successively pass the objective lens A, the beam splitter, a quarter-wave plate B, a Glan-Taylor prism, and the objective lens and are received by a photoelectric receiver to an image display system. The near-field polarized light scanning probe microscope can effectively inhibit a far-field background light and improves the signal to noise ratio of a near-field light, and the spatial resolution is less than 10 nanometers.

Description

technical field [0001] The invention relates to a near-field optical microscope, in particular to a near-field optical microscope which adopts a non-porous probe and collects near-field light in a vertical incidence-gathering manner. Background technique [0002] With the development of society and economy, human beings have entered the era of networking and informationization. Large capacity, high density and rapid transmission are the salient features of digital storage. Due to its large capacity and long life, the disk storage method is still the focus of scientific research and industrial technology development. Representative technologies include Hard Disk Drive (HDD) and Optical Disc Drive (ODD), which came out in 1956 (IBM -350), 1975 (compactdisc, CD). Compared with HDD, ODD technology also has the advantages of non-contact reading and writing and erasing, high signal-to-noise ratio of information, and low price of information bits. The central issue in the informa...

Claims

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Application Information

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IPC IPC(8): G01Q60/18
CPCG01Q60/18
Inventor 金涛沈璐
Owner UNIV OF SHANGHAI FOR SCI & TECH
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