The present invention belongs to the field of precision measurement, and relates to a method for measuring the
refractive index of a nanoscale thin film with polarization state modulation based on the in-plane
photon spin Hall effect and its application. By establishing a
database of the in-plane
photon spin splitting displacement varying with the incident polarization state at each
refractive index for thin film materials with different thicknesses; placing the nanoscale thin film to be detected on the sample stage, and at a certain incident angle, successively collecting the measurement data of the in-plane
photon spin splitting displacement at different incident polarization states. Comparing the measurement data with the corresponding theoretical data in the
database, and then determining the
refractive index of the measured nanoscale thin film. The detection
system of the present invention has a simple structure and is easy to operate, and during the measurement, it is the incident polarization state that is modulated rather than the incident angle. Therefore, the eccentricity error caused by the variation of the incident angle will not be introduced during the measurement process. In addition, what this method measures is the offset of the spot
centroid, which is not affected by ambient light. Therefore, this method has the advantages of high measurement accuracy and good stability.